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Analytical surface-potential-based drain current model for amorphous InGaZnO thin film transistors

Journal of applied physics, 2013-11, Vol.114 (18)

2013

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Hysteresis effect in bottom-gate polymorphous silicon thin-film transistors

Microelectronics and reliability, 2011-03, Vol.51 (3), p.556-559

2011

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High performance transistors based on the controlled growth of triisopropylsilylethynyl-pentacene crystals via non-isotropic solvent evaporation

RSC advances, 2014, Vol.4 (40), p.20804-20813

2014

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Rapid thermal annealing temperature dependence of noise properties in Au/n-GaAs Schottky diodes with embedded InAs quantum dots in asymmetric In0.2Ga0.8As wells

Physica Status Solidi (b), 2009-04, Vol.246 (4), p.880-884

2009

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Electrical transport and low frequency noise characteristics of Au/n-GaAs Schottky diodes containing InAs quantum dots

Semiconductor science and technology, 2004-03, Vol.19 (3), p.461-467

2004

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Determination of interface and bulk traps in the subthreshold region of polycrystalline silicon thin-film transistors

IEEE transactions on electron devices, 2003-09, Vol.50 (9), p.1991-1994

2003

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Substrate current and degradation of n-channel polycrystalline silicon thin-film transistors

Microelectronics and reliability, 2005-02, Vol.45 (2), p.341-348

2005

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Change in transfer and low-frequency noise characteristics of n-channel polysilicon TFTs due to hot-carrier degradation

IEEE electron device letters, 2004-06, Vol.25 (6), p.390-392

2004

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Substrate treatment and drying conditions effect on the properties of roll-to-roll gravure printed PEDOT:PSS thin films

Materials science & engineering. B, Solid-state materials for advanced technology, 2011-11, Vol.176 (19), p.1556-1561

2011

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High-field transport and noise properties of sputter-deposited amorphous carbon–silicon heterojunctions

Semiconductor science and technology, 2002-07, Vol.17 (7), p.662-667

2002

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Investigation of noise sources in platinum silicide Schottky barrier diodes

Applied physics letters, 2002-02, Vol.80 (8), p.1468-1470

2002

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Improved analysis of low frequency noise in polycrystalline silicon thin-film transistors

Solid-state electronics, 2005-03, Vol.49 (3), p.513-515

2005

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Temperature dependence of the barrier at the tetrahedral amorphous carbon-silicon interface

Semiconductor science and technology, 2001-06, Vol.16 (6), p.474-477

2001

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The effects of interface and bulk defects on the electrical performance of amorphous carbon/silicon heterojunctions

Materials science & engineering. B, Solid-state materials for advanced technology, 2002-04, Vol.91, p.379-383

2002

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A simple and continuous on-state current model of polysilicon thin-film transistors for circuit simulation

Journal of physics. Conference series, 2005-01, Vol.10 (1), p.27-30

2005

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On-state drain current modeling of large-grain poly-Si TFTs based on carrier transport through latitudinal and longitudinal grain boundaries

IEEE transactions on electron devices, 2005-08, Vol.52 (8), p.1727-1733

2005

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Hot-carrier-induced degradation in short p-channel nonhydrogenated polysilicon thin-film transistors

IEEE transactions on electron devices, 2002-09, Vol.49 (9), p.1552-1557

2002

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An analytical hot-carrier induced degradation model in polysilicon TFTs

IEEE transactions on electron devices, 2005-10, Vol.52 (10), p.2182-2187

2005

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Ideality factor dependence of capacitance and reverse current noise in Au/n-GaAs Schottky diodes with embedded self-assembled InAs quantum dots

Physica status solidi. C, 2008-12, Vol.5 (12), p.3617-3621

2008

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Investigation of single electron traps induced by InAs quantum dots embedded in GaAs layer using the low-frequency noise technique

Journal of applied physics, 2004-11, Vol.96 (10), p.5735-5739

2004

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Low frequency noise of GaAs Schottky diodes with embedded InAs quantum layer and self-assembled quantum dots

Journal of applied physics, 2003-04, Vol.93 (7), p.3990-3994

2003

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Correlation of the generation-recombination noise with reliability issues of polycrystalline silicon thin-film transistors

Applied physics letters, 2004-07, Vol.85 (2), p.311-313

2004

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Effect of interface roughness on gate bias instability of polycrystalline silicon thin-film transistors

Journal of applied physics, 2002-10, Vol.92 (8), p.4741-4745

2002

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Low-frequency noise spectroscopy in Au∕n-GaAs Schottky diodes with InAs quantum dots

Applied physics letters, 2005-10, Vol.87 (16)

2005

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Electrical characterization of nanocrystalline carbon–silicon heterojunctions

Applied physics letters, 2001-07, Vol.79 (5), p.638-640

2001

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Analytical surface-potential-based drain current model for amorphous InGaZnO thin film transistors

Hysteresis effect in bottom-gate polymorphous silicon thin-film transistors

High performance transistors based on the controlled growth of triisopropylsilylethynyl-pentacene crystals via non-isotropic solvent evaporation

Rapid thermal annealing temperature dependence of noise properties in Au/n-GaAs Schottky diodes with embedded InAs quantum dots in asymmetric In0.2Ga0.8As wells

Electrical transport and low frequency noise characteristics of Au/n-GaAs Schottky diodes containing InAs quantum dots

Determination of interface and bulk traps in the subthreshold region of polycrystalline silicon thin-film transistors

Substrate current and degradation of n-channel polycrystalline silicon thin-film transistors

Change in transfer and low-frequency noise characteristics of n-channel polysilicon TFTs due to hot-carrier degradation

Substrate treatment and drying conditions effect on the properties of roll-to-roll gravure printed PEDOT:PSS thin films

High-field transport and noise properties of sputter-deposited amorphous carbon–silicon heterojunctions

Investigation of noise sources in platinum silicide Schottky barrier diodes

Improved analysis of low frequency noise in polycrystalline silicon thin-film transistors

Temperature dependence of the barrier at the tetrahedral amorphous carbon-silicon interface

The effects of interface and bulk defects on the electrical performance of amorphous carbon/silicon heterojunctions

A simple and continuous on-state current model of polysilicon thin-film transistors for circuit simulation

On-state drain current modeling of large-grain poly-Si TFTs based on carrier transport through latitudinal and longitudinal grain boundaries

Hot-carrier-induced degradation in short p-channel nonhydrogenated polysilicon thin-film transistors

An analytical hot-carrier induced degradation model in polysilicon TFTs

Ideality factor dependence of capacitance and reverse current noise in Au/n-GaAs Schottky diodes with embedded self-assembled InAs quantum dots

Investigation of single electron traps induced by InAs quantum dots embedded in GaAs layer using the low-frequency noise technique

Low frequency noise of GaAs Schottky diodes with embedded InAs quantum layer and self-assembled quantum dots

Correlation of the generation-recombination noise with reliability issues of polycrystalline silicon thin-film transistors

Effect of interface roughness on gate bias instability of polycrystalline silicon thin-film transistors

Low-frequency noise spectroscopy in Au∕n-GaAs Schottky diodes with InAs quantum dots

Electrical characterization of nanocrystalline carbon–silicon heterojunctions

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