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IEEE transactions on electron devices, 2019-08, Vol.66 (8), p.3498-3505
2019
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IEEE transactions on electron devices, 2011-08, Vol.58 (8), p.2310-2316
2011
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2012 Symposium on VLSI Technology (VLSIT), 2012, p.133-134
- Planes, N.
- Weber, O.
- Barral, V.
- Haendler, S.
- Noblet, D.
- Croain, D.
- Bocat, M.
- Sassoulas, P.
- Federspiel, X.
- Cros, A.
- Bajolet, A.
- Richard, E.
- Dumont, B.
- Perreau, P.
- Petit, D.
- Golanski, D.
- Fenouillet-Beranger, C.
- Guillot, N.
- Rafik, M.
- Huard, V.
- Puget, S.
- Montagner, X.
- Jaud, M.
- Rozeau, O.
- Saxod, O.
- Wacquant, F.
- Monsieur, F.
- Barge, D.
- Pinzelli, L.
- Mellier, M.
- Boeuf, F.
- Arnaud, F.
- Haond, M.
2012
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Solid-state electronics, 2017-02, Vol.128, p.31-36
2017
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Solid-state electronics, 2016-03, Vol.117, p.88-93
2016
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Solid-state electronics, 2016-04, Vol.118, p.4-11
2016
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Solid-state electronics, 2012-10, Vol.76, p.54-59
2012
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Solid-state electronics, 2009-07, Vol.53 (7), p.730-734
- Fenouillet-Beranger, C.
- Denorme, S.
- Perreau, P.
- Buj, C.
- Faynot, O.
- Andrieu, F.
- Tosti, L.
- Barnola, S.
- Salvetat, T.
- Garros, X.
- Cassé, M.
- Allain, F.
- Loubet, N.
- Pham-Nguyen, L.
- Deloffre, E.
- Gros-Jean, M.
- Beneyton, R.
- Laviron, C.
- Marin, M.
- Leyris, C.
- Haendler, S.
- Leverd, F.
- Gouraud, P.
- Scheiblin, P.
- Clement, L.
- Pantel, R.
- Deleonibus, S.
- Skotnicki, T.
2009
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Solid-state electronics, 2014-05, Vol.95, p.28-31
2014
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Microelectronics and reliability, 2014-09, Vol.54 (9-10), p.2171-2175
2014
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Electronics letters, 2014-09, Vol.50 (19), p.1393-1395
2014
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Solid-state electronics, 2013-03, Vol.81, p.151-156
2013
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Electronics letters, 2013-09, Vol.49 (19), p.1214-1216
2013
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Solid-state electronics, 2010-09, Vol.54 (9), p.849-854
- Fenouillet-Beranger, C.
- Perreau, P.
- Denorme, S.
- Tosti, L.
- Andrieu, F.
- Weber, O.
- Monfray, S.
- Barnola, S.
- Arvet, C.
- Campidelli, Y.
- Haendler, S.
- Beneyton, R.
- Perrot, C.
- de Buttet, C.
- Gros, P.
- Pham-Nguyen, L.
- Leverd, F.
- Gouraud, P.
- Abbate, F.
- Baron, F.
- Torres, A.
- Laviron, C.
- Pinzelli, L.
- Vetier, J.
- Borowiak, C.
- Margain, A.
- Delprat, D.
- Boedt, F.
- Bourdelle, K.
- Nguyen, B.-Y.
- Faynot, O.
- Skotnicki, T.
2010
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Solid-state electronics, 2013-08, Vol.86, p.45-50
2013
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Microelectronics and reliability, 2021-11, Vol.126, p.114370, Article 114370
2021
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Solid-state electronics, 2013-10, Vol.88, p.15-20
- Fenouillet-Beranger, C.
- Perreau, P.
- Benoist, T.
- Richier, C.
- Haendler, S.
- Pradelle, J.
- Bustos, J.
- Brun, P.
- Tosti, L.
- Weber, O.
- Andrieu, F.
- Orlando, B.
- Pellissier-Tanon, D.
- Abbate, F.
- Richard, C.
- Beneyton, R.
- Gregoire, M.
- Ducote, J.
- Gouraud, P.
- Margain, A.
- Borowiak, C.
- Bianchini, R.
- Planes, N.
- Gourvest, E.
- Bourdelle, K.K.
- Nguyen, B.Y.
- Poiroux, T.
- Skotnicki, T.
- Faynot, O.
- Boeuf, F.
2013
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2010 Symposium on VLSI Technology, 2010, p.65-66
2010
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2015 73rd Annual Device Research Conference (DRC), 2015, p.163-164
2015
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2015 73rd Annual Device Research Conference (DRC), 2015, p.115-116
2015
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2011 IEEE International Conference on IC Design & Technology, 2011, p.1-4
2011
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Microelectronics and reliability, 2021-11, Vol.126, p.114265, Article 114265
2021
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Solid-state electronics, 2015-09, Vol.111, p.123-128
2015
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Solid-state electronics, 2010-09, Vol.54 (9), p.849-854
- Fenouillet-Beranger, C.
- Perreau, P.
- Denorme, S.
- Tosti, L.
- Andrieu, F.
- Weber, O.
- Monfray, S.
- Barnola, S.
- Arvet, C.
- Campidelli, Y.
- Haendler, S.
- Beneyton, R.
- Perrot, C.
- de Buttet, C.
- Gros, P.
- Pham-Nguyen, L.
- Leverd, F.
- Gouraud, P.
- Abbate, F.
- Baron, F.
- Torres, A.
- Laviron, C.
- Pinzelli, L.
- Vetier, J.
- Borowiak, C.
- Margain, A.
- Delprat, D.
- Boedt, F.
- Bourdelle, K.
- Nguyen, B.-Y.
- Faynot, O.
- Skotnicki, T.
2010
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Solid-state electronics, 2016-04, Vol.118, p.4-11
2016
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