UB Paderborn / Katalog / Suche / in CDI

Sortiert nach

Einfacher Volltextzugriff von (fast) überall

Installieren Sie die LibKey Nomad-Browsererweiterung und erhalten Sie von vielen Webseiten einfachen Zugriff auf lizenzierte Volltexte oder Open Access Publikationen. Mehr erfahren...

Invited Article: An integrated mid-infrared, far-infrared, and terahertz optical Hall effect instrument

Review of scientific instruments, 2014-07, Vol.85 (7)

2014

Volltextzugriff (PDF)

Temperature dependent effective mass in AlGaN/GaN high electron mobility transistor structures

Applied physics letters, 2012-11, Vol.101 (19)

2012

Volltextzugriff (PDF)

Terahertz-frequency dielectric anisotropy in three-dimensional polymethacrylates fabricated by stereolithography

Optics letters, 2020-04, Vol.45 (7), p.1982-1985

2020

Volltextzugriff (PDF)

Terahertz ellipsometry and terahertz optical-Hall effect

Thin solid films, 2011-02, Vol.519 (9), p.2593-2600

2011

Volltextzugriff (PDF)

Infrared dielectric anisotropy and phonon modes of sapphire

Physical review. B, Condensed matter, 2000-03, Vol.61 (12), p.8187-8201

2000

Volltextzugriff (PDF)

Variable-wavelength frequency-domain terahertz ellipsometry

Review of scientific instruments, 2010-02, Vol.81 (2), p.023101-023101-7

2010

Volltextzugriff (PDF)

Quantifying the accuracy of ellipsometer systems

Physica status solidi. C, 2008-05, Vol.5 (5), p.1031-1035

2008

Volltextzugriff (PDF)

Polarization selection rules for inter-Landau-level transitions in epitaxial graphene revealed by the infrared optical Hall effect

Physical review letters, 2013-08, Vol.111 (7), p.077402-077402

2013

Volltextzugriff (PDF)

Terahertz optical-Hall effect for multiple valley band materials: n-type silicon

Thin solid films, 2011-02, Vol.519 (9), p.2613-2616

2011

Volltextzugriff (PDF)

Anisotropic contrast optical microscope

Review of scientific instruments, 2016-11, Vol.87 (11), p.113701

2016

Volltextzugriff (PDF)

Ellipsometric determination of optical constants for silicon and thermally grown silicon dioxide via a multi-sample, multi-wavelength, multi-angle investigation

Journal of applied physics, 1998-03, Vol.83 (6), p.3323-3336

1998

Volltextzugriff (PDF)

Cavity-enhanced optical Hall effect in two-dimensional free charge carrier gases detected at terahertz frequencies

Optics letters, 2015-06, Vol.40 (12), p.2688-2691

2015

Volltextzugriff (PDF)

The optical Hall effect

Physica status solidi. A, Applications and materials science, 2008-04, Vol.205 (4), p.779-783

2008

Volltextzugriff (PDF)

Hole-channel conductivity in epitaxial graphene determined by terahertz optical-Hall effect and midinfrared ellipsometry

Applied physics letters, 2011-01, Vol.98 (4), p.041906-041906-3

2011

Volltextzugriff (PDF)

Terahertz optical-Hall effect characterization of two-dimensional electron gas properties in AlGaN/GaN high electron mobility transistor structures

Applied physics letters, 2011-02, Vol.98 (9)

2011

Volltextzugriff (PDF)

Hole diffusion profile in a p-p+ silicon homojunction determined by terahertz and midinfrared spectroscopic ellipsometry

Applied physics letters, 2009-07, Vol.95 (3)

2009

Volltextzugriff (PDF)

Development of a parametric optical constant model for Hg1−xCdxTe for control of composition by spectroscopic ellipsometry during MBE growth

Thin solid films, 1998-02, Vol.313-314, p.137-142

1998

Volltextzugriff (PDF)

Polarization Selection Rules for Inter-Landau-Level Transitions in Epitaxial Graphene Revealed by the Infrared Optical Hall Effect

Physical review letters, 2013-08, Vol.111 (7), Article 077402

2013

Volltextzugriff (PDF)

Characterization of biaxially-stretched plastic films by generalized ellipsometry

Thin solid films, 1998-02, Vol.313 (1-2), p.814-818

1998

Volltextzugriff (PDF)

Terahertz magneto-optic generalized ellipsometry using synchrotron and blackbody radiation

Review of scientific instruments, 2006-06, Vol.77 (6), p.063902-063902-12

2006

Volltextzugriff (PDF)

Screening effects in metal sculptured thin films studied with terahertz Mueller matrix ellipsometry

Applied surface science, 2017-11, Vol.421, p.513-517

2017

Volltextzugriff (PDF)

Determination of the optical dispersion in ferroelectric vinylidene fluoride (70%)/trifluoroethylene (30%) copolymer Langmuir–Blodgett films

Journal of applied physics, 2004-04, Vol.95 (7), p.3372-3377

2004

Volltextzugriff (PDF)

Ellipsometry on Anisotropic Materials: Bragg Conditions and Phonons in Dielectric Helical Thin Films

Physica status solidi. A, Applied research, 2001-12, Vol.188 (4), p.1563-1575

2001

Volltextzugriff (PDF)

Optical Hall effect measurement of coupled phonon mode - Landau Level transitions in epitaxial Graphene on silicon carbide

MRS proceedings, 2013, Vol.1505 (1), Article mrsf12-1505-w07-44

2013

Volltextzugriff (PDF)

Generalized spectroscopic ellipsometry and Mueller-matrix study of twisted nematic and super twisted nematic liquid crystals

Thin solid films, 2004-05, Vol.455, p.596-600

2004

Volltextzugriff (PDF)

1 – 25 von 116

Suche als RSS-Feed

Suchergebnisse filtern

Filter anzeigen

Nur zeigen

Geprüft (Peer-Review)
(97)
Mit Volltextzugriff
(100)

Publikationsform

Sprache

Erscheinungsjahr

n.n

Thema

Science & Technology
(74)
Physics
(62)
Physical Sciences
(55)
Physics, Applied
(44)
Technology
(37)
Materials Science
(31)
Exact Sciences And Technology
(26)
Physics, Condensed Matter
(23)
Materials Science, Multidisciplinary
(22)
Life Sciences & Biomedicine
(19)
Humans
(16)
Materials Science, Coatings & Films
(16)
Condensed Matter: Electronic Structure, Electrical, Magnetic, And Optical Properties
(15)
Dermatology
(12)
Male
(11)
Optics
(11)
Biological And Medical Sciences
(9)
Ellipsometry
(9)
Engineering
(9)
Optical Instruments, Equipment And Techniques
(8)

15 weitere anzeigen...

Weniger anzeigen...

Menü

Weitere Dienste

Einstellungen

Invited Article: An integrated mid-infrared, far-infrared, and terahertz optical Hall effect instrument

Temperature dependent effective mass in AlGaN/GaN high electron mobility transistor structures

Terahertz-frequency dielectric anisotropy in three-dimensional polymethacrylates fabricated by stereolithography

Terahertz ellipsometry and terahertz optical-Hall effect

Infrared dielectric anisotropy and phonon modes of sapphire

Variable-wavelength frequency-domain terahertz ellipsometry

Quantifying the accuracy of ellipsometer systems

Polarization selection rules for inter-Landau-level transitions in epitaxial graphene revealed by the infrared optical Hall effect

Terahertz optical-Hall effect for multiple valley band materials: n-type silicon

Anisotropic contrast optical microscope

Ellipsometric determination of optical constants for silicon and thermally grown silicon dioxide via a multi-sample, multi-wavelength, multi-angle investigation

Cavity-enhanced optical Hall effect in two-dimensional free charge carrier gases detected at terahertz frequencies

The optical Hall effect

Hole-channel conductivity in epitaxial graphene determined by terahertz optical-Hall effect and midinfrared ellipsometry

Terahertz optical-Hall effect characterization of two-dimensional electron gas properties in AlGaN/GaN high electron mobility transistor structures

Hole diffusion profile in a p-p+ silicon homojunction determined by terahertz and midinfrared spectroscopic ellipsometry

Development of a parametric optical constant model for Hg1−xCdxTe for control of composition by spectroscopic ellipsometry during MBE growth

Polarization Selection Rules for Inter-Landau-Level Transitions in Epitaxial Graphene Revealed by the Infrared Optical Hall Effect

Characterization of biaxially-stretched plastic films by generalized ellipsometry

Terahertz magneto-optic generalized ellipsometry using synchrotron and blackbody radiation

Screening effects in metal sculptured thin films studied with terahertz Mueller matrix ellipsometry

Determination of the optical dispersion in ferroelectric vinylidene fluoride (70%)/trifluoroethylene (30%) copolymer Langmuir–Blodgett films

Ellipsometry on Anisotropic Materials: Bragg Conditions and Phonons in Dielectric Helical Thin Films

Optical Hall effect measurement of coupled phonon mode - Landau Level transitions in epitaxial Graphene on silicon carbide

Generalized spectroscopic ellipsometry and Mueller-matrix study of twisted nematic and super twisted nematic liquid crystals

Suchergebnisse filtern