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In-line characterization of ultrathin transition metal dichalcogenides using X-ray fluorescence and X-ray photoelectron spectroscopy

Spectrochimica acta. Part B: Atomic spectroscopy, 2020-04, Vol.166, p.105788, Article 105788

2020

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A novel instrument for quantitative nanoanalytics involving complementary X-ray methodologies

Review of scientific instruments, 2013-04, Vol.84 (4), p.045106-045106

2013

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The anisotropy in the optical constants of quartz crystals for soft X‐rays

Journal of applied crystallography, 2021-04, Vol.54 (2), p.402-408

2021

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A semi‐analytical approach for the characterization of ordered 3D nanostructures using grazing‐incidence X‐ray fluorescence

Journal of synchrotron radiation, 2020-03, Vol.27 (2), p.386-395

2020

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Thermal stability and relaxation mechanisms in compressively strained Ge0.94Sn0.06 thin films grown by molecular beam epitaxy

Journal of applied physics, 2016-08, Vol.120 (8)

2016

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Experimental determination of the x-ray atomic fundamental parameters of nickel

Metrologia, 2018-02, Vol.55 (1), p.56-66

2018

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A combined experimental and theoretical approach to determine X‐ray atomic fundamental quantities of tin

X-ray spectrometry, 2018-09, Vol.47 (5), p.341-351

2018

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Grazing angle X-ray fluorescence from periodic structures on silicon and silica surfaces

Spectrochimica acta. Part B: Atomic spectroscopy, 2014-08, Vol.98, p.65-75

2014

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Self-Affine Surface Roughness of Chemically and Thermally Cleaned Ge(100) Surfaces

Journal of the Electrochemical Society, 2011, Vol.158 (10), p.H1090

2011

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Experimental determination of the oxygen K-shell fluorescence yield using thin SiO2 and Al2O3 foils

Spectrochimica acta. Part B: Atomic spectroscopy, 2016-10, Vol.124, p.94-98

2016

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Characterization of ultra-shallow aluminum implants in silicon by grazing incidence and grazing emission X-ray fluorescence spectroscopy

Journal of analytical atomic spectrometry, 2012-01, Vol.27 (9), p.1432-1438

2012

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Experimental determination of the oxygen K-shell fluorescence yield using thin SiO 2 and Al 2 O 3 foils

Spectrochimica acta. Part B: Atomic spectroscopy, 2016-10, Vol.124, p.94-98

2016

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Theoretical and experimental determination of K - and L -shell x-ray relaxation parameters in Ni

Physical review. A, 2018-04, Vol.97 (4), Article 042501

2018

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Grazing-incidence x-ray fluorescence analysis for non-destructive determination of In and Ga depth profiles in Cu(In,Ga)Se2 absorber films

Applied physics letters, 2013-09, Vol.103 (11)

2013

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Focusing of soft X-ray radiation and characterization of the beam profile enabling X-ray emission spectrometry at nanolayered specimens

Spectrochimica acta. Part B: Atomic spectroscopy, 2012-12, Vol.78, p.37-41

2012

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Thermal stability and relaxation mechanisms in compressively strained Ge{sub 0.94}Sn{sub 0.06} thin films grown by molecular beam epitaxy

Journal of applied physics, 2016-08, Vol.120 (8)

2016

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Grazing-incidence x-ray fluorescence analysis for non-destructive determination of In and Ga depth profiles in Cu(In,Ga)Se{sub 2} absorber films

Applied physics letters, 2013-09, Vol.103 (11)

2013

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A new generation of x-ray spectrometry UHV instruments at the SR facilities BESSY II, ELETTRA and SOLEIL

AIP conference proceedings, 2016, Vol.1741 (1)

2016

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Towards Passivation of Ge(100) Surfaces by Sulfur Adsorption from a (NH4)2S Solution: A Combined NEXAFS, STM and LEED Study

Journal of the Electrochemical Society, 2011, Vol.158 (5), p.H589

2011

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Depth-profiling of vertical sidewall nanolayers on structured wafers by grazing incidence X-ray flourescence

Spectrochimica acta. Part B: Atomic spectroscopy, 2008-12, Vol.63 (12), p.1359-1364

2008

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Oxidation and Sulfidation of Germanium Surfaces: A Comparative Atomic Level Study of Different Passivation Schemes

ECS transactions, 2013, Vol.50 (9), p.569-579

2013

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Reliable Quantification of Inorganic Contamination by TXRF

Solid state phenomena, 2012, Vol.187, p.291-294

2012

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Erratum to “Depth-profiling of vertical sidewall nanolayers on structured wafers by grazing incidence X-ray fluorescence” [Spectrochim. Acta Part B 63 (2008) 1359–1364]

Spectrochimica acta. Part B: Atomic spectroscopy, 2009-03, Vol.64 (3), p.291-291

2009

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F-65 Assessment of Advanced X-ray GIXRF Methodology Applied to the Characterization of Ultra Shallow Junctions

Powder Diffraction, 2010-06, Vol.25 (2), p.221-221

2010

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Regulation of sulphate assimilation by glutathione in poplars (Populus tremula×P. alba) of wild type and overexpressing γ‐glutamylcysteine synthetase in the cytosol

Journal of experimental botany, 2004-04, Vol.55 (398), p.837-845

2004

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In-line characterization of ultrathin transition metal dichalcogenides using X-ray fluorescence and X-ray photoelectron spectroscopy

A novel instrument for quantitative nanoanalytics involving complementary X-ray methodologies

The anisotropy in the optical constants of quartz crystals for soft X‐rays

A semi‐analytical approach for the characterization of ordered 3D nanostructures using grazing‐incidence X‐ray fluorescence

Thermal stability and relaxation mechanisms in compressively strained Ge0.94Sn0.06 thin films grown by molecular beam epitaxy

Experimental determination of the x-ray atomic fundamental parameters of nickel

A combined experimental and theoretical approach to determine X‐ray atomic fundamental quantities of tin

Grazing angle X-ray fluorescence from periodic structures on silicon and silica surfaces

Self-Affine Surface Roughness of Chemically and Thermally Cleaned Ge(100) Surfaces

Experimental determination of the oxygen K-shell fluorescence yield using thin SiO2 and Al2O3 foils

Characterization of ultra-shallow aluminum implants in silicon by grazing incidence and grazing emission X-ray fluorescence spectroscopy

Experimental determination of the oxygen K-shell fluorescence yield using thin SiO 2 and Al 2 O 3 foils

Theoretical and experimental determination of K - and L -shell x-ray relaxation parameters in Ni

Grazing-incidence x-ray fluorescence analysis for non-destructive determination of In and Ga depth profiles in Cu(In,Ga)Se2 absorber films

Focusing of soft X-ray radiation and characterization of the beam profile enabling X-ray emission spectrometry at nanolayered specimens

Thermal stability and relaxation mechanisms in compressively strained Ge{sub 0.94}Sn{sub 0.06} thin films grown by molecular beam epitaxy

Grazing-incidence x-ray fluorescence analysis for non-destructive determination of In and Ga depth profiles in Cu(In,Ga)Se{sub 2} absorber films

A new generation of x-ray spectrometry UHV instruments at the SR facilities BESSY II, ELETTRA and SOLEIL

Towards Passivation of Ge(100) Surfaces by Sulfur Adsorption from a (NH4)2S Solution: A Combined NEXAFS, STM and LEED Study

Depth-profiling of vertical sidewall nanolayers on structured wafers by grazing incidence X-ray flourescence

Oxidation and Sulfidation of Germanium Surfaces: A Comparative Atomic Level Study of Different Passivation Schemes

Reliable Quantification of Inorganic Contamination by TXRF

Erratum to “Depth-profiling of vertical sidewall nanolayers on structured wafers by grazing incidence X-ray fluorescence” [Spectrochim. Acta Part B 63 (2008) 1359–1364]

F-65 Assessment of Advanced X-ray GIXRF Methodology Applied to the Characterization of Ultra Shallow Junctions

Regulation of sulphate assimilation by glutathione in poplars (Populus tremula×P. alba) of wild type and overexpressing γ‐glutamylcysteine synthetase in the cytosol

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