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In vivo recordings of brain activity using organic transistors

Nature communications, 2013, Vol.4 (1), p.1575-1575, Article 1575

2013

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High transconductance organic electrochemical transistors

Nature communications, 2013, Vol.4 (1), p.2133-2133, Article 2133

2013

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Highly Conformable Conducting Polymer Electrodes for In Vivo Recordings

Advanced materials (Weinheim), 2011-09, Vol.23 (36), p.H268-H272

2011

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High speed and high density organic electrochemical transistor arrays

Applied physics letters, 2011-10, Vol.99 (16), p.163304-163304-3

2011

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Organic electrochemical transistor incorporating an ionogel as a solid state electrolyte for lactate sensing

Journal of materials chemistry, 2012-01, Vol.22 (1), p.444-4443

2012

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Characterization of Transient Gate Oxide Trapping in SiC MOSFETs Using Fast I- V Techniques

IEEE transactions on electron devices, 2008-08, Vol.55 (8), p.2004-2012

2008

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Time Dependence of Bias-Stress-Induced SiC MOSFET Threshold-Voltage Instability Measurements

IEEE transactions on electron devices, 2008-08, Vol.55 (8), p.1835-1840

2008

Volltextzugriff (PDF)

Measurement of Barrier Tissue Integrity with an Organic Electrochemical Transistor

Advanced materials (Weinheim), 2012-11, Vol.24 (44), p.5919-5923

2012

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VLSI MOSFETs lifetime reduction caused by impedance mismatch

Microelectronic engineering, 2011, Vol.88 (1), p.28-31

2011

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Energy- and Time-Dependent Dynamics of Trap Occupation in 4H-SiC MOSFETs

IEEE transactions on electron devices, 2008-08, Vol.55 (8), p.2061-2070

2008

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Enhanced gate induced drain leakage current in HfO2 MOSFETs

Microelectronic engineering, 2009-11, Vol.86 (11), p.2157-2160

2009

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Enhanced gate induced drain leakage current in HfO(2) MOSFETs

Microelectronic engineering, 2009-11, Vol.86 (11), p.2157-2160

2009

Volltextzugriff (PDF)

In vivo recordings of brain activity using organic transistors

Nature communications, 2013-03, Vol.4

2013

Volltextzugriff (PDF)

Enhanced gate induced drain leakage current in HfO 2 MOSFETs

Microelectronic engineering, 2009, Vol.86 (11), p.2157-2160

2009

Volltextzugriff (PDF)

Time Dependence of Bias-Stress-Induced SiC MOSFET Threshold-Voltage Instability Measurements : Silicon carbide devices and technology

IEEE transactions on electron devices, 2008, Vol.55 (8), p.1835-1840

2008

Volltextzugriff (PDF)

Energy-and Time-Dependent Dynamics of Trap Occupation in 4H-SiC MOSFETs : Silicon carbide devices and technology

IEEE transactions on electron devices, 2008, Vol.55 (8), p.2061-2070

2008

Volltextzugriff (PDF)

Characterization of Transient Gate Oxide Trapping in SiC MOSFETs Using Fast I-V Techniques : Silicon carbide devices and technology

IEEE transactions on electron devices, 2008, Vol.55 (8), p.2004-2012

2008

Volltextzugriff (PDF)

Organic electrochemical transistor incorporating an ionogel as solid state electolyte for lactate sensing

Journal of materials chemistry, 2012

2012

Volltextzugriff (PDF)

Stress-induced defect generation in HfO2/SiO2 stacks observed by using charge pumping and low frequency noise measurements

2008 IEEE International Reliability Physics Symposium, 2008, p.319-323

2008

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Local Oscillations of On-Die Supply Voltage-A Reliability Issue

IEEE transactions on device and materials reliability, 2009-09, Vol.9 (3), p.476-482

2009

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Time-Dependent Dielectric Breakdown of 4H-SiC/ \hbox MOS Capacitors

IEEE transactions on device and materials reliability, 2008-12, Vol.8 (4), p.635-641

2008

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In vivo recordings of brain activity using organic transistors

High transconductance organic electrochemical transistors

Highly Conformable Conducting Polymer Electrodes for In Vivo Recordings

High speed and high density organic electrochemical transistor arrays

Organic electrochemical transistor incorporating an ionogel as a solid state electrolyte for lactate sensing

Characterization of Transient Gate Oxide Trapping in SiC MOSFETs Using Fast I- V Techniques

Time Dependence of Bias-Stress-Induced SiC MOSFET Threshold-Voltage Instability Measurements

Measurement of Barrier Tissue Integrity with an Organic Electrochemical Transistor

VLSI MOSFETs lifetime reduction caused by impedance mismatch

Energy- and Time-Dependent Dynamics of Trap Occupation in 4H-SiC MOSFETs

Enhanced gate induced drain leakage current in HfO2 MOSFETs

Enhanced gate induced drain leakage current in HfO(2) MOSFETs

In vivo recordings of brain activity using organic transistors

Enhanced gate induced drain leakage current in HfO 2 MOSFETs

Time Dependence of Bias-Stress-Induced SiC MOSFET Threshold-Voltage Instability Measurements : Silicon carbide devices and technology

Energy-and Time-Dependent Dynamics of Trap Occupation in 4H-SiC MOSFETs : Silicon carbide devices and technology

Characterization of Transient Gate Oxide Trapping in SiC MOSFETs Using Fast I-V Techniques : Silicon carbide devices and technology

Organic electrochemical transistor incorporating an ionogel as solid state electolyte for lactate sensing

Stress-induced defect generation in HfO2/SiO2 stacks observed by using charge pumping and low frequency noise measurements

Local Oscillations of On-Die Supply Voltage-A Reliability Issue

Time-Dependent Dielectric Breakdown of 4H-SiC/ \hbox MOS Capacitors

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