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Phase-transition-driven growth of compound semiconductor crystals from ordered metastable nanorods

Nature communications, 2014-01, Vol.5 (1), p.3133-3133, Article 3133

2014

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Thermal expansion of Ti-Al-N and Cr-Al-N coatings

Scripta materialia, 2017-01, Vol.127, p.182-185

2017

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Preferential {100} grain orientation in 10 micrometer-thick laser crystallized multicrystalline silicon on glass

Thin solid films, 2015-02, Vol.576, p.68-74

2015

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The evolution of internal strain in Mg–Y–Zn alloys with a long period stacking ordered structure

Scripta materialia, 2011-10, Vol.65 (8), p.719-722

2011

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Lateral gradients of phases, residual stress and hardness in a laser heated Ti0.52Al0.48N coating on hard metal

Surface & coatings technology, 2012-06, Vol.206 (22), p.4502-4510

2012

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Influence of SiC particles on compressive deformation of magnesium matrix composites

Materials science & engineering. A, Structural materials : properties, microstructure and processing, 2012, Vol.533, p.119-123

2012

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Residual stresses and thermal fatigue in CrN hard coatings characterized by high-temperature synchrotron X-ray diffraction

Thin solid films, 2010-02, Vol.518 (8), p.2090-2096

2010

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EDLD-Tool : A real-time GPU-based tool to stream and analyze energy-dispersive Laue diffraction of BIG Data sets collected by a pnCCD

Journal of instrumentation, 2019-01, Vol.14 (1), p.P01008-P01008

2019

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X-ray diffraction analysis of three-dimensional residual stress fields reveals origins of thermal fatigue in uncoated and coated steel

Scripta materialia, 2010-05, Vol.62 (10), p.774-777

2010

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Applications of a pnCCD detector coupled to columnar structure CsI(Tl) scintillator system in ultra high energy X-ray Laue diffraction

Journal of instrumentation, 2017-12, Vol.12 (12), p.P12032-P12032

2017

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X-ray residual stress analysis in thin films under grazing incidence - basic aspects and applications

Materials science and technology, 2005-01, Vol.21 (1), p.10-18

Genzel, CH

2005

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Growth paths for the sulfurization of Cu-rich Cu/In thin films

Thin solid films, 2009-02, Vol.517 (7), p.2140-2144

2009

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Real-time observation of the phase transformations and microstructural changes during the incorporation of In into a thin Cu film at 770 K

Journal of alloys and compounds, 2014-03, Vol.588, p.644-647

2014

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Comparison of Techniques for Strain Measurements in CuInSe2 Absorber Layers of Thin-film Solar Cells

Microscopy and microanalysis, 2014-08, Vol.20 (S3), p.1464-1465

2014

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X-ray diffraction study on residual stress and preferred orientation in thin titanium films subjected to a high ion flux during deposition

Journal of applied physics, 2004-12, Vol.96 (12), p.7202-7211

2004

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Application of energy-dispersive diffraction to the analysis of multiaxial residual stress fields in the intermediate zone between surface and volume

Materials science & engineering. A, Structural materials : properties, microstructure and processing, 2004-05, Vol.372 (1), p.28-43

2004

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New HMI hard X-ray Diffraction Beamlines at BESSY

AIP conference proceedings, 2007, Vol.879 (1), p.1763-1766

2007

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Energy Resolved Residual Stress Analysis with Laboratory X-Ray Sources

Journal of heat treatment and materials : HTM = Zeitschrift für Werkstoffe, Wärmebehandlung, Fertigung, 2017-04, Vol.72 (2), p.115-121

2017

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Real-time observation of the phase transformations and microstructural changes during the incorporation of In into a thin Cu film at 770K

Journal of alloys and compounds, 2014-03, Vol.588, p.644-647

2014

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A self-consistent method for X-ray diffraction analysis of multiaxial residual-stress fields in the near-surface region of polycrystalline materials. I. Theoretical concept

Journal of applied crystallography, 1999-08, Vol.32 (4), p.770-778

Genzel, Christoph

1999

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Analysis of residual stresses induced by surface processing: angle versus energy-dispersive diffraction

Acta crystallographica. Section A, Foundations of crystallography, 2008-08, Vol.64 (a1), p.C105-C105

Genzel, C.

2008

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Diffraction Stress Analysis in Thin Films and Coatings--Problems, Methods and Perspectives

Journal of neutron research, 2004-01, Vol.12 (1-3), p.233-241

Genzel, Ch

2004

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Lateral gradients of phases, residual stress and hardness in a laser heated Ti 0.52 Al 0.48 N coating on hard metal

Surface & coatings technology, 2012-06, Vol.206 (22), p.4502

2012

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Thermal residual microstresses in steel-NbC particulate composites studied by X-ray and neutron diffraction

Materials science & engineering. A, Structural materials : properties, microstructure and processing, 1996-07, Vol.212 (1), p.130-138

1996

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Energy-Dispersive Residual Stress Analysis under Laboratory Conditions: Concept for a New Type of Diffractometer

Advanced materials research, 2014, Vol.996, p.192-196

2014

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Phase-transition-driven growth of compound semiconductor crystals from ordered metastable nanorods

Thermal expansion of Ti-Al-N and Cr-Al-N coatings

Preferential {100} grain orientation in 10 micrometer-thick laser crystallized multicrystalline silicon on glass

The evolution of internal strain in Mg–Y–Zn alloys with a long period stacking ordered structure

Lateral gradients of phases, residual stress and hardness in a laser heated Ti0.52Al0.48N coating on hard metal

Influence of SiC particles on compressive deformation of magnesium matrix composites

Residual stresses and thermal fatigue in CrN hard coatings characterized by high-temperature synchrotron X-ray diffraction

EDLD-Tool : A real-time GPU-based tool to stream and analyze energy-dispersive Laue diffraction of BIG Data sets collected by a pnCCD

X-ray diffraction analysis of three-dimensional residual stress fields reveals origins of thermal fatigue in uncoated and coated steel

Applications of a pnCCD detector coupled to columnar structure CsI(Tl) scintillator system in ultra high energy X-ray Laue diffraction

X-ray residual stress analysis in thin films under grazing incidence - basic aspects and applications

Growth paths for the sulfurization of Cu-rich Cu/In thin films

Real-time observation of the phase transformations and microstructural changes during the incorporation of In into a thin Cu film at 770 K

Comparison of Techniques for Strain Measurements in CuInSe2 Absorber Layers of Thin-film Solar Cells

X-ray diffraction study on residual stress and preferred orientation in thin titanium films subjected to a high ion flux during deposition

Application of energy-dispersive diffraction to the analysis of multiaxial residual stress fields in the intermediate zone between surface and volume

New HMI hard X-ray Diffraction Beamlines at BESSY

Energy Resolved Residual Stress Analysis with Laboratory X-Ray Sources

Real-time observation of the phase transformations and microstructural changes during the incorporation of In into a thin Cu film at 770K

A self-consistent method for X-ray diffraction analysis of multiaxial residual-stress fields in the near-surface region of polycrystalline materials. I. Theoretical concept

Analysis of residual stresses induced by surface processing: angle versus energy-dispersive diffraction

Diffraction Stress Analysis in Thin Films and Coatings--Problems, Methods and Perspectives

Lateral gradients of phases, residual stress and hardness in a laser heated Ti 0.52 Al 0.48 N coating on hard metal

Thermal residual microstresses in steel-NbC particulate composites studied by X-ray and neutron diffraction

Energy-Dispersive Residual Stress Analysis under Laboratory Conditions: Concept for a New Type of Diffractometer

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