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Cochlear Implants in Five Cases of Auditory Neuropathy: Postoperative Findings and Progress

The Laryngoscope, 2001-04, Vol.111 (4), p.555-562

2001

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Determination of ultra trace contaminants on silicon wafer surfaces using total-reflection X-ray fluorescence TXRF ‘state-of-the-art’

Spectrochimica Acta Part B: Atomic Spectroscopy, 2001-11, Vol.56 (11), p.2261-2274

2001

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Mechanism of Erythrocyte Aggregation and Sedimentation

Blood, 1987-11, Vol.70 (5), p.1572-1576

Fabry, Thomas L.

1987

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Gettering of Copper and Nickel in p/p+ Epitaxial Wafers

Journal of the Electrochemical Society, 2000-07, Vol.147 (7), p.2704

2000

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Analysis of organic contaminants on Si wafers with TXRF-NEXAFS

Spectrochimica acta. Part B: Atomic spectroscopy, 2003-12, Vol.58 (12), p.2245-2253

2003

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Barriers to the Effective Use of Technology in Education: Current Status

Journal of educational computing research, 1997-01, Vol.17 (4), p.385-395

1997

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Modeling of Cu gettering in p- and n-type silicon and in poly-silicon

Applied physics. A, Materials science & processing, 2002-10, Vol.75 (4), p.525-534

2002

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Improvement of total reflection X-ray fluorescence analysis of low Z elements on silicon wafer surfaces at the PTB monochromator beamline for undulator radiation at the electron storage ring BESSY II

Spectrochimica acta. Part B: Atomic spectroscopy, 2001-11, Vol.56 (11), p.2073-2083

2001

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Hearing and Otopathology in Crouzon Syndrome

The Laryngoscope, 1999-09, Vol.109 (9), p.1372-1375

1999

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Comparison of different gettering techniques for Cu- p+ versus polysilicon and oxygen precipitates

Applied physics. A, Materials science & processing, 2002-11, Vol.75 (5), p.591-595

2002

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Efficacy and Safety Studies of a Recombinant Chimeric Respiratory Syncytial Virus FG Glycoprotein Vaccine in Cotton Rats

Journal of Virology, 2000-11, Vol.74 (22), p.10287-10292

2000

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Successful Treatment of Renal Failure Caused by Multiple Myeloma With HLA-Identical Living Kidney and Bone Marrow Transplantation: A Case Report

Transplantation proceedings, 2013-12, Vol.45 (10), p.3705-3707

2013

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Si drift detector in comparison to Si(Li) detector for total reflection X-ray fluorescence analysis applications

Spectrochimica acta. Part B: Atomic spectroscopy, 2003-12, Vol.58 (12), p.2123-2128

2003

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The linkage between macroscopic gettering mechanisms and electronic configuration of 3d-elements in p/p+ epitaxial silicon wafers

Applied physics. A, Materials science & processing, 2002, Vol.74 (1), p.35-39

2002

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Ultra-trace analytical monitoring of silicon wafer surfaces by capillary electrophoresis

Fresenius' journal of analytical chemistry, 2001-10, Vol.371 (4), p.407-412

2001

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Analysis of low Z elements on Si wafer surfaces with undulator radiation induced total reflection X-ray fluorescence at the PTB beamline at BESSY II

Spectrochimica acta. Part B: Atomic spectroscopy, 2003-12, Vol.58 (12), p.2113-2121

2003

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Gettering efficiencies of polysilicon-, stacking fault- and He-implanted backsides for Cu and Ni

Materials science & engineering. B, Solid-state materials for advanced technology, 2000-04, Vol.73 (1), p.95-98

2000

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Analysis of low Z elements on Si wafer surfaces with synchrotron radiation induced total reflection X-ray fluorescence at SSRL, Beamline 3-3: comparison of droplets with spin coated wafers

Spectrochimica acta. Part B: Atomic spectroscopy, 2003-12, Vol.58 (12), p.2105-2112

2003

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Gettering efficiencies for Cu and Ni as a function of size and density of oxygen precipitates in p/p- silicon epitaxial wafers

Applied physics. A, Materials science & processing, 2001-08, Vol.73 (2), p.137-142

2001

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Accurate calibration of TXRF using microdroplet samples

Analytical and bioanalytical chemistry, 1996-01, Vol.354 (3), p.266-270

1996

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Integrity of ultrathin gate oxides with different oxide thickness, substrate wafers and metallic contaminations

Applied physics. A, Materials science & processing, 2001-03, Vol.72 (3), p.351-356

2001

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Low Z total reflection X-ray fluorescence analysis — challenges and answers

Spectrochimica acta. Part B: Atomic spectroscopy, 1999-10, Vol.54 (10), p.1433-1441

1999

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Analysis of Ni on Si-wafer surfaces using synchrotron radiation excited total reflection X-ray fluorescence analysis

Spectrochimica acta. Part B : Atomic spectroscopy, 1997-07, Vol.52 (7), p.901-906

1997

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Synchrotron radiation induced total reflection X-ray fluorescence of low Z elements on Si wafer surfaces at SSRL — comparison of excitation geometries and conditions

Spectrochimica acta. Part B: Atomic spectroscopy, 2001-11, Vol.56 (11), p.2085-2094

2001

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Ni reactions with surfaces: dependence of gettering efficiencies for Ni on crystal-growth conditions, back-side-gettering techniques, oxygen precipitates and thermal treatments

Applied physics. A, Materials science & processing, 2002-05, Vol.74 (5), p.711-718

2002

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Cochlear Implants in Five Cases of Auditory Neuropathy: Postoperative Findings and Progress

Determination of ultra trace contaminants on silicon wafer surfaces using total-reflection X-ray fluorescence TXRF ‘state-of-the-art’

Mechanism of Erythrocyte Aggregation and Sedimentation

Gettering of Copper and Nickel in p/p+ Epitaxial Wafers

Analysis of organic contaminants on Si wafers with TXRF-NEXAFS

Barriers to the Effective Use of Technology in Education: Current Status

Modeling of Cu gettering in p- and n-type silicon and in poly-silicon

Improvement of total reflection X-ray fluorescence analysis of low Z elements on silicon wafer surfaces at the PTB monochromator beamline for undulator radiation at the electron storage ring BESSY II

Hearing and Otopathology in Crouzon Syndrome

Comparison of different gettering techniques for Cu- p+ versus polysilicon and oxygen precipitates

Efficacy and Safety Studies of a Recombinant Chimeric Respiratory Syncytial Virus FG Glycoprotein Vaccine in Cotton Rats

Successful Treatment of Renal Failure Caused by Multiple Myeloma With HLA-Identical Living Kidney and Bone Marrow Transplantation: A Case Report

Si drift detector in comparison to Si(Li) detector for total reflection X-ray fluorescence analysis applications

The linkage between macroscopic gettering mechanisms and electronic configuration of 3d-elements in p/p+ epitaxial silicon wafers

Ultra-trace analytical monitoring of silicon wafer surfaces by capillary electrophoresis

Analysis of low Z elements on Si wafer surfaces with undulator radiation induced total reflection X-ray fluorescence at the PTB beamline at BESSY II

Gettering efficiencies of polysilicon-, stacking fault- and He-implanted backsides for Cu and Ni

Analysis of low Z elements on Si wafer surfaces with synchrotron radiation induced total reflection X-ray fluorescence at SSRL, Beamline 3-3: comparison of droplets with spin coated wafers

Gettering efficiencies for Cu and Ni as a function of size and density of oxygen precipitates in p/p- silicon epitaxial wafers

Accurate calibration of TXRF using microdroplet samples

Integrity of ultrathin gate oxides with different oxide thickness, substrate wafers and metallic contaminations

Low Z total reflection X-ray fluorescence analysis — challenges and answers

Analysis of Ni on Si-wafer surfaces using synchrotron radiation excited total reflection X-ray fluorescence analysis

Synchrotron radiation induced total reflection X-ray fluorescence of low Z elements on Si wafer surfaces at SSRL — comparison of excitation geometries and conditions

Ni reactions with surfaces: dependence of gettering efficiencies for Ni on crystal-growth conditions, back-side-gettering techniques, oxygen precipitates and thermal treatments

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