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2024 IEEE International Reliability Physics Symposium (IRPS), 2024, p.1-5
2024
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Journal of applied physics, 2015-02, Vol.117 (6)
2015
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2022 IEEE International Reliability Physics Symposium (IRPS), 2022, p.8C.2-1-8C.2-7
2022
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Journal of applied physics, 2015-10, Vol.118 (16)
2015
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1st Edition 2024, 2024
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2015 Symposium on VLSI Technology (VLSI Technology), 2015, p.T26-T27
2015
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2014 IEEE International Reliability Physics Symposium, 2014, p.3A.2.1-3A.2.6
2014
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Microelectronic engineering, 2011-05, Vol.88 (5), p.651-655
2011
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IEEE transactions on electron devices, 2023-08, Vol.70 (8), p.4332-4337
2023
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2018 IEEE International Electron Devices Meeting (IEDM), 2018, p.5.3.1-5.3.4
2018
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Trends in ecology & evolution (Amsterdam), 2022-03, Vol.37 (3), p.197-202
- Formenti, Giulio
- Bista, Iliana
- Bleidorn, Christoph
- Ciofi, Claudio
- Höglund, Jacob
- Paez, Sadye
- Palsbøll, Per J.
- Pampoulie, Christophe
- Ruiz-López, María J.
- de Vries, Jan
- Zhang, Guojie
- Jarvis, Erich D.
- Bálint, Miklós
- Fernandes, Carlos
- Crottini, Angelica
- Mouton, Alice
- Palsbøll, Per
- Svardal, Hannes
- Zhang, Goujie
- Mazzoni, Camila J.
- Alioto, Tyler S.
- Almudi, Isabel
- Alvarez, Nadir
- Alves, Paulo C.
- Amorim, Isabel R.
- Antunes, Agostinho
- Arribas, Paula
- Baldrian, Petr
- Berg, Paul R.
- Böhne, Astrid
- Bonisoli-Alquati, Andrea
- Boussau, Bastien
- Breton, Catherine M.
- Buzan, Elena
- Campos, Paula F.
- Carreras, Carlos
- Castro, L. FIlipe
- Conti, Elena
- Croll, Daniel
- Cunha, Mónica V.
- Dimitrov, Dimitar
- Faria, Rui
- Ficetola, Gentile Francesco
- Flot, Jean-François
- Gabaldón, Toni
- Galea Agius, Dolores R.
- Giani, Alice M.
- Gilbert, M. Thomas P.
- Grebenc, Tine
- Guschanski, Katerina
- Hawlitschek, Oliver
- Heintzman, Peter D.
- Heinze, Berthold
- Hiller, Michael
- Klinga, Peter
- Kratochwil, Claudius F.
- Layton, Kara K.S.
- Leonard, Jennifer A.
- Lerat, Emmanuelle
- Liti, Gianni
- Manousaki, Tereza
- Marques-Bonet, Tomas
- Matos-Maraví, Pável
- Maumus, Florian
- Mc Cartney, Ann M.
- Mengual, Ximo
- Mysłajek, Robert W.
- Neiber, Marco T.
- Novo, Marta
- Ozretić, Petar
- Pascual, Marta
- Pavlek, Martina
- Pegueroles, Cinta
- Pellissier, Loïc
- Pesole, Graziano
- Primmer, Craig R.
- Riesgo, Ana
- Rüber, Lukas
- Salvi, Daniele
- Seehausen, Ole
- Seidel, Matthias
- Secomandi, Simona
- Studer, Bruno
- Urban, Lara
- Vasemägi, Anti
- Vella, Adriana
- Vella, Noel
- Vernes, Sonja C.
- Vernesi, Cristiano
- Vieites, David R.
- Wheat, Christopher W.
- Wörheide, Gert
- Wurm, Yannick
- Zammit, Gabrielle
2022
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Clinical infectious diseases, 2022-08, Vol.75 (3), p.549-550
2022
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BEOL tip-to-tip dielectric reliability characterization using a design-representative test structure
2024
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2022 IEEE International Interconnect Technology Conference (IITC), 2022, p.67-69
2022
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Cell reports (Cambridge), 2021-03, Vol.34 (11), p.108852-108852, Article 108852
- Cotugno, Nicola
- Ruggiero, Alessandra
- Bonfante, Francesco
- Petrara, Maria Raffaella
- Zicari, Sonia
- Pascucci, Giuseppe Rubens
- Zangari, Paola
- De Ioris, Maria Antonietta
- Santilli, Veronica
- Manno, E.C.
- Amodio, Donato
- Bortolami, Alessio
- Pagliari, Matteo
- Concato, Carlo
- Linardos, Giulia
- Campana, Andrea
- Donà, Daniele
- Giaquinto, Carlo
- Bernardi, Stefania
- Romani, Lorenza
- Pansa, Paola
- Chiurchiú, Sara
- Finocchi, Andrea
- Cancrini, Caterina
- Lancella, Laura
- Cursi, Laura
- De Luca, Maia
- Cutrera, Renato
- Sessa, Libera
- Morrocchi, Elena
- Medri, Chiara
- Putignani, Lorenza
- Calò Carducci, F.I.
- D’Argenio, Patrizia
- Ciofi degli Atti, Marta
- D’Amore, Carmen
- Piccioni, Livia
- Di Giuseppe, Martina
- Jenkner, Alessandro
- Giancotta, Carmela
- Krzysztofiak, Andrzej
- Brodin, Petter
- Rossi, Paolo
- De Rossi, Anita
- Palma, Paolo
2021
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Microelectronics and reliability, 2017-09, Vol.76-77, p.131-135
2017
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2022 IEEE International Interconnect Technology Conference (IITC), 2022, p.28-30
2022
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2024 IEEE International Reliability Physics Symposium (IRPS), 2024, p.1-5
2024
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2022 IEEE International Interconnect Technology Conference (IITC), 2022, p.31-33
2022
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Pediatric allergy and immunology, 2021-11, Vol.32 (8), p.1833-1842
- Cotugno, Nicola
- Ruggiero, Alessandra
- Pascucci, Giuseppe Rubens
- Bonfante, Francesco
- Petrara, Maria Raffaella
- Pighi, Chiara
- Cifaldi, Loredana
- Zangari, Paola
- Bernardi, Stefania
- Cursi, Laura
- Santilli, Veronica
- Manno, Emma Concetta
- Amodio, Donato
- Linardos, Giulia
- Piccioni, Livia
- Barbieri, Maria Antonietta
- Perrotta, Daniela
- Campana, Andrea
- Donà, Daniele
- Giaquinto, Carlo
- Concato, Carlo
- Brodin, Petter
- Rossi, Paolo
- De Rossi, Anita
- Palma, Paolo
- Riggioni, Carmen
- Romani, Lorenza
- Pansa, Paola
- Chiurchiu, Sara
- Finocchi, Andrea
- Cancrini, Caterina
- Lancella, Laura
- De Luca, Maia
- Cutrera, Renato
- Villani, Alberto
- Morrocchi, Elena
- Zicari, Sonia
- Putignani, Lorenza
- Calò Carducci, Francesca
- De Ioris, Maria A.
- D'Argenio, Patrizia
- degli Atti, Marta Ciofi
- D'Amore, Carmen
2021
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2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits), 2023, p.1-2
2023
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2022 International Electron Devices Meeting (IEDM), 2022, p.23.2.1-23.2.4
- Vega-Gonzalez, V.
- Radisic, D.
- Choudhury, S.
- Tierno, D.
- Thiam, A.
- Batuk, D.
- Martinez, G.T.
- Seidel, F.
- Decoster, S.
- Kundu, S.
- Tsvetanova, D.
- Peter, A.
- De Coster, H.
- Sepulveda-Marquez, A.
- Altamirano-Sanchez, E.
- Chan, Bt
- Drissi, Y.
- Sherazi, Y.
- Uk-Lee, J.
- Ciofi, I.
- Murdoch, G.
- Nagesh, N.
- Hellings, G.
- Ryckaert, J.
- Biesemans, S.
- Litta, E. Dentoni
- Horiguchi, N.
- Park, S.
- Tokei, Zs
2022
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European journal of clinical pharmacology, 2015-04, Vol.71 (4), p.483-488
2015
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Microelectronic engineering, 2006-11, Vol.83 (11), p.2179-2183
2006
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2018 IEEE International Reliability Physics Symposium (IRPS), 2018, p.P-GD.10-1-P-GD.10-4
2018
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