UB Paderborn / Katalog / Suche / in CDI

Sortiert nach

Einfacher Volltextzugriff von (fast) überall

Installieren Sie die LibKey Nomad-Browsererweiterung und erhalten Sie von vielen Webseiten einfachen Zugriff auf lizenzierte Volltexte oder Open Access Publikationen. Mehr erfahren...

Pitch perception deficits in nonverbal learning disability

Research in developmental disabilities, 2016-12, Vol.59, p.378-386

2016

Volltextzugriff (PDF)

Discriminatory validity and association of the mini-mental test (MMSE) and the memory alteration test (M@T) with a neuropsychological battery in patients with amnestic mild cognitive impairment and Alzheimer's disease

Revista de neurologiá, 2009-08, Vol.49 (4), p.169-174

2009

Volltextzugriff (PDF)

Naming is associated with left temporal pole metabolite levels in neurodegenerative diseases

Dementia and geriatric cognitive disorders, 2008-03, Vol.25 (3), p.212-217

2008

Volltextzugriff (PDF)

Posterior cortical atrophy. Its neuropsychological profile and differences from typical Alzheimer's disease

Revista de neurologiá, 2009-02, Vol.48 (4), p.178-182

2009

Volltextzugriff (PDF)

A specimen-current branching approach for FA of long Electromigration test lines

Microelectronics and reliability, 2002-09, Vol.42 (9), p.1715-1718

2002

Volltextzugriff (PDF)

Validez discriminativa y asociación del test minimental (MMSE) y del test de alteración de memoria (T@M) con una batería neuropsicológica en pacientes con deterioro cognitivo leve amnésico y enfermedad de Alzheimer

Revista de neurologiá, 2009, Vol.49 (4), p.169

2009

Volltextzugriff (PDF)

Novel Electromigration Failure Mechanism for Aluminium-Based Metallization on Titanium Substrate

MRS proceedings, 1998, Vol.516, Article 59

1998

Volltextzugriff (PDF)

On the validity of the resistometric technique in electromigration studies of narrow stripes

Thin solid films, 1989-05, Vol.172 (2), p.L85-L89

1989

Volltextzugriff (PDF)

Atrofia cortical posterior. Perfil neuropsicológico y diferencias con la enfermedad de Alzheimer típica

Revista de neurologiá, 2009-02, Vol.48 (4), p.178

2009

Volltextzugriff (PDF)

Microscopic control of semiconductor surface oxidation

Journal of vacuum science & technology. A, Vacuum, surfaces, and films, 1985-05, Vol.3 (3), p.933-937

1985

Volltextzugriff (PDF)

A photoemission study of cluster growth and morphology on inert substrates

Journal of applied physics, 1991-12, Vol.70 (12), p.7333-7341

1991

Volltextzugriff (PDF)

Bonding and stability in narrow-gap ternary semiconductors for infrared applications

Journal of vacuum science & technology. A, Vacuum, surfaces, and films, 1986-07, Vol.4 (4), p.2010-2013

1986

Volltextzugriff (PDF)

Electronic structure of ternary semimagnetic semiconductors

Journal of vacuum science & technology. A, Vacuum, surfaces, and films, 1985-05, Vol.3 (3), p.926-929

1985

Volltextzugriff (PDF)

Overlayer-induced enhanced oxidation of GaAs surfaces

Journal of vacuum science & technology. A, Vacuum, surfaces, and films, 1986-05, Vol.4 (3), p.799-805

1986

Volltextzugriff (PDF)

A photoemission survey of the electronic properties of ternary semimagnetic semiconductor alloys

Journal of vacuum science & technology. A, Vacuum, surfaces, and films, 1987-07, Vol.5 (4), p.2051-2056

1987

Volltextzugriff (PDF)

Near-Field Optical Imaging of Electromigration Damages in Passivated Metal Stripes

MRS proceedings, 1999, Vol.571, Article 101

1999

Volltextzugriff (PDF)

Environmental and Mechanical Fatigue of Wind Turbine Blades Made of Composites Materials

Journal of reinforced plastics and composites, 1996-07, Vol.15 (7), p.673-691

1996

Volltextzugriff (PDF)

Synchrotron-radiation study of narrow-band-gap ternary semimagnetic semiconductors: Hg1-xMnxSe

Physical review. B, Condensed matter, 1985-06, Vol.31 (12), p.8061-8067

1985

Volltextzugriff (PDF)

Electrical characterization of the TiN/Ti/n(+)Si (and p (+)Si) interfaces by means of a circular resistor test structure

IEEE transactions on electron devices, 1991-08, Vol.38 (8), p.1964-1966

1991

Volltextzugriff (PDF)

Electrical characterization of the TiN/Ti/n/sup +/Si (and p/sup +/Si) interfaces by means of a circular resistor test structure

IEEE transactions on electron devices, 1991-08, Vol.38 (8), p.1964-1966

1991

Volltextzugriff (PDF)

Test structures for electromigration evaluation in submicron technology

Proceedings of International Conference on Microelectronic Test Structures, 1996, p.283-287

1996

Volltextzugriff (PDF)

Electrical characterization of the TiN/Ti/n super(+)Si (and p super(+)Si) interfaces by means of a circular resistor test structure

IEEE transactions on electron devices, 1991-01, Vol.38 (8), p.1964-1966

1991

Volltextzugriff (PDF)

Electrical characterization of the TiN/Ti/nSi (and p+Si) interfaces by means of a circular resistor test structure

IEEE transactions on electron devices, 1991-08, Vol.38 (8), p.1964-1966

1991

Volltextzugriff (PDF)

Nomen est omen: analyzing the language of function identifiers

Sixth Working Conference on Reverse Engineering (Cat. No.PR00303), 1999, p.112-122

1999

Volltextzugriff (PDF)

Ohmic contact electromigration

Microelectronics and reliability, 1992, Vol.32 (1), p.167-174

1992

Volltextzugriff (PDF)

1 – 25 von 91

Suche als RSS-Feed

Suchergebnisse filtern

Filter anzeigen

Nur zeigen

Geprüft (Peer-Review)
(73)
Mit Volltextzugriff
(54)

Publikationsform

Sprache

Erscheinungsjahr

n.n

Thema

15 weitere anzeigen...

Weniger anzeigen...

Neu hinzugefügt

... seit 90 Tagen
(1)

Menü

Weitere Dienste

Einstellungen

Pitch perception deficits in nonverbal learning disability

Discriminatory validity and association of the mini-mental test (MMSE) and the memory alteration test (M@T) with a neuropsychological battery in patients with amnestic mild cognitive impairment and Alzheimer's disease

Naming is associated with left temporal pole metabolite levels in neurodegenerative diseases

Posterior cortical atrophy. Its neuropsychological profile and differences from typical Alzheimer's disease

A specimen-current branching approach for FA of long Electromigration test lines

Validez discriminativa y asociación del test minimental (MMSE) y del test de alteración de memoria (T@M) con una batería neuropsicológica en pacientes con deterioro cognitivo leve amnésico y enfermedad de Alzheimer

Novel Electromigration Failure Mechanism for Aluminium-Based Metallization on Titanium Substrate

On the validity of the resistometric technique in electromigration studies of narrow stripes

Atrofia cortical posterior. Perfil neuropsicológico y diferencias con la enfermedad de Alzheimer típica

Microscopic control of semiconductor surface oxidation

A photoemission study of cluster growth and morphology on inert substrates

Bonding and stability in narrow-gap ternary semiconductors for infrared applications

Electronic structure of ternary semimagnetic semiconductors

Overlayer-induced enhanced oxidation of GaAs surfaces

A photoemission survey of the electronic properties of ternary semimagnetic semiconductor alloys

Near-Field Optical Imaging of Electromigration Damages in Passivated Metal Stripes

Environmental and Mechanical Fatigue of Wind Turbine Blades Made of Composites Materials

Synchrotron-radiation study of narrow-band-gap ternary semimagnetic semiconductors: Hg1-xMnxSe

Electrical characterization of the TiN/Ti/n(+)Si (and p (+)Si) interfaces by means of a circular resistor test structure

Electrical characterization of the TiN/Ti/n/sup +/Si (and p/sup +/Si) interfaces by means of a circular resistor test structure

Test structures for electromigration evaluation in submicron technology

Electrical characterization of the TiN/Ti/n super(+)Si (and p super(+)Si) interfaces by means of a circular resistor test structure

Electrical characterization of the TiN/Ti/nSi (and p+Si) interfaces by means of a circular resistor test structure

Nomen est omen: analyzing the language of function identifiers

Ohmic contact electromigration

Suchergebnisse filtern