UB Paderborn / Katalog / Suche / in CDI

Long-distance spin transport in a disordered magnetic insulator

Nature physics, 2017-07, Vol.13 (10), p.987-993

2017

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Elastic macro strain and stress determination by powder diffraction: spherical harmonics analysis starting from the Voigt model

Journal of applied crystallography, 2014-02, Vol.47 (1), p.154-159

2014

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Anomalous spin-orbit torques in magnetic single-layer films

Nature nanotechnology, 2019-09, Vol.14 (9), p.819-824

2019

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Structure and Electronic Transport Properties of Si-(B)-C-N Ceramics

Journal of the American Ceramic Society, 2001-10, Vol.84 (10), p.2260-2264

2001

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Coherency Strain and Dislocations in Copper-Rich-Precipitate Embrittled A710 Ferritic Steels

Metallurgical and materials transactions. A, Physical metallurgy and materials science, 2012-05, Vol.43 (5), p.1462-1467

Balzar, Davor

2012

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Coherency Strain and Dislocations in Copper-Rich-Precipitate Embrittled A710 Ferritic Steels : Neutron ond X-Ray Studies of advanced Materials IV

Metallurgical and materials transactions. A, Physical metallurgy and materials science, 2012, Vol.43 (5), p.1462-1467

BALZAR, Davor

2012

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Elastic Properties of Mullite

Journal of the American Ceramic Society, 1998-04, Vol.81 (4), p.1025-1028

1998

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Influence of Strains and Defects on Ferroelectric and Dielectric Properties of Thin-Film Barium–Strontium Titanates

Japanese Journal of Applied Physics, 2002-11, Vol.41 (Part 1, No. 11B), p.6628-6632

2002

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Elastic strain and stress determination by Rietveld refinement: generalized treatment for textured polycrystals for all Laue classes. Corrigenda

Journal of applied crystallography, 2012-08, Vol.45 (4), p.838-839

2012

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Internal stress storage in shape memory polymer nanocomposites

Applied physics letters, 2004-07, Vol.85 (2), p.290-292

2004

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Structural analysis of amorphous-nanocrystalline silicon thin films by grazing incidence X-ray diffraction

Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 2012-08, Vol.284, p.78-82

2012

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Keynote Lecture: Residual Stress Gradient Analysis by Multiple Diffraction Line Methods

Materials science forum, 2013-09, Vol.768-769, p.3-18

2013

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Residual Strain Tensor Determination from the Refinement of Multiple Diffraction Patterns

AIP conference proceedings, 2012-03

2012

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Voigt-function modeling in Fourier analysis of size- and strain-broadened X-ray diffraction peaks

Journal of applied crystallography, 1993-02, Vol.26 (1), p.97-103

1993

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Profile fitting of X-ray diffraction lines and Fourier analysis of broadening

Journal of applied crystallography, 1992-10, Vol.25 (5), p.559-570

Balzar, D.

1992

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X-ray Line Profile Analysis of Nanoparticles in Proton Exchange Membrane Fuel Cell Electrodes

Journal of physical chemistry. C, 2007-07, Vol.111 (26), p.9583-9591

2007

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X-ray diffraction line broadening: modeling and applications to high-Tc superconductors

Journal of research of the National Institute of Standards and Technology, 1993-05, Vol.98 (3), p.321-353

BALZAR, D

1993

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Reliability of the Simplified Integral-Breadth Methods in Diffraction Line-Broadening Analysis

Journal of applied crystallography, 1996-02, Vol.29 (1), p.16-23

1996

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Microstructure-Controlled Multilayer PZT Actuators: Effects of Cyclic Actuation on Crystallographic Structure

MRS proceedings, 2005, Vol.888, Article 0888-V08-03

2005

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Crystal structure and compressibility of 3:2 mullite

The American mineralogist, 1993-12, Vol.78 (11-12), p.1192-1196

1993

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X-Ray Diffraction Line Broadening: Modeling and Applications to High-T c Superconductors

Journal of research of the National Institute of Standards and Technology, 1993-05, Vol.98 (3), p.321

Balzar, Davor

1993

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Dislocation Generation in Si: A Thermo-Mechanical Model Based on Measurable Parameters

2006 IEEE 4th World Conference on Photovoltaic Energy Conference, 2006, Vol.1, p.936-939

2006

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IEEE_Xplore

Elastic-strain tensor by Rietveld refinement of diffraction measurements

Journal of applied physics, 1998-11, Vol.84 (9), p.4822-4833

1998

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Structure and electronic transport properties of Si-(B)-C-N ceramics : Ultrahigh-Temperature Ceramics

Journal of the American Ceramic Society, 2001, Vol.84 (10), p.2260-2264

2001

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Sequence detection and comparative analysis of the HV1 and HV2 control regions of human mitochondrial DNA by Denaturing High-Performance Liquid Chromatography

Lewis, Sarah E

2011

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ProQuest

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Einstellungen

Long-distance spin transport in a disordered magnetic insulator

Elastic macro strain and stress determination by powder diffraction: spherical harmonics analysis starting from the Voigt model

Anomalous spin-orbit torques in magnetic single-layer films

Structure and Electronic Transport Properties of Si-(B)-C-N Ceramics

Coherency Strain and Dislocations in Copper-Rich-Precipitate Embrittled A710 Ferritic Steels

Coherency Strain and Dislocations in Copper-Rich-Precipitate Embrittled A710 Ferritic Steels : Neutron ond X-Ray Studies of advanced Materials IV

Elastic Properties of Mullite

Influence of Strains and Defects on Ferroelectric and Dielectric Properties of Thin-Film Barium–Strontium Titanates

Elastic strain and stress determination by Rietveld refinement: generalized treatment for textured polycrystals for all Laue classes. Corrigenda

Internal stress storage in shape memory polymer nanocomposites

Structural analysis of amorphous-nanocrystalline silicon thin films by grazing incidence X-ray diffraction

Keynote Lecture: Residual Stress Gradient Analysis by Multiple Diffraction Line Methods

Residual Strain Tensor Determination from the Refinement of Multiple Diffraction Patterns

Voigt-function modeling in Fourier analysis of size- and strain-broadened X-ray diffraction peaks

Profile fitting of X-ray diffraction lines and Fourier analysis of broadening

X-ray Line Profile Analysis of Nanoparticles in Proton Exchange Membrane Fuel Cell Electrodes

X-ray diffraction line broadening: modeling and applications to high-Tc superconductors

Reliability of the Simplified Integral-Breadth Methods in Diffraction Line-Broadening Analysis

Microstructure-Controlled Multilayer PZT Actuators: Effects of Cyclic Actuation on Crystallographic Structure

Crystal structure and compressibility of 3:2 mullite

X-Ray Diffraction Line Broadening: Modeling and Applications to High-T c Superconductors

Dislocation Generation in Si: A Thermo-Mechanical Model Based on Measurable Parameters

Elastic-strain tensor by Rietveld refinement of diffraction measurements

Structure and electronic transport properties of Si-(B)-C-N ceramics : Ultrahigh-Temperature Ceramics

Sequence detection and comparative analysis of the HV1 and HV2 control regions of human mitochondrial DNA by Denaturing High-Performance Liquid Chromatography

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