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IEEE transactions on electron devices, 2021-09, Vol.68 (9), p.4598-4605
2021
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IEEE transactions on electron devices, 2021-09, Vol.68 (9), p.4606-4613
2021
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Journal of applied physics, 2007-06, Vol.101 (11), p.114513-114513-6
2007
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Solid-state electronics, 2013-12, Vol.90, p.127-133
2013
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Solid-state electronics, 2009-08, Vol.53 (8), p.850-857
2009
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Solid-state electronics, 2011-03, Vol.57 (1), p.83-86
2011
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Electronics letters, 2006-03, Vol.42 (7), p.415-417
2006
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Microelectronic engineering, 2011-07, Vol.88 (7), p.1283-1285
2011
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Applied physics letters, 2004-02, Vol.84 (7), p.1192-1194
2004
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Applied physics letters, 2008-07, Vol.93 (2), p.22109
2008
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Solid-state electronics, 2022-08, Vol.194, p.108301, Article 108301
2022
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2013 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S), 2013, p.1-2
2013
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2023 IEEE International Symposium on Applications of Ferroelectrics (ISAF), 2023, p.1-4
2023
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MRS proceedings, 2004, Vol.809, Article B4.4
2004
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Solid-state electronics, 2023-07, Vol.205, p.108656, Article 108656
2023
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Solid-state electronics, 2016-03, Vol.117, p.1-1
2016
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2013 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S), 2013, p.1-2
- Khakifirooz, A.
- Sreenivasan, R.
- Taber, B. N.
- Allibert, F.
- Hashemi, P.
- Chern, W.
- Xu, N.
- Wall, E. C.
- Mochizuki, S.
- Li, J.
- Yin, Y.
- Loubet, N.
- Reznicek, A.
- Mignot, S. M.
- Lu, D.
- He, H.
- Yamashita, T.
- Morin, P.
- Tsutsui, G.
- Chen, C-Y
- Basker, V. S.
- Standaert, T. E.
- Cheng, K.
- Levin, T.
- Nguyen, B. Y.
- Liu, T-S King
- Guo, D.
- Bu, H.
- Rim, K.
- Doris, B.
2013
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2024 IEEE/MTT-S International Microwave Symposium - IMS 2024, 2024, p.944-947
2024
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Materials science forum, 2022-05, Vol.1062, p.131-135
- Rouchier, Séverin
- Drouin, Alexis
- Bouville-Lallart, Adeline
- Vladimirova, Kremena
- Troutot, Nicolas
- Schwarzenbach, Walter
- Lavaitte, Guillaume
- Thomas, Shawn
- Servant, Florence
- Gaudin, Gweltaz
- Bosch, Daphnée
- Rolland, Emmanuel
- Cela, Enrica
- Widiez, Julie
- Gelineau, Guillaume
- Bethoux, Jean Marc
- Chapelle, Audrey
- Maleville, Christophe
- Leow, Yen Lin
- Allibert, Frédéric
- Boulet, Romain
- Berre, Guillaume
- Duboust, Alain
- Bhargava, Shivan
- Viravaux, Laurent
- Navone, Christelle
- Radu, Ionut
2022
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2013 IEEE International Electron Devices Meeting, 2013, p.9.2.1-9.2.4
- Liu, Q.
- Vinet, M.
- Gimbert, J.
- Loubet, N.
- Wacquez, R.
- Grenouillet, L.
- Le Tiec, Y.
- Khakifirooz, A.
- Nagumo, T.
- Cheng, K.
- Kothari, H.
- Chanemougame, D.
- Chafik, F.
- Guillaumet, S.
- Kuss, J.
- Allibert, F.
- Tsutsui, G.
- Li, J.
- Morin, P.
- Mehta, S.
- Johnson, R.
- Edge, L. F.
- Ponoth, S.
- Levin, T.
- Kanakasabapathy, S.
- Haran, B.
- Bu, H.
- Bataillon, J.-L
- Weber, O.
- Faynot, O.
- Josse, E.
- Haond, M.
- Kleemeier, W.
- Khare, M.
- Skotnicki, T.
- Luning, S.
- Doris, B.
- Celik, M.
- Sampson, R.
2013
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Microelectronic engineering, 2005-06, Vol.80, p.241-244
2005
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2022 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA), 2022, p.1-2
2022
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CAS 2010 Proceedings (International Semiconductor Conference), 2010, Vol.1, p.45-51
2010
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2022 6th IEEE Electron Devices Technology & Manufacturing Conference (EDTM), 2022, p.85-87
- Daval, N.
- Drouin, A.
- Biard, H.
- Viravaux, L.
- Radisson, D.
- Rouchier, S.
- Gaudin, G.
- Widiez, J.
- Allibert, F.
- Rolland, E.
- Vladimirova, K.
- Gelineau, G.
- Troutot, N.
- Navone, C.
- Berre, G.
- Bosch, D.
- Leow, Y.L
- Duboust, A.
- Bethoux, J-M.
- Boulet, R.
- Chapelle, A.
- Cela, E.
- Lavaitte, G.
- Bouville-Lallart, A.
- Bhargava, S.
- Schwarzenbach, W.
- Maddalon, C.
- Radu, I.
- Odoul, S.
- Delprat, D.
- Bonnin, O.
- Maleville, C.
2022
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2017 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S), 2017, p.1-3
2017
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