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IEEE transactions on electron devices, 2006-12, Vol.53 (12), p.2932-2941
2006
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Microelectronics and reliability, 2021-11, Vol.126, p.114259, Article 114259
2021
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Microelectronic engineering, 2013-09, Vol.109, p.257-261
2013
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Microelectronics and reliability, 2019-09, Vol.100-101, p.113489, Article 113489
2019
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Microelectronics and reliability, 2023-11, Vol.150, p.115131, Article 115131
2023
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Microelectronics and reliability, 2020-11, Vol.114, p.113905, Article 113905
2020
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Microelectronics and reliability, 2019-09, Vol.100-101, p.113388, Article 113388
2019
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Microelectronics and reliability, 2022-11, Vol.138, p.114620, Article 114620
2022
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2022 IEEE International Reliability Physics Symposium (IRPS), 2022, p.11B.4-1-11B.4-6
2022
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Microelectronics and reliability, 2022-11, Vol.138, p.114735, Article 114735
2022
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2022 IEEE International Reliability Physics Symposium (IRPS), 2022, p.P51-1-P51-6
2022
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Microelectronics and reliability, 2014-09, Vol.54 (9-10), p.2213-2216
2014
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Microelectronics and reliability, 2014-09, Vol.54 (9-10), p.2237-2241
2014
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Applied physics letters, 2005-06, Vol.86 (25)
2005
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Microelectronics and reliability, 2012-09, Vol.52 (9-10), p.2426-2430
2012
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Microelectronics and reliability, 2013-09, Vol.53 (9-11), p.1476-1480
2013
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2021 IEEE International Reliability Physics Symposium (IRPS), 2021, p.1-2
2021
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Microelectronics and reliability, 2015-08, Vol.55 (9-10), p.1662-1666
2015
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Solid-state electronics, 2015-11, Vol.113, p.15-21
2015
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Microelectronics and reliability, 2014-09, Vol.54 (9-10), p.2248-2252
2014
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Microelectronics and reliability, 2006-09, Vol.46 (9), p.1750-1753
2006
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Physical review. B, Condensed matter, 2003-12, Vol.68 (22), Article 224113
2003
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Journal of low temperature physics, 2014, Vol.176 (5-6), p.986-994
- Canonica, L.
- Artusa, D. R.
- Avignone, F. T.
- Azzolini, O.
- Banks, T. I.
- Bari, G.
- Beeman, J.
- Bellini, F.
- Bersani, A.
- Bloxham, T.
- Brofferio, C.
- Bucci, C.
- Cai, X. Z.
- Camacho, A.
- Cao, X.
- Carbone, L.
- Cardani, L.
- Carrettoni, M.
- Casali, N.
- Chiesa, D.
- Chott, N.
- Clemenza, M.
- Cosmelli, C.
- Creswick, R. J.
- Dafinei, I.
- De Biasi, A.
- Deninno, M. M.
- Di Domizio, S.
- di Vacri, M. L.
- Ejzak, L.
- Fang, D. Q.
- Faverzani, M.
- Fernandes, G.
- Ferri, E.
- Ferroni, F.
- Fiorini, E.
- Franceschi, M. A.
- Freedman, S. J.
- Fujikawa, B. K.
- Giachero, A.
- Gironi, L.
- Goett, J.
- Gorla, P.
- Gotti, C.
- Gutierrez, T. D.
- Haller, E. E.
- Heeger, K. M.
- Huang, H. Z.
- Kadel, R.
- Keppel, G.
- Kogler, L.
- Kolomensky, Yu. G.
- Li, Y. L.
- Ligi, C.
- Ma, Y. G.
- Maiano, C.
- Maino, M.
- Martinez, M.
- Maruyama, R. H.
- Mei, Y.
- Moggi, N.
- Morganti, S.
- Napolitano, T.
- Newman, S.
- Nisi, S.
- Norman, E. B.
- O’Donnell, T.
- Orio, F.
- Orlandi, D.
- Ouellet, J. L.
- Pallavicini, M.
- Palmieri, V.
- Pattavina, L.
- Pavan, M.
- Pedretti, M.
- Piperno, G.
- Pira, C.
- Rampazzo, V.
- Rimondi, F.
- Rusconi, C.
- Sala, E.
- Sangiorgio, S.
- Scielzo, N. D.
- Sisti, M.
- Taffarello, L.
- Tenconi, M.
- Terranova, F.
- Tian, W. D.
- Tomei, C.
- Ventura, G.
- Vignati, M.
- Wang, B. S.
- Wang, H. W.
- Wielgus, L.
- Wilson, J.
- Wise, T.
- Woodcraft, A.
- Zanotti, L.
- Zarra, C.
- Zucchelli, S.
2014
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2013 IEEE International Reliability Physics Symposium (IRPS), 2013, p.3C.1.1-3C.1.7
2013
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EPJ Web of Conferences, 2015-01, Vol.95, p.4024-1-04024-9
- Giachero, A.
- Avignone, F. T.
- Azzolini, O.
- Balata, M.
- Bari, G.
- Bellini, F.
- Biassoni, M.
- Brofferio, C.
- Bucci, C.
- Camacho, A.
- Caminata, A.
- Canonica, L.
- Cao, X. G.
- Capelli, S.
- Cappelli, L.
- Carbone, L.
- Casali, N.
- Chiesa, D.
- Chott, N.
- Clemenza, M.
- Copello, S.
- Cosmelli, C.
- Cremonesi, O.
- Creswick, R.J.
- Cushman, J.S.
- Dafinei, I.
- Dell’Oro, S.
- Di Domizio, S.
- di Vacri, M. L.
- Drobizhev, A.
- Fang, D. Q.
- Farach, H. A.
- Ferri, E.
- Ferroni, F.
- Fiorini, E.
- Giuliani, A.
- Gorla, P.
- Gotti, C.
- Han, K.
- Heeger, K. M.
- Hennings-Yeomans, R.
- Hickerson, K. P.
- Huang, H. Z.
- Kadel, R.
- Kazkaz, K.
- Keppel, G.
- Ligi, C.
- Liu, X.
- Ma, Y. G.
- Maiano, C.
- Maino, M.
- Martinez, M.
- Maruyama, R. H.
- Mei, Y.
- Moggi, N.
- Morganti, S.
- Napolitano, T.
- Nastasi, M.
- Nisi, S.
- Nones, C.
- Norman, E. B.
- Nucciotti, A.
- O’Donnell, T.
- Orio, F.
- Orlandi, D.
- Pagliarone, C. E.
- Pallavicini, M.
- Pattavina, L.
- Pavan, M.
- Pedretti, M.
- Pessina, G.
- Piperno, G.
- Pira, C.
- Pirro, S.
- Pozzi, S.
- Previtali, E.
- Rampazzo, V.
- Rosenfeld, C.
- Rusconi, C.
- Sala, E.
- Sangiorgio, S.
- Scielzo, N. D.
- Sisti, M.
- Taffarello, L.
- Tenconi, M.
- Terranova, F.
- Tian, W. D.
- Trentalange, S.
- Ventura, G.
- Vignati, M.
- Wang, B. S.
- Wang, H. W.
- Wielgus, L.
- Winslow, L. A.
- Wise, T.
- Woodcraft, A.
- Zanotti, L.
- Zarra, C.
- Zhang, G. Q.
- Zucchelli, S.
- Foka, Y.
- Kabana, S.
- Bravina, L.
2015
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