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Design and Performance of the ARIANNA HRA-3 Neutrino Detector Systems

IEEE transactions on nuclear science, 2015-10, Vol.62 (5), p.2202-2215

2015

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Electron-Induced Single-Event Upsets in Static Random Access Memory

IEEE transactions on nuclear science, 2013-12, Vol.60 (6), p.4122-4129

2013

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Fast Neutron Irradiation of a Multichannel JFET-Based Optical Encoder

IEEE transactions on nuclear science, 2024-06, Vol.71 (6), p.1292-1299

2024

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Impact of Low-Energy Proton Induced Upsets on Test Methods and Rate Predictions

IEEE transactions on nuclear science, 2009-12, Vol.56 (6), p.3085-3092

2009

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The ECAT HRRT: performance and first clinical application of the new high resolution research tomograph

IEEE transactions on nuclear science, 2002-02, Vol.49 (1), p.104-110

2002

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Impact of Technology Scaling on SRAM Soft Error Rates

IEEE transactions on nuclear science, 2014-12, Vol.61 (6), p.3512-3518

2014

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Radiation Effects in Advanced Multiple Gate and Silicon-on-Insulator Transistors

IEEE transactions on nuclear science, 2013-06, Vol.60 (3), p.1970-1991

2013

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The contribution of nuclear reactions to heavy ion single event upset cross-section measurements in a high-density SEU hardened SRAM

IEEE transactions on nuclear science, 2005-12, Vol.52 (6), p.2125-2131

2005

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The Impact of Delta-Rays on Single-Event Upsets in Highly Scaled SOI SRAMs

IEEE transactions on nuclear science, 2010-12, Vol.57 (6), p.3169-3175

2010

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Effectiveness of SEL Hardening Strategies and the Latchup Domino Effect

IEEE transactions on nuclear science, 2012-12, Vol.59 (6), p.2642-2650

2012

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Single Particle Displacement Damage in Silicon

IEEE transactions on nuclear science, 2012-12, Vol.59 (6), p.3054-3061

2012

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Observation of Low-Energy Proton Direct Ionization in a 72-Layer 3-D NAND Flash Memory

IEEE transactions on nuclear science, 2021-05, Vol.68 (5), p.835-841

2021

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Laser- and Heavy Ion-Induced Charge Collection in Bulk FinFETs

IEEE transactions on nuclear science, 2011-12, Vol.58 (6), p.2563-2569

2011

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Incremental Enhancement of SEU Hardened 90 nm CMOS Memory Cell

IEEE transactions on nuclear science, 2011-06, Vol.58 (3), p.975-980

2011

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Anthology of the Development of Radiation Transport Tools as Applied to Single Event Effects

IEEE transactions on nuclear science, 2013-06, Vol.60 (3), p.1876-1911

2013

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Two-Photon Absorption Induced Single-Event Effects: Correlation Between Experiment and Simulation

IEEE transactions on nuclear science, 2015-12, Vol.62 (6), p.2867-2873

2015

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A Probabilistic Analysis Technique Applied to a Radiation-Hardened-by-Design Voltage-Controlled Oscillator for Mixed-Signal Phase-Locked Loops

IEEE transactions on nuclear science, 2008-12, Vol.55 (6), p.3447-3455

2008

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Geometry Dependence of Total-Dose Effects in Bulk FinFETs

IEEE transactions on nuclear science, 2014-12, Vol.61 (6), p.2951-2958

2014

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Low-Energy X-ray and Ozone-Exposure Induced Defect Formation in Graphene Materials and Devices

IEEE transactions on nuclear science, 2011-12, Vol.58 (6), p.2961-2967

2011

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Methodology for Identifying Radiation Effects in Robotic Systems With Mechanical and Control Performance Variations

IEEE transactions on nuclear science, 2019-01, Vol.66 (1), p.184-189

2019

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Strong Correlation Between Experiment and Simulation for Two-Photon Absorption Induced Carrier Generation

IEEE transactions on nuclear science, 2017-05, Vol.64 (5), p.1133-1136

2017

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Muon-Induced Single Event Upsets in Deep-Submicron Technology

IEEE transactions on nuclear science, 2010-12, Vol.57 (6), p.3273-3278

2010

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X-Ray and Proton Radiation Effects on 40 nm CMOS Physically Unclonable Function Devices

IEEE transactions on nuclear science, 2018-08, Vol.65 (8), p.1519-1524

2018

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The Effects of Neutron Energy and High-Z Materials on Single Event Upsets and Multiple Cell Upsets

IEEE transactions on nuclear science, 2011-12, Vol.58 (6), p.2591-2598

2011

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Device-Orientation Effects on Multiple-Bit Upset in 65 nm SRAMs

IEEE transactions on nuclear science, 2008-12, Vol.55 (6), p.2880-2885

2008

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Design and Performance of the ARIANNA HRA-3 Neutrino Detector Systems

Electron-Induced Single-Event Upsets in Static Random Access Memory

Fast Neutron Irradiation of a Multichannel JFET-Based Optical Encoder

Impact of Low-Energy Proton Induced Upsets on Test Methods and Rate Predictions

The ECAT HRRT: performance and first clinical application of the new high resolution research tomograph

Impact of Technology Scaling on SRAM Soft Error Rates

Radiation Effects in Advanced Multiple Gate and Silicon-on-Insulator Transistors

The contribution of nuclear reactions to heavy ion single event upset cross-section measurements in a high-density SEU hardened SRAM

The Impact of Delta-Rays on Single-Event Upsets in Highly Scaled SOI SRAMs

Effectiveness of SEL Hardening Strategies and the Latchup Domino Effect

Single Particle Displacement Damage in Silicon

Observation of Low-Energy Proton Direct Ionization in a 72-Layer 3-D NAND Flash Memory

Laser- and Heavy Ion-Induced Charge Collection in Bulk FinFETs

Incremental Enhancement of SEU Hardened 90 nm CMOS Memory Cell

Anthology of the Development of Radiation Transport Tools as Applied to Single Event Effects

Two-Photon Absorption Induced Single-Event Effects: Correlation Between Experiment and Simulation

A Probabilistic Analysis Technique Applied to a Radiation-Hardened-by-Design Voltage-Controlled Oscillator for Mixed-Signal Phase-Locked Loops

Geometry Dependence of Total-Dose Effects in Bulk FinFETs

Low-Energy X-ray and Ozone-Exposure Induced Defect Formation in Graphene Materials and Devices

Methodology for Identifying Radiation Effects in Robotic Systems With Mechanical and Control Performance Variations

Strong Correlation Between Experiment and Simulation for Two-Photon Absorption Induced Carrier Generation

Muon-Induced Single Event Upsets in Deep-Submicron Technology

X-Ray and Proton Radiation Effects on 40 nm CMOS Physically Unclonable Function Devices

The Effects of Neutron Energy and High-Z Materials on Single Event Upsets and Multiple Cell Upsets

Device-Orientation Effects on Multiple-Bit Upset in 65 nm SRAMs

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