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Electron reflectometry for measuring nanostructures on opaque substrates

Applied physics letters, 2019-07, Vol.115 (2)

2019

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Reflective small angle electron scattering to characterize nanostructures on opaque substrates

Applied physics letters, 2017-09, Vol.111 (12)

2017

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Multiphase contrast-enhanced computed tomography imaging features of salivary duct carcinoma: differentiation from other salivary gland malignancies

Oral surgery, oral medicine, oral pathology and oral radiology, 2019-11, Vol.128 (5), p.543-551

2019

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Small angle x-ray scattering for sub-100 nm pattern characterization

Applied physics letters, 2003-11, Vol.83 (19), p.4059-4061

2003

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Direct Measurement of the Reaction Front in Chemically Amplified Photoresists

Science (American Association for the Advancement of Science), 2002-07, Vol.297 (5580), p.372-375

2002

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Small angle x-ray scattering measurements of lithographic patterns with sidewall roughness from vertical standing waves

Applied physics letters, 2007-05, Vol.90 (19)

2007

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Are Left Ventricular Diastolic Function and Diastolic Asynchrony Important Determinants of Response to Cardiac Resynchronization Therapy?

The American journal of cardiology, 2006-10, Vol.98 (8), p.1083-1087

2006

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Effect of strongly favorable substrate interactions on the thermal properties of ultrathin polymer films

Physical review. E, Statistical physics, plasmas, fluids, and related interdisciplinary topics, 1996-03, Vol.53 (3), p.R2053-R2056

1996

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Observation of temperature dependent thicknesses in ultrathin polystyrene films on silicon

Physical review letters, 1993-08, Vol.71 (6), p.867-870

1993

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Lateral length scales of latent image roughness as determined by off-specular neutron reflectivity

Applied physics letters, 2008-02, Vol.92 (6)

2008

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Nanoimprint pattern transfer quality from specular x-ray reflectivity

Applied physics letters, 2005-12, Vol.87 (26), p.263111-263111-3

2005

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Nonuniform structural degradation in porous organosilicate films exposed to plasma, etching, and ashing as characterized by x-ray porosimetry

Applied physics letters, 2007-10, Vol.91 (17), p.172908-172908-3

2007

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Characterization of chemical-vapor-deposited low- k thin films using x-ray porosimetry

Applied physics letters, 2003-02, Vol.82 (7), p.1084-1086

2003

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A Laboratory Scale Critical-Dimension Small-Angle X-ray Scattering Instrument

AIP conference proceedings, 2007, Vol.931 (1), p.382-386

2007

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Thin film confinement effects on the thermal properties of model photoresist polymers

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 2001-11, Vol.19 (6), p.2690-2693

2001

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Structural characterization of a porous low-dielectric-constant thin film with a non-uniform depth profile

Applied physics letters, 2002-07, Vol.81 (4), p.607-609

2002

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Off-Specular X-ray and Neutron Reflectometry for the Structural Characterization of Buried Interfaces

AIP conference proceedings, 2007, Vol.931 (1), p.185-190

2007

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X-ray Reflectivity Measurements of Nanoscale Structures: Limits of the Effective Medium Approximation

AIP conference proceedings, 2007, Vol.931 (1), p.209-215

2007

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Line Edge Roughness and Cross Sectional Characterization of Sub-50 nm Structures Using Critical Dimension Small Angle X-ray Scattering

AIP conference proceedings, 2007, Vol.931 (1), p.402-406

2007

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The impact of intratumoral metabolic heterogeneity on postoperative recurrence and survival in resectable esophageal squamous cell carcinoma

The Journal of nuclear medicine (1978), 2017-05, Vol.58, p.1043

2017

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Effect of initial resist thickness on residual layer thickness of nanoimprinted structures

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 2005-11, Vol.23 (6), p.3023-3027

2005

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Probing surface and bulk chemistry in resist films using near edge x-ray absorption fine structure

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 2002-11, Vol.20 (6), p.2920-2926

2002

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Effect of Age and Heart Rate on Atrial Mechanical Function Assessed by Doppler Tissue Imaging in Healthy Individuals

Journal of the American Society of Echocardiography, 2006-04, Vol.19 (4), p.422-428

2006

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Small angle x-ray scattering measurements of lithographic patternswith sidewall roughness from vertical standing waves

Applied physics letters, 2007-05, Vol.90 (19), p.193122-193122-3

2007

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Lateral length scales of latent image roughness as determinedby off-specular neutron reflectivity

Applied physics letters, 2008-02, Vol.92 (6), p.064106-064106-3

2008

Volltextzugriff (PDF)

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Electron reflectometry for measuring nanostructures on opaque substrates

Reflective small angle electron scattering to characterize nanostructures on opaque substrates

Multiphase contrast-enhanced computed tomography imaging features of salivary duct carcinoma: differentiation from other salivary gland malignancies

Small angle x-ray scattering for sub-100 nm pattern characterization

Direct Measurement of the Reaction Front in Chemically Amplified Photoresists

Small angle x-ray scattering measurements of lithographic patterns with sidewall roughness from vertical standing waves

Are Left Ventricular Diastolic Function and Diastolic Asynchrony Important Determinants of Response to Cardiac Resynchronization Therapy?

Effect of strongly favorable substrate interactions on the thermal properties of ultrathin polymer films

Observation of temperature dependent thicknesses in ultrathin polystyrene films on silicon

Lateral length scales of latent image roughness as determined by off-specular neutron reflectivity

Nanoimprint pattern transfer quality from specular x-ray reflectivity

Nonuniform structural degradation in porous organosilicate films exposed to plasma, etching, and ashing as characterized by x-ray porosimetry

Characterization of chemical-vapor-deposited low- k thin films using x-ray porosimetry

A Laboratory Scale Critical-Dimension Small-Angle X-ray Scattering Instrument

Thin film confinement effects on the thermal properties of model photoresist polymers

Structural characterization of a porous low-dielectric-constant thin film with a non-uniform depth profile

Off-Specular X-ray and Neutron Reflectometry for the Structural Characterization of Buried Interfaces

X-ray Reflectivity Measurements of Nanoscale Structures: Limits of the Effective Medium Approximation

Line Edge Roughness and Cross Sectional Characterization of Sub-50 nm Structures Using Critical Dimension Small Angle X-ray Scattering

The impact of intratumoral metabolic heterogeneity on postoperative recurrence and survival in resectable esophageal squamous cell carcinoma

Effect of initial resist thickness on residual layer thickness of nanoimprinted structures

Probing surface and bulk chemistry in resist films using near edge x-ray absorption fine structure

Effect of Age and Heart Rate on Atrial Mechanical Function Assessed by Doppler Tissue Imaging in Healthy Individuals

Small angle x-ray scattering measurements of lithographic patternswith sidewall roughness from vertical standing waves

Lateral length scales of latent image roughness as determinedby off-specular neutron reflectivity

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