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Laboratory-based micro-X-ray fluorescence setup using a von Hamos crystal spectrometer and a focused beam X-ray tube

Review of scientific instruments, 2014-04, Vol.85 (4), p.043101

2014

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X-ray nano-diffraction study of Sr intermetallic phase during solidification of Al-Si hypoeutectic alloy

Applied physics letters, 2014-02, Vol.104 (7)

2014

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Scanning-free grazing emission x-ray fluorescence by means of an angular dispersive arrangement with a two-dimensional position-sensitive area detector

Review of scientific instruments, 2013-12, Vol.84 (12), p.123102-123102

2013

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A dedicated superbend x-ray microdiffraction beamline for materials, geo-, and environmental sciences at the advanced light source

Review of scientific instruments, 2009-03, Vol.80

2009

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Mixing entropy and enthalpy effects on europium ions in Eu-doped BaAl2O4

Applied physics letters, 2024-02, Vol.124 (9)

2024

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Combining molecular dynamics simulations and x-ray scattering techniques for the accurate treatment of protonation degree and packing of ionizable lipids in monolayers

The Journal of chemical physics, 2023-10, Vol.159 (15)

2023

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Interface smoothing in short-period W/B4C multilayers using neon ion beam polishing

Journal of applied physics, 2023-12, Vol.134 (24)

2023

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A new μ-high energy resolution fluorescence detection microprobe imaging spectrometer at the Stanford Synchrotron Radiation Lightsource beamline 6-2

Review of scientific instruments, 2022-08, Vol.93 (8), p.083101

2022

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Characterization of a system that combines energy dispersive X-ray diffraction with X-ray fluorescence and its potential applications in archeometry

Journal of applied physics, 2019-07, Vol.126 (4)

2019

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High temperature GaAs X-ray detectors

Journal of applied physics, 2017-12, Vol.122 (24)

2017

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BAMline—A real-life sample materials research beamline

The Journal of chemical physics, 2023-06, Vol.158 (24)

2023

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On the Sn loss from thin films of the material system Cu-Zn-Sn-S in high vacuum

Journal of applied physics, 2010-01, Vol.107 (1), p.013516-013516-6

2010

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Energy dispersive x-ray diffraction of luminescent powders: A complement to visible phosphor thermometry

Journal of applied physics, 2022-08, Vol.132 (6)

2022

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Energy dispersive x-ray diffraction of luminescent powders: A complement to visible phosphor thermometry

Journal of applied physics, 2022-08, Vol.132 (6)

2022

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Significant displacement of calcium and barium ions in ferroelectric (Ba0.9Ca0.1)TiO3 revealed by x-ray fluorescence holography

Applied physics letters, 2022-01, Vol.120 (5)

2022

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Growth and optical performance of short-period W/Al and polished W/Si/Al/Si multilayers

Journal of applied physics, 2023-10, Vol.134 (15)

2023

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Energy response characterization of InGaP X-ray detectors

Journal of applied physics, 2018-11, Vol.124 (19)

2018

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Anisotropic strain variations during the confined growth of Au nanowires

Applied physics letters, 2023-03, Vol.122 (12)

2023

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Large As sublattice distortion in sphalerite ZnSnAs2 thin films revealed by x-ray fluorescence holography

Journal of applied physics, 2016-03, Vol.119 (12)

2016

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EPR investigation of point defects in HfB2 and their roles in supercapacitor device performances

Applied physics letters, 2022-04, Vol.120 (15)

2022

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X-ray induced electron and ion fragmentation dynamics in IBr

The Journal of chemical physics, 2023-04, Vol.158 (13)

2023

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The INE-Beamline for actinide science at ANKA

Review of scientific instruments, 2012-04, Vol.83 (4), p.043105-043105-13

2012

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A novel instrument for quantitative nanoanalytics involving complementary X-ray methodologies

Review of scientific instruments, 2013-04, Vol.84 (4), p.045106-045106

2013

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A dedicated superbend x-ray microdiffraction beamline for materials,geo-, and environmental sciences at the advanced light source

Review of scientific instruments, 2009-03, Vol.80 (3), p.035108-035108-10

2009

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Artifact mitigation of ptychography integrated with on-the-fly scanning probe microscopy

Applied physics letters, 2017-07, Vol.111 (2)

2017

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Laboratory-based micro-X-ray fluorescence setup using a von Hamos crystal spectrometer and a focused beam X-ray tube

X-ray nano-diffraction study of Sr intermetallic phase during solidification of Al-Si hypoeutectic alloy

Scanning-free grazing emission x-ray fluorescence by means of an angular dispersive arrangement with a two-dimensional position-sensitive area detector

A dedicated superbend x-ray microdiffraction beamline for materials, geo-, and environmental sciences at the advanced light source

Mixing entropy and enthalpy effects on europium ions in Eu-doped BaAl2O4

Combining molecular dynamics simulations and x-ray scattering techniques for the accurate treatment of protonation degree and packing of ionizable lipids in monolayers

Interface smoothing in short-period W/B4C multilayers using neon ion beam polishing

A new μ-high energy resolution fluorescence detection microprobe imaging spectrometer at the Stanford Synchrotron Radiation Lightsource beamline 6-2

Characterization of a system that combines energy dispersive X-ray diffraction with X-ray fluorescence and its potential applications in archeometry

High temperature GaAs X-ray detectors

BAMline—A real-life sample materials research beamline

On the Sn loss from thin films of the material system Cu-Zn-Sn-S in high vacuum

Energy dispersive x-ray diffraction of luminescent powders: A complement to visible phosphor thermometry

Energy dispersive x-ray diffraction of luminescent powders: A complement to visible phosphor thermometry

Significant displacement of calcium and barium ions in ferroelectric (Ba0.9Ca0.1)TiO3 revealed by x-ray fluorescence holography

Growth and optical performance of short-period W/Al and polished W/Si/Al/Si multilayers

Energy response characterization of InGaP X-ray detectors

Anisotropic strain variations during the confined growth of Au nanowires

Large As sublattice distortion in sphalerite ZnSnAs2 thin films revealed by x-ray fluorescence holography

EPR investigation of point defects in HfB2 and their roles in supercapacitor device performances

X-ray induced electron and ion fragmentation dynamics in IBr

The INE-Beamline for actinide science at ANKA

A novel instrument for quantitative nanoanalytics involving complementary X-ray methodologies

A dedicated superbend x-ray microdiffraction beamline for materials,geo-, and environmental sciences at the advanced light source

Artifact mitigation of ptychography integrated with on-the-fly scanning probe microscopy

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