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SF3B1 mutations in primary myelofibrosis: clinical, histopathology and genetic correlates among 155 patients

Leukemia, 2012-05, Vol.26 (5), p.1135-1137

2012

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Targetable fusions of the FRK tyrosine kinase in ALK-negative anaplastic large cell lymphoma

Leukemia, 2018-02, Vol.32 (2), p.565-569

2018

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Direct measurement of transient pulses induced by laser and heavy ion irradiation in deca-nanometer devices

IEEE transactions on nuclear science, 2005-12, Vol.52 (6), p.2104-2113

2005

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Bone marrow JAK2V617F allele burden and clinical correlates in polycythemia vera

Leukemia, 2007-09, Vol.21 (9), p.2074-2075

2007

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Development of a D-FISH method to detect DEK/CAN fusion resulting from t(6;9)(p23;q34) in patients with acute myelogenous leukemia

Leukemia, 2005-01, Vol.19 (1), p.126-131

2005

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Mayo prognostic model for WHO-defined chronic myelomonocytic leukemia: ASXL1 and spliceosome component mutations and outcomes

Leukemia, 2013-10, Vol.27 (10), p.2112

2013

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Centrifuge polarizing microscope. II. Sample biological applications

Journal of microscopy (Oxford), 2001-03, Vol.201 (3), p.357-367

2001

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Centrifuge polarizing microscope. I. Rationale, design and instrument performance

Journal of microscopy (Oxford), 2001-03, Vol.201 (3), p.341-356

2001

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The effects of radiation on MEMS accelerometers

IEEE transactions on nuclear science, 1996-12, Vol.43 (6), p.3122-3126

1996

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Numerical simulation of heavy ion charge generation and collection dynamics

IEEE transactions on nuclear science, 1993-12, Vol.40 (6), p.1926-1934

1993

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Single event induced charge transport modeling of GaAs MESFETs

IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States), 1993-12, Vol.40 (6), p.1867-1871

1993

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Centrifuge Polarizing Microscope with Dual Specimen Chambers and Injection Ports

The Biological bulletin (Lancaster), 2001-10, Vol.201 (2), p.234-234

2001

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Anaplastic astroblastoma-sarcoma in neurofibromatosis Type 1

Clinical neuropathology, 2010-09, Vol.29 (5), p.289

2010

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Charge-collection mechanisms of heterostructure FETs

IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States), 1994-12, Vol.41 (6), p.2055-2062

1994

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Technique to measure an ion track profile

IEEE transactions on nuclear science, 1998-12, Vol.45 (6), p.2563-2570

1998

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Ionization-induced carrier transport in InAlAs/InGaAs high electron mobility transistors

IEEE transactions on nuclear science, 2004-10, Vol.51 (5), p.2857-2864

2004

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Oocyte Maturation in Chaetopterus pergamentaceous Observed with Centrifuge Polarizing Microscope

The Biological bulletin (Lancaster), 1998-10, Vol.195 (2), p.212-214

1998

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Transient response of III-V field-effect transistors to heavy-ion irradiation

IEEE transactions on nuclear science, 2004-12, Vol.51 (6), p.3324-3331

2004

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Pulsed laser-induced single event upset and charge collection measurements as a function of optical penetration depth

Journal of applied physics, 1998-07, Vol.84 (2), p.690-703

1998

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Charge collection in submicron CMOS/SOI technology

IEEE transactions on nuclear science, 1997-12, Vol.44 (6), p.2124-2133

1997

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Charge collection in GaAs MESFETs fabricated in semi-insulating substrates

IEEE transactions on nuclear science, 1995-12, Vol.42 (6), p.1585-1591

1995

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Comparison of experimental charge collection waveforms with PISCES calculations

IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States), 1991-12, Vol.38 (6), p.1540-1545

1991

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Single-event dynamics of high-performance HBTs and GaAs MESFETs

IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States), 1993-12, Vol.40 (6), p.1858-1866

1993

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Charge collection in silicon for ions of different energy but same linear energy transfer (LET)

IEEE transactions on nuclear science, 1988-12, Vol.35 (6), p.1585-1590

1988

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Pulsed laser-induced SEU in integrated circuits: a practical method for hardness assurance testing

IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (USA), 1990-12, Vol.37 (6), p.1825-1831

1990

Volltextzugriff (PDF)

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SF3B1 mutations in primary myelofibrosis: clinical, histopathology and genetic correlates among 155 patients

Targetable fusions of the FRK tyrosine kinase in ALK-negative anaplastic large cell lymphoma

Direct measurement of transient pulses induced by laser and heavy ion irradiation in deca-nanometer devices

Bone marrow JAK2V617F allele burden and clinical correlates in polycythemia vera

Development of a D-FISH method to detect DEK/CAN fusion resulting from t(6;9)(p23;q34) in patients with acute myelogenous leukemia

Mayo prognostic model for WHO-defined chronic myelomonocytic leukemia: ASXL1 and spliceosome component mutations and outcomes

Centrifuge polarizing microscope. II. Sample biological applications

Centrifuge polarizing microscope. I. Rationale, design and instrument performance

The effects of radiation on MEMS accelerometers

Numerical simulation of heavy ion charge generation and collection dynamics

Single event induced charge transport modeling of GaAs MESFETs

Centrifuge Polarizing Microscope with Dual Specimen Chambers and Injection Ports

Anaplastic astroblastoma-sarcoma in neurofibromatosis Type 1

Charge-collection mechanisms of heterostructure FETs

Technique to measure an ion track profile

Ionization-induced carrier transport in InAlAs/InGaAs high electron mobility transistors

Oocyte Maturation in Chaetopterus pergamentaceous Observed with Centrifuge Polarizing Microscope

Transient response of III-V field-effect transistors to heavy-ion irradiation

Pulsed laser-induced single event upset and charge collection measurements as a function of optical penetration depth

Charge collection in submicron CMOS/SOI technology

Charge collection in GaAs MESFETs fabricated in semi-insulating substrates

Comparison of experimental charge collection waveforms with PISCES calculations

Single-event dynamics of high-performance HBTs and GaAs MESFETs

Charge collection in silicon for ions of different energy but same linear energy transfer (LET)

Pulsed laser-induced SEU in integrated circuits: a practical method for hardness assurance testing

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