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ESD: Failure Mechanisms and Models

Voldman, Steven H

1. Aufl., 2009

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Lifetime Reliability-Aware Design of Integrated Circuits

1, 2022

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Design for Testability, Debug and Reliability: Next Generation Measures Using Formal Techniques

1st Edition 2021, 2021

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Semiconductor Packaging : Materials Interaction and Reliability

1st edition., 2016

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Binary Decision Diagrams and Extensions for System Reliability Analysis

Liudong Xing, Suprasad V. Amari

1, 2015

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Terrestrial Radiation Effects in ULSI Devices and Electronic Systems

Ibe, Eishi H

1st ed., 2014

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Lifetime Reliability Optimization Algorithms of Integrated Circuits Using Dual-Threshold Voltage Assignment

Lifetime Reliability-aware Design of Integrated Circuits, 2022, p.85-105

2022

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Resynthesize Technique for Soft Error-Tolerant Design of Combinational Circuits

Soft Error Reliability of VLSI Circuits, 2020, p.93-107

2020

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Soft Error Tolerant Circuit Design Using Partitioning-Based Gate Sizing

Soft Error Reliability of VLSI Circuits, 2020, p.75-92

2020

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Hybrid Microcircuit Reliability Data

Zhou, Yong

2013

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Ageing of Integrated Circuits: Causes, Effects and Mitigation Techniques

Halak, Basel

1st ed. 2020., 2019

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Soft Error Reliability of VLSI Circuits: Analysis and Mitigation Techniques

1st Edition 2021, 2020

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Electronics Reliability and Measurement Technology - Nondestructive Evaluation

Heyman J.S

1988

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A New Ageing-Aware Approach via Path Isolation

Languages, Design Methods, and Tools for Electronic System Design, 2020, Vol.611, p.89-98

2020

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Hybrid Microcircuit Reliability Data

Stuart, Sam

1, 1976

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Reliability approaches for automotive electronic systems

Reliability Characterisation of Electrical and Electronic Systems, 2015

Swingler, J

2015

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10 - Reliability approaches for automotive electronic systems

Reliability Characterisation of Electrical and Electronic Systems, 2015, p.195-213

Medhat, D.

2015

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SINGLE-CIRCUIT SUPPLY SYSTEM PLANNING

Probabilistic Transmission System Planning, 2011, Vol.65, p.283-307

Li, Wenyuan

2011

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Basic Case Studies

Statistical Intervals, 2017, Vol.541, p.185-211

2017

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Summary

Transient‐Induced Latchup in CMOS Integrated Circuits, 2009, p.207-210

2009

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Time-Dependent Degradation in Device Characteristics and Countermeasures by Design

VLSI Design and Test for Systems Dependability, p.203-243

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Identification of radiation-induced parasitic leakage paths using light emission microscopy

Proceedings of the 7th European Conference on Radiation and Its Effects on Components and Systems, 2003. RADECS 2003, 2003, p.113-117

2003

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Electromigration

Reliability Wearout Mechanisms in Advanced CMOS Technologies, 2009, Vol.12, p.565-618

2009

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Architecture Design for Soft Errors

Mukherjee, Shubu

1, 2008

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Recent Advances in Microelectronics Reliability: Contributions from the European ECSEL JU project iRel40

2024

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ESD: Failure Mechanisms and Models

Lifetime Reliability-Aware Design of Integrated Circuits

Design for Testability, Debug and Reliability: Next Generation Measures Using Formal Techniques

Semiconductor Packaging : Materials Interaction and Reliability

Binary Decision Diagrams and Extensions for System Reliability Analysis

Terrestrial Radiation Effects in ULSI Devices and Electronic Systems

Lifetime Reliability Optimization Algorithms of Integrated Circuits Using Dual-Threshold Voltage Assignment

Resynthesize Technique for Soft Error-Tolerant Design of Combinational Circuits

Soft Error Tolerant Circuit Design Using Partitioning-Based Gate Sizing

Hybrid Microcircuit Reliability Data

Ageing of Integrated Circuits: Causes, Effects and Mitigation Techniques

Soft Error Reliability of VLSI Circuits: Analysis and Mitigation Techniques

Electronics Reliability and Measurement Technology - Nondestructive Evaluation

A New Ageing-Aware Approach via Path Isolation

Hybrid Microcircuit Reliability Data

Reliability approaches for automotive electronic systems

10 - Reliability approaches for automotive electronic systems

SINGLE-CIRCUIT SUPPLY SYSTEM PLANNING

Basic Case Studies

Summary

Time-Dependent Degradation in Device Characteristics and Countermeasures by Design

Identification of radiation-induced parasitic leakage paths using light emission microscopy

Electromigration

Architecture Design for Soft Errors

Recent Advances in Microelectronics Reliability: Contributions from the European ECSEL JU project iRel40

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