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Metal-Oxide RRAM

Proceedings of the IEEE, 2012-06, Vol.100 (6), p.1951-1970

2012

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IEEE_Xplore

TiO2-Based Metal-Semiconductor-Metal Ultraviolet Photodetectors Deposited by Ultrasonic Spray Pyrolysis Technique

IEEE transactions on electron devices, 2016-01, Vol.63 (1), p.79-85

2016

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IEEE_Xplore

Si1−xGex nanowire based metal‐semiconductor‐metal Schottky biristor: Design and sensitivity analysis

IET circuits, devices & systems, 2021-11, Vol.15 (8), p.745-754

2021

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High Detectivity of Metal-Semiconductor-Metal Ga2O3 Solar-Blind Photodetector Through Thickness-Regulated Gain

IEEE transactions on electron devices, 2022-08, Vol.69 (8), p.4362-4365

2022

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IEEE_Xplore

Electrical Study of Pentacene-Based Metal-Semiconductor-Metal Structure: Schottky Barrier and Active Layer Thickness Effects

IEEE transactions on electron devices, 2018-11, Vol.65 (11), p.5009-5013

2018

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IEEE_Xplore

Atomic Defects Profiling and Reliability of Amorphous Al2O3 Metal-Insulator-Metal Stacks

IEEE transactions on electron devices, 2022-07, Vol.69 (7), p.3884-3891

2022

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IEEE_Xplore

Improvement in Long-Term and High-Temperature Retention Stability of Ferroelectric Field-Effect Memory Transistors With Metal-Ferroelectric-Metal-Insulator-Semiconductor Gate-Stacks Using Al-Doped HfO2 Thin Films

IEEE transactions on electron devices, 2020-02, Vol.67 (2), p.499-504

2020

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IEEE_Xplore

Elevated-Metal-Metal-Oxide Thin-Film Transistor: Technology and Characteristics

IEEE electron device letters, 2016-06, Vol.37 (6), p.728-730

2016

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IEEE_Xplore

High- $kappa$ /Metal–Gate Stack and Its MOSFET Characteristics

IEEE electron device letters, 2004-06, Vol.25 (6), p.408-410

2004

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Interface Asymmetry Induced by Symmetric Electrodes on Metal-Al:TiO -Metal Structures

IEEE transactions on nanotechnology, 2018-09, Vol.17 (5), p.867-872

2018

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Demonstrating the Ultrathin Metal-Insulator- Metal Diode Using TiN/ZrO2-Al2O3-ZrO2 Stack by Employing RuO2 Top Electrode

IEEE transactions on electron devices, 2018-02, Vol.65 (2), p.660-666

2018

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IEEE_Xplore

Controlling the Current Conduction Asymmetry of HfO2 Metal-Insulator-Metal Diodes by Interposing Al2O3 Layer

IEEE transactions on electron devices, 2019-01, Vol.66 (1), p.402-406

2019

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IEEE_Xplore

Observation of Metal-Layer Stress on Si Nanowires in Gate-All-Around High- \kappa/Metal-Gate Device Structures

IEEE electron device letters, 2007-07, Vol.28 (7), p.558-561

2007

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IEEE_Xplore

Current Density Contribution to Plasmonic Enhancement Effects in Metal–Semiconductor–Metal Photodetectors

Journal of lightwave technology, 2018-06, Vol.36 (12), p.2430-2434

2018

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Role of Nitrogen in Ferroelectricity of HfxZr1-xO2-Based Capacitors With Metal-Ferroelectric-Insulator-Metal Structure

IEEE transactions on electron devices, 2022-04, Vol.69 (4), p.2074-2079

2022

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IEEE_Xplore

Ultra-Low Dark Current AlGaN-Based Solar-Blind Metal-Semiconductor-Metal Photodetectors for High-Temperature Applications

IEEE sensors journal, 2012-06, Vol.12 (6), p.2086-2090

2012

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IEEE_Xplore

High-efficiency Metal-insulator-Metal Electron Emitter based on Porous Alumina Film

IEEE electron device letters, 2023-09, Vol.44 (9), p.1-1

2023

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IEEE_Xplore

Low Dark-Current Lateral Amorphous-Selenium Metal-Semiconductor-Metal Photodetector

IEEE electron device letters, 2011-09, Vol.32 (9), p.1263-1265

2011

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IEEE_Xplore

Impedance Spectroscopy Modeling of Solution-Processed Amorphous Indium-Gallium-Zinc-Oxide Metal-Semiconductor-Metal Diode

IEEE transactions on electron devices, 2024-03, Vol.71 (3), p.1940-1945

2024

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IEEE_Xplore

A Focused Asymmetric Metal-Insulator-Metal Tunneling Diode: Fabrication, DC Characteristics and RF Rectification Analysis

IEEE transactions on electron devices, 2011-10, Vol.58 (10), p.3519-3528

2011

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IEEE_Xplore

Electrical breakdown spots in metal-aluminum oxide-metal structures

IEEE transactions on dielectrics and electrical insulation, 2020-08, Vol.27 (4), p.1080-1085

2020

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IEEE_Xplore

Experimental Study of 1/f1+α Noise in Transient Leakage Current of Metal-Insulator-Metal With Stacked High-k Polycrystalline Films

IEEE transactions on electron devices, 2020-06, Vol.67 (6), p.2503-2509

2020

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IEEE_Xplore

Gate Controlled Three-Terminal Metal Oxide Memristor

IEEE electron device letters, 2018-04, Vol.39 (4), p.500-503

2018

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IEEE_Xplore

Flexible Capacitive Pressure Sensor Based on PDMS Substrate and Ga-In Liquid Metal

IEEE sensors journal, 2019-01, Vol.19 (1), p.97-104

2019

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IEEE_Xplore

Stress effects of interconnecting metals on back-end-of-line compatible Hf0.5Zr0.5O2 ferroelectric capacitors

IEEE electron device letters, 2023-04, Vol.44 (4), p.1-1

2023

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IEEE_Xplore

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Metal-Oxide RRAM

TiO2-Based Metal-Semiconductor-Metal Ultraviolet Photodetectors Deposited by Ultrasonic Spray Pyrolysis Technique

Si1−xGex nanowire based metal‐semiconductor‐metal Schottky biristor: Design and sensitivity analysis

High Detectivity of Metal-Semiconductor-Metal Ga2O3 Solar-Blind Photodetector Through Thickness-Regulated Gain

Electrical Study of Pentacene-Based Metal-Semiconductor-Metal Structure: Schottky Barrier and Active Layer Thickness Effects

Atomic Defects Profiling and Reliability of Amorphous Al2O3 Metal-Insulator-Metal Stacks

Improvement in Long-Term and High-Temperature Retention Stability of Ferroelectric Field-Effect Memory Transistors With Metal-Ferroelectric-Metal-Insulator-Semiconductor Gate-Stacks Using Al-Doped HfO2 Thin Films

Elevated-Metal-Metal-Oxide Thin-Film Transistor: Technology and Characteristics

High- $kappa$ /Metal–Gate Stack and Its MOSFET Characteristics

Interface Asymmetry Induced by Symmetric Electrodes on Metal-Al:TiO -Metal Structures

Demonstrating the Ultrathin Metal-Insulator- Metal Diode Using TiN/ZrO2-Al2O3-ZrO2 Stack by Employing RuO2 Top Electrode

Controlling the Current Conduction Asymmetry of HfO2 Metal-Insulator-Metal Diodes by Interposing Al2O3 Layer

Observation of Metal-Layer Stress on Si Nanowires in Gate-All-Around High- \kappa/Metal-Gate Device Structures

Current Density Contribution to Plasmonic Enhancement Effects in Metal–Semiconductor–Metal Photodetectors

Role of Nitrogen in Ferroelectricity of HfxZr1-xO2-Based Capacitors With Metal-Ferroelectric-Insulator-Metal Structure

Ultra-Low Dark Current AlGaN-Based Solar-Blind Metal-Semiconductor-Metal Photodetectors for High-Temperature Applications

High-efficiency Metal-insulator-Metal Electron Emitter based on Porous Alumina Film

Low Dark-Current Lateral Amorphous-Selenium Metal-Semiconductor-Metal Photodetector

Impedance Spectroscopy Modeling of Solution-Processed Amorphous Indium-Gallium-Zinc-Oxide Metal-Semiconductor-Metal Diode

A Focused Asymmetric Metal-Insulator-Metal Tunneling Diode: Fabrication, DC Characteristics and RF Rectification Analysis

Electrical breakdown spots in metal-aluminum oxide-metal structures

Experimental Study of 1/f1+α Noise in Transient Leakage Current of Metal-Insulator-Metal With Stacked High-k Polycrystalline Films

Gate Controlled Three-Terminal Metal Oxide Memristor

Flexible Capacitive Pressure Sensor Based on PDMS Substrate and Ga-In Liquid Metal

Stress effects of interconnecting metals on back-end-of-line compatible Hf0.5Zr0.5O2 ferroelectric capacitors

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