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"Linear kink effect" induced by electron valence band tunneling in ultrathin gate oxide bulk and SOI MOSFETS

IEEE transactions on electron devices, 2003-07, Vol.50 (7), p.1675-1682

2003

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IEEE_Xplore

Low frequency noise characterization in n-channel FinFETs

Solid-state electronics, 2012-04, Vol.70, p.20-26

2012

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Stochastic Matching Properties of FinFETs

IEEE electron device letters, 2006-10, Vol.27 (10), p.846-848

2006

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IEEE_Xplore

Matching Performance of FinFET Devices With Fin Widths Down to 10 nm

IEEE electron device letters, 2009-12, Vol.30 (12), p.1374-1376

2009

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IEEE_Xplore

Low-frequency noise and static analysis of the impact of the TiN metal gate thicknesses on n- and p-channel MuGFETs

Solid-state electronics, 2010-12, Vol.54 (12), p.1592-1597

2010

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Vertical device architecture for 5nm and beyond: Device & circuit implications

IEEE Conferences, 2015, p.T26-T27

2015

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The Potential of FinFETs for Analog and RF Circuit Applications

IEEE transactions on circuits and systems. I, Regular papers, 2007-11, Vol.54 (11), p.2541-2551

2007

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IEEE_Xplore

Critical discussion of the front-back gate coupling effect on the low-frequency noise in fully depleted SOI MOSFETs

IEEE transactions on electron devices, 2004-06, Vol.51 (6), p.1008-1016

2004

Link zum Volltext
IEEE_Xplore

Impact of the high vertical electric field on low-frequency noise in thin-gate oxide MOSFETs

IEEE transactions on electron devices, 2003-12, Vol.50 (12), p.2520-2527

2003

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IEEE_Xplore

Analysis of 2-MeV Electron-Irradiation Induced Degradation in FD-SOI MOSFETs Fabricated on ELTRAN and UNIBOND Wafers

IEEE transactions on nuclear science, 2006-08, Vol.53 (4), p.1939-1944

2006

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IEEE_Xplore

Design Issues and Considerations for Low-Cost 3-D TSV IC Technology

IEEE journal of solid-state circuits, 2011-01, Vol.46 (1), p.293-307

2011

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IEEE_Xplore

Impact of 7.5-MeV proton irradiation on front-back gate coupling effect in ultra thin gate oxide FD-SOI n-MOSFETs

IEEE transactions on nuclear science, 2004-12, Vol.51 (6), p.3795-3800

2004

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IEEE_Xplore

Carrier lifetime analysis in thin gate oxide FD-SOI n-MOSFETs by gate-induced drain current transients

Journal of materials science. Materials in electronics, 2008-02, Vol.19 (2), p.161-165

2008

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Low-Frequency Noise Assessment of Silicon Passivated Ge pMOSFETs With TiN/TaN/ \hbox Gate Stack

IEEE electron device letters, 2007-04, Vol.28 (4), p.288-291

2007

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IEEE_Xplore

Short-channel radiation effect in 60 MeV proton irradiated 0.13μm CMOS transistors

IEEE transactions on nuclear science, 2003-12, Vol.50 (6), p.2426-2432

2003

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IEEE_Xplore

Effect of high-temperature electron irradiation in thin gate oxide FD-SOI n-MOSFETs

IEEE transactions on nuclear science, 2005-12, Vol.52 (6), p.2392-2397

2005

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IEEE_Xplore

Explaining the parameters of the electron valence-band tunneling related Lorentzian noise in fully depleted SOI MOSFETs

IEEE electron device letters, 2003-12, Vol.24 (12), p.751-754

2003

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IEEE_Xplore

Body potential analysis of ultra thin gate oxide FD-SOI MOSFETs in accumulation mode operation

Journal of materials science. Materials in electronics, 2005-07, Vol.16 (7), p.459-462

2005

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Determination and Validation of New Nonlinear FinFET Model Based on Lookup Tables

IEEE microwave and wireless components letters, 2007-05, Vol.17 (5), p.361-363

2007

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IEEE_Xplore

Double-Gate finFETs as a CMOS Technology Downscaling Option: An RF Perspective

IEEE transactions on electron devices, 2007-02, Vol.54 (2), p.279-283

2007

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IEEE_Xplore

Low-frequency noise behavior of SiO sub(2)--HfO sub(2) dual-layer gate dielectric nMOSFETs with different interfacial oxide thickness

IEEE transactions on electron devices, 2004-01, Vol.51 (5)

2004

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Low-Frequency Noise Assessment of Silicon Passivated Ge pMOSFETs With TiN/TaN/ HfO sub(2) Gate Stack

IEEE electron device letters, 2007-01, Vol.28 (4)

2007

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FinFET Mismatch in Subthreshold Region: Theory and Experiments

IEEE transactions on electron devices, 2010-11, Vol.57 (11), p.2848-2856

2010

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IEEE_Xplore

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"Linear kink effect" induced by electron valence band tunneling in ultrathin gate oxide bulk and SOI MOSFETS

Low frequency noise characterization in n-channel FinFETs

Stochastic Matching Properties of FinFETs

Matching Performance of FinFET Devices With Fin Widths Down to 10 nm

Low-frequency noise and static analysis of the impact of the TiN metal gate thicknesses on n- and p-channel MuGFETs

Vertical device architecture for 5nm and beyond: Device & circuit implications

The Potential of FinFETs for Analog and RF Circuit Applications

Critical discussion of the front-back gate coupling effect on the low-frequency noise in fully depleted SOI MOSFETs

Impact of the high vertical electric field on low-frequency noise in thin-gate oxide MOSFETs

Analysis of 2-MeV Electron-Irradiation Induced Degradation in FD-SOI MOSFETs Fabricated on ELTRAN and UNIBOND Wafers

Design Issues and Considerations for Low-Cost 3-D TSV IC Technology

Impact of 7.5-MeV proton irradiation on front-back gate coupling effect in ultra thin gate oxide FD-SOI n-MOSFETs

Carrier lifetime analysis in thin gate oxide FD-SOI n-MOSFETs by gate-induced drain current transients

Low-Frequency Noise Assessment of Silicon Passivated Ge pMOSFETs With TiN/TaN/ \hbox Gate Stack

Short-channel radiation effect in 60 MeV proton irradiated 0.13μm CMOS transistors

Effect of high-temperature electron irradiation in thin gate oxide FD-SOI n-MOSFETs

Explaining the parameters of the electron valence-band tunneling related Lorentzian noise in fully depleted SOI MOSFETs

Body potential analysis of ultra thin gate oxide FD-SOI MOSFETs in accumulation mode operation

Determination and Validation of New Nonlinear FinFET Model Based on Lookup Tables

Double-Gate finFETs as a CMOS Technology Downscaling Option: An RF Perspective

Low-frequency noise behavior of SiO sub(2)--HfO sub(2) dual-layer gate dielectric nMOSFETs with different interfacial oxide thickness

Low-Frequency Noise Assessment of Silicon Passivated Ge pMOSFETs With TiN/TaN/ HfO sub(2) Gate Stack

FinFET Mismatch in Subthreshold Region: Theory and Experiments

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