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Journal of vacuum science and technology. B, Nanotechnology & microelectronics, 2010-03, Vol.28 (2), p.223-262
2010
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IEEE transactions on electron devices, 2011-08, Vol.58 (8), p.2197-2208
2011
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IEEE journal of selected topics in quantum electronics, 2019-09, Vol.25 (5), p.1-11
2019
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IEEE journal of selected topics in quantum electronics, 2009-01, Vol.15 (1), p.191-206
2009
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IEEE transactions on electron devices, 2017-03, Vol.64 (3), p.674-691
2017
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IEEE photonics technology letters, 2019-01, Vol.31 (1), p.39-42
2019
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IEEE sensors journal, 2021-06, Vol.21 (11), p.12752-12763
2021
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IEEE transactions on electron devices, 2017-03, Vol.64 (3), p.779-795
2017
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Journal of electronic materials, 2020-06, Vol.49 (6), p.3520-3532
2020
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IEEE journal of selected topics in quantum electronics, 2013-07, Vol.19 (4), p.6100117-6100117
2013
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IEEE journal of selected topics in quantum electronics, 2018-07, Vol.24 (4), p.1-21
- Roeloffzen, Chris G. H.
- Hoekman, Marcel
- Klein, Edwin J.
- Wevers, Lennart S.
- Timens, Roelof Bernardus
- Marchenko, Denys
- Geskus, Dimitri
- Dekker, Ronald
- Alippi, Andrea
- Grootjans, Robert
- van Rees, Albert
- Oldenbeuving, Ruud M.
- Epping, Jorn P.
- Heideman, Rene G.
- Worhoff, Kerstin
- Leinse, Arne
- Geuzebroek, Douwe
- Schreuder, Erik
- van Dijk, Paulus W. L.
- Visscher, Ilka
- Taddei, Caterina
- Youwen Fan
- Taballione, Caterina
- Yang Liu
- Marpaung, David
- Leimeng Zhuang
- Benelajla, Meryem
- Boller, Klaus J.
2018
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IEEE transactions on microwave theory and techniques, 2024-03, Vol.72 (3), p.1-15
2024
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IEEE transactions on electron devices, 2018-10, Vol.65 (10), p.4040-4052
2018
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IEEE transactions on electron devices, 2015-02, Vol.62 (2), p.278-285
2015
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IEEE transactions on electron devices, 2014-06, Vol.61 (6), p.1830-1835
2014
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Sensors (Basel, Switzerland), 2017-10, Vol.17 (10), p.2284
2017
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IEEE sensors journal, 2019-05, Vol.19 (9), p.3191-3202
2019
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Journal of micromechanics and microengineering, 2022-01, Vol.32 (1), p.14005
2022
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1st ed. 2016, 2016
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IEEE transactions on electron devices, 2020-04, Vol.67 (4), p.1373-1381
2020
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Microelectronics and reliability, 2011-03, Vol.51 (3), p.517-523
2011
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Semiconductor science and technology, 2014-08, Vol.29 (8), p.83001
- Smit, Meint
- Leijtens, Xaveer
- Ambrosius, Huub
- Bente, Erwin
- van der Tol, Jos
- Smalbrugge, Barry
- de Vries, Tjibbe
- Geluk, Erik-Jan
- Bolk, Jeroen
- van Veldhoven, Rene
- Augustin, Luc
- Thijs, Peter
- D'Agostino, Domenico
- Rabbani, Hadi
- Lawniczuk, Katarzyna
- Stopinski, Stanislaw
- Tahvili, Saeed
- Corradi, Antonio
- Kleijn, Emil
- Dzibrou, Dzmitry
- Felicetti, Manuela
- Bitincka, Elton
- Moskalenko, Valentina
- Zhao, Jing
- Santos, Rui
- Gilardi, Giovanni
- Yao, Weiming
- Williams, Kevin
- Stabile, Patty
- Kuindersma, Piet
- Pello, Josselin
- Bhat, Srivathsa
- Jiao, Yuqing
- Heiss, Dominik
- Roelkens, Gunther
- Wale, Mike
- Firth, Paul
- Soares, Francisco
- Grote, Norbert
- Schell, Martin
- Debregeas, Helene
- Achouche, Mohand
- Gentner, Jean-Louis
- Bakker, Arjen
- Korthorst, Twan
- Gallagher, Dominic
- Dabbs, Andrew
- Melloni, Andrea
- Morichetti, Francesco
- Melati, Daniele
- Wonfor, Adrian
- Penty, Richard
- Broeke, Ronald
- Musk, Bob
- Robbins, Dave
2014
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Solid-state electronics, 2015-10, Vol.112, p.56-67
2015
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Journal of Electronic Materials, 2016-06, Vol.45 (6), p.2673-2682
2016
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IEEE access, 2021, Vol.9, p.97152-97179
2021
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