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  • BibTeX
Low frequency 1/f noise measurements in YBa/sub 2/Cu/sub 3/O/sub 7/ thin films and the implications for HTS IR detectors
IEEE Transactions on Magnetics (Institute of Electrical and Electronics Engineers); (United States), 1991-03, Vol.27 (2), p.2832-2835
1991

Details

Autor(en) / Beteiligte
Titel
Low frequency 1/f noise measurements in YBa/sub 2/Cu/sub 3/O/sub 7/ thin films and the implications for HTS IR detectors
Ist Teil von
  • IEEE Transactions on Magnetics (Institute of Electrical and Electronics Engineers); (United States), 1991-03, Vol.27 (2), p.2832-2835
Ort / Verlag
United States: IEEE
Erscheinungsjahr
1991
Link zum Volltext
Quelle
IEEE Electronic Library (IEL)
Beschreibungen/Notizen
  • The low-frequency noise voltage fluctuations were measured on c-axis textured films of YBa/sub 2/Cu/sub 3/O/sub 7/ on
Sprache
Englisch
Identifikatoren
ISSN: 0018-9464
eISSN: 1941-0069
DOI: 10.1109/20.133991
Titel-ID: cdi_osti_scitechconnect_6089306
Format
–
Schlagworte
360206 -- Ceramics, Cermets, & Refractories-- Radiation Effects, 440200 -- Radiation Effects on Instrument Components, Instruments, or Electronic Systems, ALKALINE EARTH METAL COMPOUNDS, BARIUM COMPOUNDS, BARIUM OXIDES, CHALCOGENIDES, CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY, COPPER COMPOUNDS, COPPER OXIDES, DOMAIN STRUCTURE, ELECTROMAGNETIC RADIATION, FLUCTUATIONS, Frequency, HARDENING, High temperature superconductors, HIGH-TC SUPERCONDUCTORS, INFRARED RADIATION, INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY, Low-frequency noise, MATERIALS SCIENCE, MEASURING INSTRUMENTS, NOISE, Noise measurement, OXIDES, OXYGEN COMPOUNDS, PHYSICAL RADIATION EFFECTS, RADIATION DETECTORS, RADIATION EFFECTS, RADIATION HARDENING, RADIATIONS, Superconducting device noise, SUPERCONDUCTING FILMS, Superconducting transition temperature, SUPERCONDUCTORS, TEMPERATURE DEPENDENCE, TEMPERATURE NOISE, Transistors, TRANSITION ELEMENT COMPOUNDS, VARIATIONS, Voltage fluctuations, Voltage measurement, YTTRIUM COMPOUNDS 665412 -- Superconducting Devices-- (1992-), YTTRIUM OXIDES

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