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Improved Thermoelectric Power Factor of InGaZnO/SiO₂ Thin Film Transistor via Gate-Tunable Energy Filtering

IEEE electron device letters, 2021-08, Vol.42 (8), p.1236-1239

2021

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Improvement in Bias Stress Stability of Solution-Processed Amorphous InZnO Thin-Film Transistors via Low-Temperature Photosensitive Passivation

IEEE electron device letters, 2020-09, Vol.41 (9), p.1372-1375

2020

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Atomic Imaging of Interface Defects in an Insulating Film on Diamond

Nano letters, 2023-02, Vol.23 (4), p.1189-1194

2023

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An Algorithm to Correct the Sensitivity Distribution of a Retarding Field Analyzer for Photoelectron Holography

e-Journal of Surface Science and Nanotechnology, 2023/03/25, Vol.21(3), pp.183-187

2023

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Rapid photo-assisted activation and enhancement of solution-processed InZnO thin-film transistors

Journal of physics. D, Applied physics, 2020-01, Vol.53 (4), p.45102

2020

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H and Au diffusion in high mobility a-InGaZnO thin-film transistors via low temperature KrF excimer laser annealing

Applied physics letters, 2017-03, Vol.110 (13)

2017

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Instantaneous Semiconductor-to-Conductor Transformation of a Transparent Oxide Semiconductor a‑InGaZnO at 45 °C

ACS applied materials & interfaces, 2018-07, Vol.10 (29), p.24590-24597

2018

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Degradation phenomenon in metal-oxide-semiconductor thin-film transistors and techniques for its reliability evaluation and suppression

Japanese Journal of Applied Physics, 2019-09, Vol.58 (9), p.90502

2019

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Improvement of Amorphous InGaZnO Thin‐Film Transistor Using High‐k SrTa2O6 as Gate Insulator Deposited by Sputtering Method

Physica status solidi. A, Applications and materials science, 2019-03, Vol.216 (5), p.n/a

2019

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High-Performance Fully Solution-Processed Oxide Thin-Film Transistors via Photo-Assisted Role Tuning of InZnO

ACS applied electronic materials, 2020-08, Vol.2 (8), p.2398-2407

2020

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High performance top gate a-IGZO TFT utilizing siloxane hybrid material as a gate insulator

AIP advances, 2018-09, Vol.8 (9), p.095001-095001-8

2018

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Self-heating induced instability of oxide thin film transistors under dynamic stress

Applied physics letters, 2016-01, Vol.108 (2)

2016

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Improvement of the stability of an electric double-layer transistor using a 1H,1H,2H,2H-perfluorodecyltriethoxysilane barrier layer

Japanese Journal of Applied Physics, 2019-04, Vol.58 (4), p.040907

2019

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P‐196: Late‐News Poster: Off Current Reduction of BG poly‐Si TFT by PLAS Process

SID International Symposium Digest of technical papers, 2018-05, Vol.49 (1), p.1284-1287

2018

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30‐3: High Performance All Solution Processed Oxide Thin‐Film Transistor via Photo‐induced Semiconductor‐to‐Conductor Transformation of a‐InZnO

SID International Symposium Digest of technical papers, 2019-06, Vol.50 (1), p.422-425

2019

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Reliability Improvement of Amorphous InGaZnO Thin-Film Transistors by Less Hydroxyl-Groups Siloxane Passivation

Journal of display technology, 2016-03, Vol.12 (3), p.263-267

2016

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Self-Heating Suppressed Structure of a-IGZO Thin-Film Transistor

IEEE electron device letters, 2018-09, Vol.39 (9), p.1322-1325

2018

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High-density carrier-accumulated and electrically stable oxide thin-film transistors from ion-gel gate dielectric

Scientific reports, 2015-12, Vol.5 (1), p.18168-18168, Article 18168

2015

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Properties of TlZnSnO film fabricated via sputtering from TlZnSnO target

Journal of physics. D, Applied physics, 2018-10, Vol.51 (41), p.415103

2018

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Effect of excimer laser annealing on a-InGaZnO thin-film transistors passivated by solution-processed hybrid passivation layers

Journal of physics. D, Applied physics, 2016-01, Vol.49 (3), p.35102-35108

2016

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Significant mobility improvement of amorphous In-Ga-Zn-O thin-film transistors annealed in a low temperature wet ambient environment

Applied physics letters, 2018-05, Vol.112 (19)

2018

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Highly reliable photosensitive organic-inorganic hybrid passivation layers for a -InGaZnO thin-film transistors

Applied physics letters, 2015-07, Vol.107 (3)

2015

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Atomic structure analysis of gallium oxide at the Al2O3/GaN interface using photoelectron holography

Applied physics express, 2022-08, Vol.15 (8)

2022

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Hot carrier effects in InGaZnO thin-film transistor

Applied physics express, 2019-09, Vol.12 (9), p.94007

2019

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SrTa2O6 induced low voltage operation of InGaZnO thin-film transistors

Thin solid films, 2018-11, Vol.665, p.173-178

2018

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Improved Thermoelectric Power Factor of InGaZnO/SiO₂ Thin Film Transistor via Gate-Tunable Energy Filtering

Improvement in Bias Stress Stability of Solution-Processed Amorphous InZnO Thin-Film Transistors via Low-Temperature Photosensitive Passivation

Atomic Imaging of Interface Defects in an Insulating Film on Diamond

An Algorithm to Correct the Sensitivity Distribution of a Retarding Field Analyzer for Photoelectron Holography

Rapid photo-assisted activation and enhancement of solution-processed InZnO thin-film transistors

H and Au diffusion in high mobility a-InGaZnO thin-film transistors via low temperature KrF excimer laser annealing

Instantaneous Semiconductor-to-Conductor Transformation of a Transparent Oxide Semiconductor a‑InGaZnO at 45 °C

Degradation phenomenon in metal-oxide-semiconductor thin-film transistors and techniques for its reliability evaluation and suppression

Improvement of Amorphous InGaZnO Thin‐Film Transistor Using High‐k SrTa2O6 as Gate Insulator Deposited by Sputtering Method

High-Performance Fully Solution-Processed Oxide Thin-Film Transistors via Photo-Assisted Role Tuning of InZnO

High performance top gate a-IGZO TFT utilizing siloxane hybrid material as a gate insulator

Self-heating induced instability of oxide thin film transistors under dynamic stress

Improvement of the stability of an electric double-layer transistor using a 1H,1H,2H,2H-perfluorodecyltriethoxysilane barrier layer

P‐196: Late‐News Poster: Off Current Reduction of BG poly‐Si TFT by PLAS Process

30‐3: High Performance All Solution Processed Oxide Thin‐Film Transistor via Photo‐induced Semiconductor‐to‐Conductor Transformation of a‐InZnO

Reliability Improvement of Amorphous InGaZnO Thin-Film Transistors by Less Hydroxyl-Groups Siloxane Passivation

Self-Heating Suppressed Structure of a-IGZO Thin-Film Transistor

High-density carrier-accumulated and electrically stable oxide thin-film transistors from ion-gel gate dielectric

Properties of TlZnSnO film fabricated via sputtering from TlZnSnO target

Effect of excimer laser annealing on a-InGaZnO thin-film transistors passivated by solution-processed hybrid passivation layers

Significant mobility improvement of amorphous In-Ga-Zn-O thin-film transistors annealed in a low temperature wet ambient environment

Highly reliable photosensitive organic-inorganic hybrid passivation layers for a -InGaZnO thin-film transistors

Atomic structure analysis of gallium oxide at the Al2O3/GaN interface using photoelectron holography

Hot carrier effects in InGaZnO thin-film transistor

SrTa2O6 induced low voltage operation of InGaZnO thin-film transistors

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