Autor(en)
Pang, Y. T; Bossart, M; Eisaman, M. D
Titel
Index-matched IWKB method for the measurement of spatially varying refractive index profiles within thin-film photovoltaics
Teil von
  • Optics express, 2014-01-13, Vol.22 (1), p.A188-A197
Ort / Verlag
WASHINGTON: OPTICAL SOC AMER
Links zum Volltext
Quelle
Web of Science
Beschreibungen
In many thin-film photovoltaic devices, the photoactive layer has a spatially varying refractive index in the substrate-normal direction, but measurement of this variation with high spatial resolution is difficult due to the thinness of these layers (typically 200 nm for organic photovoltaics). We demonstrate a new method for reconstructing the depth-dependent refractive-index profile with high spatial resolution (similar to 10 nm at a wavelength of 500 nm) in thin (200 nm) photoactive layers by depositing a relatively thick index-matched layer (1-10 mu m) adjacent to the photoactive layer and applying the Inverse Wentzel-Kramers-Brillouin (IWKB) method. This novel technique, which we refer to as index-matched IWKB (IMIWKB), is applicable to any thin film, including the photoactive layers of a broad range of thin-film photovoltaics. (C) 2014 Optical Society of America
Format
Sprache(n)
Englisch
Identifikator(en)
ISSN: 1094-4087
ISSN: 1094-4087
DOI: 10.1364/OE.22.00A188
Links zum Inhalt
Schlagwörter
Optics, Physical Sciences, Science & Technology
Systemstelle
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