Details

Autor(en) / Beteiligte

• Tewari, Sumit
• Bastiaans, Koen M
• Allan, Milan P
• van Ruitenbeek, Jan M

Titel

Robust procedure for creating and characterizing the atomic structure of scanning tunneling microscope tips

Ist Teil von

• Beilstein journal of nanotechnology, 2017, Vol.8 (1), p.2389-2395

Ort / Verlag

Germany: Beilstein-Institut zur Föerderung der Chemischen Wissenschaften

Erscheinungsjahr

2017

Link zum Volltext

Quelle

EZB Free E-Journals

Beschreibungen/Notizen

• Scanning tunneling microscopes (STM) are used extensively for studying and manipulating matter at the atomic scale. In spite of the critical role of the STM tip, procedures for controlling the atomic-scale shape of STM tips have not been rigorously justified. Here, we present a method for preparing tips in situ while ensuring the crystalline structure and a reproducibly prepared tip structure up to the second atomic layer. We demonstrate a controlled evolution of such tips starting from undefined tip shapes.