Sie befinden Sich nicht im Netzwerk der Universität Paderborn. Der Zugriff auf elektronische Ressourcen ist gegebenenfalls nur via VPN oder Shibboleth (DFN-AAI) möglich.
mehr Informationen...
Low-frequency noise used as a lifetime test of LEDs
Ist Teil von
Semiconductor science and technology, 1996-08, Vol.11 (8), p.1133-1136
Ort / Verlag
Bristol: IOP Publishing
Erscheinungsjahr
1996
Link zum Volltext
Quelle
Alma/SFX Local Collection
Beschreibungen/Notizen
Low-frequency noise (1/f noise) has been measured in light emitting diodes (LEDs) which have been subjected to an accelerated life test by means of large forward bias current pulses. Over a large range of stress pulses the electrical and functional LED properties remain unaltered but an increase in the 1/f noise level was seen and this was correlated with the device reliability. The product `initial noise X initial rate of noise increase' correlated best with the LED lifetime.