Applied physics. A, Materials science & processing, 2013, Vol.110 (1), p.153-156
2013
Volltextzugriff (PDF)
Details
- Autor(en) / Beteiligte
- Titel
- Interaction of terahertz radiation with surface and interface plasmon–phonons in AlGaAs/GaAs and GaN/Al2O3 heterostructures
- Ist Teil von
- Applied physics. A, Materials science & processing, 2013, Vol.110 (1), p.153-156
- Ort / Verlag
- Berlin/Heidelberg: Springer-Verlag
- Erscheinungsjahr
- 2013
- Quelle
- Alma/SFX Local Collection
- Beschreibungen/Notizen
- Surface phonon and plasmon–phonon polariton characteristics of GaAs, Al x Ga 1− x As/GaAs, and GaN/Al 2 O 3 layered structures are investigated by means of terahertz radiation reflection spectroscopy. The strong resonant absorption peaks and selective emission of the THz radiation dependent upon the lattice composition and free electron density in these layered structures are experimentally observed and analyzed.
- Sprache
- Englisch
- Identifikatoren
- ISSN: 0947-8396eISSN: 1432-0630DOI: 10.1007/s00339-012-7473-6Titel-ID: cdi_crossref_primary_10_1007_s00339_012_7473_6
- Format
- –
- Schlagworte
- Characterization and Evaluation of Materials, Collective effects, Condensed Matter Physics, Condensed matter: electronic structure, electrical, magnetic, and optical properties, Condensed matter: structure, mechanical and thermal properties, Electron states, Exact sciences and technology, Exchange, correlation, dielectric and magnetic functions, plasmons, Machines, Manufacturing, Nanotechnology, Optical and Electronic Materials, Optical constants: refractive index, complex dielectric constant, absorption, reflection and transmission coefficients, emissivity, Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation, Optical properties of bulk materials and thin films, Physics, Physics and Astronomy, Polaritons (including photon-phonon and photon-magnon interactions), Processes, Solid surfaces and solid-solid interfaces, Surface and interface dynamics and vibrations, Surfaces and Interfaces, Surfaces and interfaces, thin films and whiskers (structure and nonelectronic properties), Thin Films