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BibTeX
X-ray photoelectron spectroscopic chemical state quantification of mixed nickel metal, oxide and hydroxide systems
Surface and interface analysis, 2009-04, Vol.41 (4), p.324-332
Biesinger, Mark C.
Payne, Brad P.
Lau, Leo W. M.
Gerson, Andrea
Smart, Roger St. C.
2009
Details
Autor(en) / Beteiligte
Biesinger, Mark C.
Payne, Brad P.
Lau, Leo W. M.
Gerson, Andrea
Smart, Roger St. C.
Titel
X-ray photoelectron spectroscopic chemical state quantification of mixed nickel metal, oxide and hydroxide systems
Ist Teil von
Surface and interface analysis, 2009-04, Vol.41 (4), p.324-332
Ort / Verlag
Chichester, UK: John Wiley & Sons, Ltd
Erscheinungsjahr
2009
Link zum Volltext
Quelle
Wiley Online Library
Beschreibungen/Notizen
Quantitative chemical state X‐ray photoelectron spectroscopic analysis of mixed nickel metal, oxide, hydroxide and oxyhydroxide systems is challenging due to the complexity of the Ni 2p peak shapes resulting from multiplet splitting, shake‐up and plasmon loss structures. Quantification of mixed nickel chemical states and the qualitative determination of low concentrations of Ni(III) species are demonstrated via an approach based on standard spectra from quality reference samples (Ni, NiO, Ni(OH)2, NiOOH), subtraction of these spectra, and data analysis that integrates information from the Ni 2p spectrum and the O 1s spectra. Quantification of a commercial nickel powder and a thin nickel oxide film grown at 1‐Torr O2 and 300 °C for 20 min is demonstrated. The effect of uncertain relative sensitivity factors (e.g. Ni 2.67 ± 0.54) is discussed, as is the depth of measurement for thin film analysis based on calculated inelastic mean free paths. Copyright © 2009 John Wiley & Sons, Ltd.
Sprache
Englisch
Identifikatoren
ISSN: 0142-2421
eISSN: 1096-9918
DOI: 10.1002/sia.3026
Titel-ID: cdi_crossref_primary_10_1002_sia_3026
Format
–
Schlagworte
Chemical composition analysis, chemical depth and dopant profiling
,
chemical state quantification
,
Condensed matter: electronic structure, electrical, magnetic, and optical properties
,
Condensed matter: structure, mechanical and thermal properties
,
Cross-disciplinary physics: materials science
,
rheology
,
Electron and ion emission by liquids and solids
,
impact phenomena
,
Exact sciences and technology
,
film thickness
,
Materials science
,
Materials testing
,
nickel
,
oxides
,
Photoemission and photoelectron spectra
,
Physics
,
Structure and morphology
,
thickness
,
Surfaces and interfaces
,
thin films and whiskers (structure and nonelectronic properties)
,
Thin film structure and morphology
,
X-ray photoelectron spectroscopy (XPS)
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