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Proceedings of the International Conference on Defects in Semiconductors
International Conference on Defects in Semiconductors; Institute of Physics - 1973 -
Signatur: UAL6061-...
Proceedings of the International Conference on Defects in Semiconductors 14. Paris, France, August 18-22, 1986 Pt. 1
International Conference on Defects in Semiconductors; Institute of Physics - 1986
Signatur: UAL6061-14,1
Proceedings of the International Conference on Defects in Semiconductors 14. Paris, France, August 18-22, 1986 Pt. 2
International Conference on Defects in Semiconductors; Institute of Physics - 1986
Signatur: UAL6061-14,2
Proceedings of the International Conference on Defects in Semiconductors 14. Paris, France, August 18-22, 1986 Pt. 3
International Conference on Defects in Semiconductors; Institute of Physics - 1986
Signatur: UAL6061-14,3
Defects and radiation effects in semiconductors : 1978 ; invited and contributed papers from the International Conference on Defects and Radiation Effects in Semiconductors held in Nice, 11 - 14 September 1978
Albany, J. H. [Herausgeber]; International Conference on Defects and Radiation Effects in Semiconductors (10 : 1978 : Nizza) - 1979
Signatur: UIU2404
Proceedings of the 17th International Conference on Defects in Semiconductors : Gmunden, Austria, July 18 - 23, 1993
Heinrich, Helmut [Herausgeber]; International Conference on Defects in Semiconductors (17 : 1993 : Gmunden); [u.a.]
Signatur: UIM1628-143/147,...
Proceedings of the 17th International Conference on Defects in Semiconductors : Gmunden, Austria, July 18 - 23, 1993 Bd. 3
Heinrich, Helmut [Herausgeber]; International Conference on Defects in Semiconductors (17 : 1993 : Gmunden) - 1994
Signatur: UIM1628-143/147,3
Proceedings of the 17th International Conference on Defects in Semiconductors : Gmunden, Austria, July 18 - 23, 1993 Bd. 2
Heinrich, Helmut [Herausgeber]; International Conference on Defects in Semiconductors (17 : 1993 : Gmunden) - 1994
Signatur: UIM1628-143/147,2
Proceedings of the 17th International Conference on Defects in Semiconductors : Gmunden, Austria, July 18 - 23, 1993 Bd. 1
Heinrich, Helmut [Herausgeber]; International Conference on Defects in Semiconductors (17 : 1993 : Gmunden) - 1994
Signatur: UIM1628-143/147,1
Proceedings of the 18th International Conference on Defects in Semiconductors : Sendai, Japan, July 23 - 28, 1995
Suezawa, Masashi [Herausgeber]; International Conference on Defects in Semiconductors (18 : 1995 : Sendai); [u.a.]
Signatur: UIM1628-196/201
Proceedings of the 18th International Conference on Defects in Semiconductors : Sendai, Japan, July 23 - 28, 1995 Bd. 1
Suezawa, Masashi [Herausgeber]; International Conference on Defects in Semiconductors (18 : 1995 : Sendai) - 1995
Signatur: UIM1628-196/201,1
Proceedings of the 18th International Conference on Defects in Semiconductors : Sendai, Japan, July 23 - 28, 1995 Bd. 2
Suezawa, Masashi [Herausgeber]; International Conference on Defects in Semiconductors (18 : 1995 : Sendai) - 1995
Signatur: UIM1628-196/201,2
Proceedings of the 18th International Conference on Defects in Semiconductors : Sendai, Japan, July 23 - 28, 1995 Bd. 3
Suezawa, Masashi [Herausgeber]; International Conference on Defects in Semiconductors (18 : 1995 : Sendai) - 1995
Signatur: UIM1628-196/201,3
Proceedings of the 18th International Conference on Defects in Semiconductors : Sendai, Japan, July 23 - 28, 1995 Bd. 4
Suezawa, Masashi [Herausgeber]; International Conference on Defects in Semiconductors (18 : 1995 : Sendai) - 1995
Signatur: UIM1628-196/201,4
Proceedings of the 16th International Conference on Defects in Semiconductors : Lehigh University, Bethlehem, Pennsylvania, 22 - 26 July 1991
Davies, Gordon [Herausgeber]; International Conference on Defects in Semiconductors (16 : 1991 : Bethlehem, Pa.); Lehigh University; [u.a.]
Signatur: UIM1628-83/87,...
Proceedings of the 16th International Conference on Defects in Semiconductors : Lehigh University, Bethlehem, Pennsylvania, 22 - 26 July 1991 Bd. 1
Davies, Gordon [Herausgeber]; International Conference on Defects in Semiconductors (16 : 1991 : Bethlehem, Pa.); Lehigh University - 1992
Signatur: UIM1628-83/87,1
Proceedings of the 16th International Conference on Defects in Semiconductors : Lehigh University, Bethlehem, Pennsylvania, 22 - 26 July 1991 Bd. 2
Davies, Gordon [Herausgeber]; International Conference on Defects in Semiconductors (16 : 1991 : Bethlehem, Pa.); Lehigh University - 1992
Signatur: UIM1628-83/87,2
Proceedings of the 16th International Conference on Defects in Semiconductors : Lehigh University, Bethlehem, Pennsylvania, 22 - 26 July 1991 Bd. 3
Davies, Gordon [Herausgeber]; International Conference on Defects in Semiconductors (16 : 1991 : Bethlehem, Pa.); Lehigh University - 1992
Signatur: UIM1628-83/87,3
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