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Electrical characterization of GaAs materials and devices

Design and measurement in electronic engineering

Look, David C

1989

Signatur: UIU3044

Measurement of high speed signals in solid state devices

Semiconductors and semimetals : 28 (Alle Bände)

Marcus, Robert B[Herausgeber]

1990

Signatur: UIU1733-28

Ninth Annual IEEE Semiconductor Thermal Measurement and Management Symposium : February 2 - 4, 1993, Four Seasons Hotel, Austin, TX, USA

1993

Signatur: UAL930018

The electrical characterization of semiconductors. <1>. Measurement of minority carrier properties / J. W. Orton and P. Blood

The electrical characterization of semiconductors (Alle Bände), Techniques of physics : 13 (Alle Bände)

1990

Signatur: UIU3442-1

Semiconductor material and device characterization

A Wiley-Interscience publication

Schroder, Dieter K

1990

Signatur: UIU3426

MOS (metal oxide semiconductor) physics and technology

Wiley classics library

2003

Signatur: UIU4668

Growth and characterization of cubic InGaN and InGaN/GaN quantum wells

Li, Shunfeng

2005

Signatur: P1841

Degradation mechanism of AlInGaP light emitting diodes during PMMA encapsulation and operation

Preuß, Stephan

2007

Signatur: PQ407

Chemical mechanical polishing in silicon processing

Semiconductors and semimetals : 63 (Alle Bände)

Li, Shin Hwa[Herausgeber]

2000

Signatur: UIU1733-63

Simulation and test of metastability of a-Si,µc-Si solar modules under outdoor conditions

Berichte aus der Physik

Weicht, Johannes Arto

2017

Signatur: UIU4985

Semiconductor material and device characterization

Schroder, Dieter K

3. ed, 2006

Signatur: UIU3426(3)

III-nitride based lighting emitting diodes and applications

Topics in applied physics : 126 (Alle Bände)

Seong, Tae-Yeon[Herausgeber]

2013

Signatur: UBX1065-126

The physics of low dimensional semiconductors : an introduction

Davies, John H

1998

Signatur: UIU4147

Thermoelectrics : basic principles and new materials developments

Springer series in materials science : 45 (Alle Bände), Physics and astronomy online library

2001

Signatur: UIU4862

Nitride semiconductors and devices : with 23 tables

Springer series in materials science : 32 (Alle Bände)

Morkoç, Hadis

1999

Signatur: UIU4294

Semiconductor devices : pioneering papers

Sze, S. M[Herausgeber]

1991

Signatur: UIU3183

Development and investigation of II-VI semiconductor microcavity structures

Pawlis, Alexander

2003

Signatur: P1678

Minority carriers in III-V semiconductors : physics and applications

Semiconductors and semimetals : 39 (Alle Bände)

Ahrenkiel, Richard K[Herausgeber]

1993

Signatur: UIU1733-39

Effect of disorder and defects in ion implanted semiconductors : electrical and physicochemical characterization

Semiconductors and semimetals : 45 (Alle Bände)

Ghibaudo, Gérard[Herausgeber]

1997

Signatur: UIU1733-45

The mechanical properties of semiconductors

Semiconductors and semimetals : 37 (Alle Bände)

Faber, Katherine T[Herausgeber]

1992

Signatur: UIU1733-37

Recent trends in thermoelectric materials research. 1

Recent trends in thermoelectric materials research (Alle Bände), Semiconductors and semimetals : 69 (Alle Bände)

Tritt, Terry M[Herausgeber]

2001

Signatur: UIU1733-69

Handbook of nitride semiconductors and devices. 2. Electronic and optical processes in nitrides

Handbook of nitride semiconductors and devices (Alle Bände)

Morkoç, Hadis

2008

Signatur: YEM2256-2

Physics of low dimensional semiconductor structures

Physics of solids and liquids

Butcher, Paul N[Herausgeber]

1993

Signatur: UIU3515

Physics of semiconductor devices

3. ed, 2007

Signatur: UIU1563(3)

Isotope effects in solid state physics

Semiconductors and semimetals : 68 (Alle Bände)

Plechanov, Vladimir G[Herausgeber]

2001

Signatur: UIU1733-68

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Electrical characterization of GaAs materials and devices

Measurement of high speed signals in solid state devices

Ninth Annual IEEE Semiconductor Thermal Measurement and Management Symposium : February 2 - 4, 1993, Four Seasons Hotel, Austin, TX, USA

The electrical characterization of semiconductors. <1>. Measurement of minority carrier properties / J. W. Orton and P. Blood

Semiconductor material and device characterization

MOS (metal oxide semiconductor) physics and technology

Growth and characterization of cubic InGaN and InGaN/GaN quantum wells

Degradation mechanism of AlInGaP light emitting diodes during PMMA encapsulation and operation

Chemical mechanical polishing in silicon processing

Simulation and test of metastability of a-Si,µc-Si solar modules under outdoor conditions

Semiconductor material and device characterization

III-nitride based lighting emitting diodes and applications

The physics of low dimensional semiconductors : an introduction

Thermoelectrics : basic principles and new materials developments

Nitride semiconductors and devices : with 23 tables

Semiconductor devices : pioneering papers

Development and investigation of II-VI semiconductor microcavity structures

Minority carriers in III-V semiconductors : physics and applications

Effect of disorder and defects in ion implanted semiconductors : electrical and physicochemical characterization

The mechanical properties of semiconductors

Recent trends in thermoelectric materials research. 1

Handbook of nitride semiconductors and devices. 2. Electronic and optical processes in nitrides

Physics of low dimensional semiconductor structures

Physics of semiconductor devices

Isotope effects in solid state physics

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