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Electron beam testing technology

Microdevices

Thong, John T[Herausgeber]

1993

Signatur: UFF1621

Bulk crystal growth of electronic, optical & optoelectronic materials

Wiley series in materials for electronic and optoelectronic applications

Capper, Peter[Herausgeber]

2005

Signatur: UIR2687

Handbook of nitride semiconductors and devices

Morkoç, Hadis

2008-

Signatur: YEM2256

Handbook of nitride semiconductors and devices. 1. Materials, properties, physics and growth

Handbook of nitride semiconductors and devices (Alle Bände)

Morkoç, Hadis

2008

Signatur: YEM2256-1

Handbook of nitride semiconductors and devices. 2. Electronic and optical processes in nitrides

Handbook of nitride semiconductors and devices (Alle Bände)

Morkoç, Hadis

2008

Signatur: YEM2256-2

Organic electroluminescence

Optical engineering : 94 (Alle Bände)

Kafafi, Zakya H

2005

Signatur: UIQ5151

Semiconductor nanocrystals : from basic principles to applications

Nanostructure science and technology

Ėfros, Aleksej L[Herausgeber]

2003

Signatur: UIU4537

Electronics for the physicist with applications

Delaney, Cyril F

[Rev. ed.], 1980

Signatur: YEA2298

Optical methods of engineering analysis

Cloud, Gary L

1. paperback ed, 1998

Signatur: UGR1730

Procedures in scanning probe microscopies

Colton, Richard J[Herausgeber]

Repr, 1999

Signatur: MQ11448

Scanning probe microscopy : analytical methods

Nanoscience and technology

Wiesendanger, Roland[Herausgeber]

1998

Signatur: UFF1786

Scanning tunneling microscopy and spectroscopy : theory, techniques, and applications

Bonnell, Dawn A[Herausgeber]

1993

Signatur: UFF1639

Auger microprobe analysis

Ferguson, Ian F

1989

Signatur: UFF1493

Scanning tunneling microscopy and its application

Springer series in surface sciences : 32 (Alle Bände)

Bai, Chunli

1995

Signatur: UFF1702

In-situ electron microscopy at high resolution

Banhart, Florian[Herausgeber]

2008

Signatur: UFF1817

Scanning tunneling microscopy. 2. Further applications and related scanning techniques / with contrib. by W. Baumeister

Scanning tunneling microscopy (Alle Bände), Springer series in surface sciences : 28 (Alle Bände)

2. ed, 1995

Signatur: UFF1582(2)-2

Hall generators and magnetoresistors

Applied Physics Series : 6 (Alle Bände)

Wieder, H. H

1971

Signatur: UFF1176

Scanning tunneling microscopy. 1. General principles and applications to clean and absorbate covered surfaces / with contributions by D. Anselmetti

Scanning tunneling microscopy (Alle Bände), Springer series in surface sciences : 20 (Alle Bände)

1992

Signatur: UFF1582-1

Scanning tunneling microscopy. 3. Theory of STM and related scanning probe methods

Scanning tunneling microscopy (Alle Bände), ... : 29 (Alle Bände)

1993

Signatur: UFF1582-3

The operation of transmission and scanning electron microscopes

Microscopy handbooks : 20 (Alle Bände), Oxford science publications

1990

Signatur: UFF1516

Scanning tunneling microscopy. 2. Further applications and related scanning techniques / with contrib. by W. Baumeister

Scanning tunneling microscopy (Alle Bände), ... : 28 (Alle Bände)

1992

Signatur: UFF1582-2

Electron and ion optics

Microdevices

Szilágyi, Miklós

1988

Signatur: UFF1574

Scanning probe microscopy and spectroscopy : methods and applications

Wiesendanger, Roland

1994

Signatur: UFF1655

Fundamentals of electronic circuits

Prentice-Hall Series in electronic technology

Pike, Arthur L

1971

Signatur: UFF1118

Physical electronics

2. ed, 1967

Signatur: UFF1142(2)

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Electron beam testing technology

Bulk crystal growth of electronic, optical & optoelectronic materials

Handbook of nitride semiconductors and devices

Handbook of nitride semiconductors and devices. 1. Materials, properties, physics and growth

Handbook of nitride semiconductors and devices. 2. Electronic and optical processes in nitrides

Organic electroluminescence

Semiconductor nanocrystals : from basic principles to applications

Electronics for the physicist with applications

Optical methods of engineering analysis

Procedures in scanning probe microscopies

Scanning probe microscopy : analytical methods

Scanning tunneling microscopy and spectroscopy : theory, techniques, and applications

Auger microprobe analysis

Scanning tunneling microscopy and its application

In-situ electron microscopy at high resolution

Scanning tunneling microscopy. 2. Further applications and related scanning techniques / with contrib. by W. Baumeister

Hall generators and magnetoresistors

Scanning tunneling microscopy. 1. General principles and applications to clean and absorbate covered surfaces / with contributions by D. Anselmetti

Scanning tunneling microscopy. 3. Theory of STM and related scanning probe methods

The operation of transmission and scanning electron microscopes

Scanning tunneling microscopy. 2. Further applications and related scanning techniques / with contrib. by W. Baumeister

Electron and ion optics

Scanning probe microscopy and spectroscopy : methods and applications

Fundamentals of electronic circuits

Physical electronics

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