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Electrical characterization of GaAs materials and devices

Design and measurement in electronic engineering

Look, David C

1989

Signatur: UIU3044

Measurement of high speed signals in solid state devices

Semiconductors and semimetals : 28 (Alle Bände)

Marcus, Robert B[Herausgeber]

1990

Signatur: UIU1733-28

Ninth Annual IEEE Semiconductor Thermal Measurement and Management Symposium : February 2 - 4, 1993, Four Seasons Hotel, Austin, TX, USA

1993

Signatur: UAL930018

The electrical characterization of semiconductors. <1>. Measurement of minority carrier properties / J. W. Orton and P. Blood

The electrical characterization of semiconductors (Alle Bände), Techniques of physics : 13 (Alle Bände)

1990

Signatur: UIU3442-1

Semiconductor material and device characterization

A Wiley-Interscience publication

Schroder, Dieter K

1990

Signatur: UIU3426

MOS (metal oxide semiconductor) physics and technology

Wiley classics library

2003

Signatur: UIU4668

Growth and characterization of cubic InGaN and InGaN/GaN quantum wells

Li, Shunfeng

2005

Signatur: P1841

Degradation mechanism of AlInGaP light emitting diodes during PMMA encapsulation and operation

Preuß, Stephan

2007

Signatur: PQ407

Chemical mechanical polishing in silicon processing

Semiconductors and semimetals : 63 (Alle Bände)

Li, Shin Hwa[Herausgeber]

2000

Signatur: UIU1733-63

Simulation and test of metastability of a-Si,µc-Si solar modules under outdoor conditions

Berichte aus der Physik

Weicht, Johannes Arto

2017

Signatur: UIU4985

Semiconductor material and device characterization

Schroder, Dieter K

3. ed, 2006

Signatur: UIU3426(3)

III-nitride based lighting emitting diodes and applications

Topics in applied physics : 126 (Alle Bände)

Seong, Tae-Yeon[Herausgeber]

2013

Signatur: UBX1065-126

The physics of low dimensional semiconductors : an introduction

Davies, John H

1998

Signatur: UIU4147

Thermoelectrics : basic principles and new materials developments

Springer series in materials science : 45 (Alle Bände), Physics and astronomy online library

2001

Signatur: UIU4862

Nitride semiconductors and devices : with 23 tables

Springer series in materials science : 32 (Alle Bände)

Morkoç, Hadis

1999

Signatur: UIU4294

Semiconductor devices : pioneering papers

Sze, S. M[Herausgeber]

1991

Signatur: UIU3183

Development and investigation of II-VI semiconductor microcavity structures

Pawlis, Alexander

2003

Signatur: P1678

Minority carriers in III-V semiconductors : physics and applications

Semiconductors and semimetals : 39 (Alle Bände)

Ahrenkiel, Richard K[Herausgeber]

1993

Signatur: UIU1733-39

Effect of disorder and defects in ion implanted semiconductors : electrical and physicochemical characterization

Semiconductors and semimetals : 45 (Alle Bände)

Ghibaudo, Gérard[Herausgeber]

1997

Signatur: UIU1733-45

The mechanical properties of semiconductors

Semiconductors and semimetals : 37 (Alle Bände)

Faber, Katherine T[Herausgeber]

1992

Signatur: UIU1733-37

Recent trends in thermoelectric materials research. 1

Recent trends in thermoelectric materials research (Alle Bände), Semiconductors and semimetals : 69 (Alle Bände)

Tritt, Terry M[Herausgeber]

2001

Signatur: UIU1733-69

Handbook of nitride semiconductors and devices. 2. Electronic and optical processes in nitrides

Handbook of nitride semiconductors and devices (Alle Bände)

Morkoç, Hadis

2008

Signatur: YEM2256-2

Physics of low dimensional semiconductor structures

Physics of solids and liquids

Butcher, Paul N[Herausgeber]

1993

Signatur: UIU3515

Isotope effects in solid state physics

Semiconductors and semimetals : 68 (Alle Bände)

Plechanov, Vladimir G[Herausgeber]

2001

Signatur: UIU1733-68

Recent trends in thermoelectric materials research. 3

Recent trends in thermoelectric materials research (Alle Bände), Semiconductors and semimetals : 71 (Alle Bände)

Tritt, Terry M[Herausgeber]

2001

Signatur: UIU1733-71

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Autor / AutorinIEEE Staff

Autor / AutorinKaliczyńska, Małgorzata

Autor / AutorinOrganisation for Economic Co-operation and Development,

SystemstelleHWK

SchlagwortMeasurement Science and Instrumentation

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Electrical characterization of GaAs materials and devices

Measurement of high speed signals in solid state devices

Ninth Annual IEEE Semiconductor Thermal Measurement and Management Symposium : February 2 - 4, 1993, Four Seasons Hotel, Austin, TX, USA

The electrical characterization of semiconductors. <1>. Measurement of minority carrier properties / J. W. Orton and P. Blood

Semiconductor material and device characterization

MOS (metal oxide semiconductor) physics and technology

Growth and characterization of cubic InGaN and InGaN/GaN quantum wells

Degradation mechanism of AlInGaP light emitting diodes during PMMA encapsulation and operation

Chemical mechanical polishing in silicon processing

Simulation and test of metastability of a-Si,µc-Si solar modules under outdoor conditions

Semiconductor material and device characterization

III-nitride based lighting emitting diodes and applications

The physics of low dimensional semiconductors : an introduction

Thermoelectrics : basic principles and new materials developments

Nitride semiconductors and devices : with 23 tables

Semiconductor devices : pioneering papers

Development and investigation of II-VI semiconductor microcavity structures

Minority carriers in III-V semiconductors : physics and applications

Effect of disorder and defects in ion implanted semiconductors : electrical and physicochemical characterization

The mechanical properties of semiconductors

Recent trends in thermoelectric materials research. 1

Handbook of nitride semiconductors and devices. 2. Electronic and optical processes in nitrides

Physics of low dimensional semiconductor structures

Isotope effects in solid state physics

Recent trends in thermoelectric materials research. 3

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