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Rorschachiana

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EBSCOhost APA PsycARTICLES
Verfügbar von 1993.
EZB-HOGRE-00385 PsyJournals Hogrefe AL
Verfügbar von 1993 Band: 18.
Einen weiteren Link anzeigen
Weniger anzeigen

BMAT and UKCAT uncovered : a guide to medical school entrance exams [electronic resource]

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Wiley Online Library - AutoHoldings Books

IEEE Std 716-1989 : IEEE Standard C/ATLAS Test Language

Institute of Electrical and Electronics Engineers,

1985

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IEEE Electronic Library (IEL)
IEEE Electronic Library (IEL)
Einen weiteren Link anzeigen
Weniger anzeigen

IEEE Std 1546-2000

Institute of Electrical and Electronics Engineers,

2001

Link zum Volltext
IEEE Electronic Library (IEL)

IEEE Std 1671-2010 (Revision of IEEE Std 1671-2006)

Institute of Electrical and Electronics Engineers,

2011

Link zum Volltext
IEEE Electronic Library (IEL)

IEEE Std 1445-2016 (Revision of IEEE Std 1445-1998) : IEEE Standard for Digital Test Interchange Format (DTIF)

Institute of Electrical and Electronics Engineers,

[2017]

Link zum Volltext
IEEE Electronic Library (IEL)

IEEE Std 1671.1-2009 (Full_Use)

Institute of Electrical and Electronics Engineers,

2009

Link zum Volltext
IEEE Electronic Library (IEL)

IEEE Std 1636.1-2007 : IEEE Standard for Software Interface for Maintenance Information Collection and Analysis (SIMICA): Exchanging Test Results and Session Information via the eXtensible Markup Language(XML)

Institute of Electrical and Electronics Engineers,

2008

Link zum Volltext
IEEE Electronic Library (IEL)

IEEE Std 1671.6-2008 : IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML: Exchanging Test Station Information

Institute of Electrical and Electronics Engineers,

2008

Link zum Volltext
IEEE Electronic Library (IEL)

IEEE Std 1871.2-2017 : IEEE Recommended Practice for IEEE 1671 Test Equipment Templates and Extension Classes for Describing Intrinsic Signal Path Information for Cables, Interface Adapters, and Test Equipment

Institute of Electrical and Electronics Engineers,

[2018]

Link zum Volltext
IEEE Electronic Library (IEL)

1641-2022 - IEEE Standard for Signal and Test Definition

Institute of Electrical and Electronics Engineers,

2023

Link zum Volltext
IEEE Electronic Library (IEL)

IEEE Std 771-1989 : IEEE Guide to the Used of the ATLAS Specification

Institute of Electrical and Electronics Engineers,

1989

Link zum Volltext
IEEE Electronic Library (IEL)

IEEE Standard for Automatic Test Markup Language (ATML) Test Adapter Description : Redline

Institute of Electrical and Electronics Engineers,

(Revision of IEEE Std 1671.5-2008), 2015

Link zum Volltext
IEEE Electronic Library (IEL)

IEEE Std 1671-2006 : IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML

Institute of Electrical and Electronics Engineers,

2006

Link zum Volltext
IEEE Electronic Library (IEL)
IEEE Electronic Library (IEL)
Einen weiteren Link anzeigen
Weniger anzeigen

IEEE Standard for Automatic Test Markup Language (ATML) Test Adapter Description

Institute of Electrical and Electronics Engineers,

(Revision of IEEE Std 1671.5-2008), 2015

Link zum Volltext
IEEE Electronic Library (IEL)

1505.1-2019 - IEEE Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505

Institute of Electrical and Electronics Engineers,

2019

Link zum Volltext
IEEE Electronic Library (IEL)

IEEE Std 1671.5-2008 (Full_Use) : IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML:Exchanging Test Adapter Information

Institute of Electrical and Electronics Engineers,

2012

Link zum Volltext
IEEE Electronic Library (IEL)

IEEE Standard for Automatic Test Markup Language (ATML) Test Station Description : Redline

Institute of Electrical and Electronics Engineers,

(Revision of IEEE Std 1671.6-2008), 2015

Link zum Volltext
IEEE Electronic Library (IEL)

IEEE Std 1445-1998 : IEEE Standard for Digital Test Interchange Format (DTIF)

Institute of Electrical and Electronics Engineers,

1998

Link zum Volltext
IEEE Electronic Library (IEL)

Chi-squared goodness-of-fit tests for censored data

Stochastic Models in Survival Analysis and Reliability Set ; : Volume 3

2017

Link zum Volltext
Wiley Online Library - AutoHoldings Books

IEEE Std 1671.1-2009 : IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML: Exchanging Test Descriptions

Institute of Electrical and Electronics Engineers,

2009

Link zum Volltext
IEEE Electronic Library (IEL)

2008 First International Conference on Prognostics and Health Management

Institute of Electrical and Electronics Engineers,

2008

Link zum Volltext
IEEE Electronic Library (IEL)

IEEE C37.09a-1991 (Supplement to IEEE C37.09-1979) : Supplement to IEEE Standard Test Procedure for AC High-Voltage Circuit Breakers Rated on a Symmetrical Current Basis

Institute of Electrical and Electronics Engineers,

1991

Link zum Volltext
IEEE Electronic Library (IEL)

IEEE Std 1671.2-2012 (Revision of IEEE Std 1671.2-2008) - Redline

Institute of Electrical and Electronics Engineers,

2013

Link zum Volltext
IEEE Electronic Library (IEL)

Die vorwissenschaftliche Arbeit von A bis Z

2018

Link zum Volltext
UTB Scholars Vollzugriff 2024

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Rorschachiana

BMAT and UKCAT uncovered : a guide to medical school entrance exams [electronic resource]

IEEE Std 716-1989 : IEEE Standard C/ATLAS Test Language

IEEE Std 1546-2000

IEEE Std 1671-2010 (Revision of IEEE Std 1671-2006)

IEEE Std 1445-2016 (Revision of IEEE Std 1445-1998) : IEEE Standard for Digital Test Interchange Format (DTIF)

IEEE Std 1671.1-2009 (Full_Use)

IEEE Std 1636.1-2007 : IEEE Standard for Software Interface for Maintenance Information Collection and Analysis (SIMICA): Exchanging Test Results and Session Information via the eXtensible Markup Language(XML)

IEEE Std 1671.6-2008 : IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML: Exchanging Test Station Information

IEEE Std 1871.2-2017 : IEEE Recommended Practice for IEEE 1671 Test Equipment Templates and Extension Classes for Describing Intrinsic Signal Path Information for Cables, Interface Adapters, and Test Equipment

1641-2022 - IEEE Standard for Signal and Test Definition

IEEE Std 771-1989 : IEEE Guide to the Used of the ATLAS Specification

IEEE Standard for Automatic Test Markup Language (ATML) Test Adapter Description : Redline

IEEE Std 1671-2006 : IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML

IEEE Standard for Automatic Test Markup Language (ATML) Test Adapter Description

1505.1-2019 - IEEE Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505

IEEE Std 1671.5-2008 (Full_Use) : IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML:Exchanging Test Adapter Information

IEEE Standard for Automatic Test Markup Language (ATML) Test Station Description : Redline

IEEE Std 1445-1998 : IEEE Standard for Digital Test Interchange Format (DTIF)

Chi-squared goodness-of-fit tests for censored data

IEEE Std 1671.1-2009 : IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML: Exchanging Test Descriptions

2008 First International Conference on Prognostics and Health Management

IEEE C37.09a-1991 (Supplement to IEEE C37.09-1979) : Supplement to IEEE Standard Test Procedure for AC High-Voltage Circuit Breakers Rated on a Symmetrical Current Basis

IEEE Std 1671.2-2012 (Revision of IEEE Std 1671.2-2008) - Redline

Die vorwissenschaftliche Arbeit von A bis Z

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