Details

Autor(en) / Beteiligte

• Institute of Electrical and Electronics Engineers,

Titel

1505.1-2019 - IEEE Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505

Ort / Verlag

[Place of publication not identified] : IEEE,

Erscheinungsjahr

2019

Beschreibungen/Notizen

• Description based on publisher supplied metadata and other sources.