Details

Autor(en) / Beteiligte

• Institute of Electrical and Electronics Engineers,

Titel

2016 IEEE Far East NDT New Technology & Application Forum (FENDT)

Ort / Verlag

Piscataway, New Jersey : IEEE,

Erscheinungsjahr

2016

Beschreibungen/Notizen

• The 13th FENDT (2016) will be hold in Nanchang, Jiangxi province on June 22 24, 2016 Aiming at strengthening academic communication and promoting the innovation development of nondestructive testing, the International Far East Forum on Nondestructive Evaluation Testing (FENDT) has become the most important event for Nondestructive Evaluation Testing in China since its inception in Nanjing, 2004 The forum assembles all the professionals such as leading researchers, engineers, scientists, industrial people and students worldwide under one roof every year It is a great platform for sharing experiences, innovative ideas, industrial progresses and research results in the field of Ultrasonic Evaluation Testing, Magnetic Particle Testing, Radiographic Testing and Eddy Current Testing etc The conference also provides a showcase platform for companies to exhibit their latest technology and products FENDT2016 would like to collect papers of NDT research results, application cases, summary.
• Description based on publisher supplied metadata and other sources.