Details

Autor(en) / Beteiligte

• Institute of Electrical and Electronics Engineers,

Titel

IEEE Std 1671.5-2008 (Full_Use) : IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML:Exchanging Test Adapter Information

Ort / Verlag

New York, N.Y. : IEEE,

Erscheinungsjahr

2012

Link zum Volltext

• IEEE Electronic Library (IEL)

Beschreibungen/Notizen

• Includes bibliographical references.
• An exchange format, utilizing XML, for identifying all of the hardware, software, and documentation associated with a test station is specified in this document. This test station may be used as a component of a test program set to test and diagnose a unit under test.
• Description based on publisher supplied metadata and other sources.