Details

Autor(en) / Beteiligte

• Institute of Electrical and Electronics Engineers,

Titel

IEEE Std 1671-2010 (Revision of IEEE Std 1671-2006)

Ort / Verlag

New York : IEEE,

Erscheinungsjahr

2011

Link zum Volltext

• IEEE Electronic Library (IEL)

Beschreibungen/Notizen

• This document specifies a framework for the automatic test markup language (ATML) family of standards. ATML allows automatic test system (ATS) and test information to be exchanged in a common format adhering to the extensible markup language (XML) standard. Keywords: ATE description, ATE test results, ATML, ATS, automatic test equipment, automatic test markup language, automatic test system, interface test adapter, ITA, SI, synthetic instrumentation, test configuration, unit under test, UUT description, UUT maintenance, XML instance document, XML schema.
• Description based on publisher supplied metadata and other sources.