Details

Autor(en) / Beteiligte

• Institute of Electrical and Electronics Engineers (IEEE),

Titel

Microwave Measurement Conference (ARFTG), 2014 83rd ARFTG

Ort / Verlag

Piscataway, New Jersey : Institute of Electrical and Electronics Engineers (IEEE),

Erscheinungsjahr

2014

Link zum Volltext

• IEEE Electronic Library (IEL)

Beschreibungen/Notizen

• Annotation The main theme of this conference is microwave measurements for emerging technologies Technical papers are solicited describing original work in the areas of measurement requirements for new, emerging, and developing technologies including, but not limited to, medical biological areas, nanomaterials, graphene and related materials, and THz and related high frequency areas Topics of particular interest include Materials measurements for emerging technologies, Measurements in extreme impedance environments, Mm wave THz and other higher frequency measurement Measurements in highly nonlinear environments (including energy harvesting), De embedding and correction methods for complex interfaces fixtures, Other areas of rf, microwave and or millimeter wave measurement.
• Description based on publisher supplied metadata and other sources.