Details

Autor(en) / Beteiligte

• Institute of Electrical and Electronics Engineers,

Titel

Mixed-Signal Testing Workshop (IMSTW), 2015 20th International

Ort / Verlag

Piscataway : IEEE,

Erscheinungsjahr

2015

Beschreibungen/Notizen

• Using IJTAG digital islands in analogue circuits to perform trim and test functions,"H. -- Digitally-compatible ring oscillator frequency driven tuning of CN-TFT amplifiers: Performance compensation under statistical and morphological variations,"S. -- ACR BER correlation to ATE for a COFDM VHF RX,"P. -- Considerations for light sources: For semiconductor light sensor test,"M. -- Sensitivity calibration and test of a 3D hall integrated sensor device with an external magnetic field source on a new ATE concept,"L. -- Efficient contact screening of compact NVMs for high reliabilty automotive applications,"F. -- Buck converter modeling in SystemVerilog for verification and virtual test applications,"E. -- Structure preserving modeling for safety critical systems,"G. -- Experiences with an industrial analog fault simulator and engineering intuition,"S. -- An approach to generate test signals for analog circuits A control-theoretic perspective,"W. -- Modeling static analog behavior for determining mixed-signal test coverage using digital tools,"C. -- Reliability of SAR ADCs and associated embedded instrument detection,"J. -- Determination of the aging offset voltage of AMR sensors based on accelerated degradation test,"A. -- Impact of stress acceleration on mixed-signal gate oxide lifetime,"K. -- A generic methodology for building efficient prediction models in the context of alternate testing,"S. -- A fuzzy logic approach for highly dependable medical wearable systems,"C. -- Real-time adaptive test algorithm including test escape estimation method,"C. -- Design of an on-chip stepwise ramp generator for ADC static BIST applications,"G. -- Evaluation of harmonic cancellation techniques for sinusoidal signal generation in mixed-signal BIST,"H. -- Oscillation-based approach applied to a low-power analog front-end for an implantable cardiac device,"J. -- A jitter injection signal generation and extraction system for embedded test of high-speed data I/O,"Y. -- Digital on-chip measurement circuit for built-in phase noise testing,"S. -- Timing measurement BOST with multi-bit delta-sigma TDC,"T. -- Verification and validation of AMS systems: Towards coverage of uncertainties,"C. -- Automated triangular wave generator design with process corners compensation,"Y. -- Substrate modeling to improve reliability of high voltage technologies,"C. -- A CAD integrated solution of substrate modeling for industrial IC design,"H. -- Smart power mixed ICs parasitic bipolar coupling issues analysis with a dedicated on-chip sensor,".
• The role of nano electronic systems is expanding in every facet of modern life One of the major bottlenecks nowadays for such systems is the high cost of post manufacturing testing of their analog and mixed signal functions, in order to guarantee outgoing quality while not sacrificing yield In addition, safety critical and mission critical systems need to be equipped with self test and fault tolerance capabilities so as to guarantee reliable operation even in harsh environments For such systems, diagnosing the sources of failures occurring in the field of operation is of vital importance, in order to apply corrective actions and to prevent failure reoccurrence Diagnosis is also of vital importance to quickly identify failures in the first prototypes and to shed light on the manufacturing failure mechanisms The International Mixed Signals Testing Workshop is one of the main forums that bring together the test community to discuss ideas and views on the above challenges.
• Description based on publisher supplied metadata and other sources.