Details

Autor(en) / Beteiligte

• Institute of Electrical and Electronics Engineers,

Titel

IEEE Std 1546-2000

Ort / Verlag

New York : IEEE,

Erscheinungsjahr

2001

Beschreibungen/Notizen

• An aid in the understanding and use of digital test interchange format (DTIF) files is provided in this guide. This information will be an aid to users in developing tools such as preprocessors and postprocessors of DTIF data and other utilities.
• Description based on publisher supplied metadata and other sources.