Details

Autor(en) / Beteiligte

• Shukla, Balvinder,
• Kapur, P. K
• Khatri, Sunil Kumar,

Titel

Reliability, Infocom Technologies and Optimization (ICRITO) (Trends and Future Directions), 2014 3rd International Conference on

Ort / Verlag

Piscataway, New Jersey : IEEE,

Erscheinungsjahr

2014

Link zum Volltext

• IEEE Electronic Library (IEL)

Beschreibungen/Notizen

• Conference will not only take stock of trends and developments at globally competitive environment, but will also provide future directions to researchers and practitioners in areas of Reliability, Infocom Technologies, Optimization and Safety.
• Description based on publisher supplied metadata and other sources.