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Carrier heating and its effects on the current-voltage relations of conventional and hot-carrier solar cells: A physical model incorporating energy transfer between carriers, photons, and phonons

Solar energy, 2019-08, Vol.188, p.450-463

Tsai, Chin-Yi

2019

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Gate Voltage Pulse Rising Edge Dependent Dynamic Hot Carrier Degradation in Poly-Si Thin-Film Transistors

IEEE electron device letters, 2021-11, Vol.42 (11), p.1615-1618

2021

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Volltext

Analog Circuit Design in Nanoscale CMOS Technologies

Proceedings of the IEEE, 2009-10, Vol.97 (10), p.1687-1714

2009

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Understanding and Modeling the Temperature Behavior of Hot-Carrier Degradation in SiON nMOSFETs

IEEE electron device letters, 2016-01, Vol.37 (1), p.84-87

2016

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Volltext

On-Resistance Degradation Induced by Hot-Carrier Injection in LDMOS Transistors With STI in the Drift Region

IEEE electron device letters, 2008-09, Vol.29 (9), p.1071-1073

2008

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Real time measurement system for high power microwave hot carrier detector

IET microwaves, antennas & propagation, 2016-11, Vol.10 (14), p.1576-1580

2016

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Impact of non-Conducting RF and DC Hot Carrier Stresses on FinFET Reliability for RF Power Amplifiers

2022 IEEE Radio Frequency Integrated Circuits Symposium (RFIC), 2022, p.199-202

2022

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Hot-Carrier Degradation in Power LDMOS: Selective LOCOS- Versus STI-Based Architecture

IEEE journal of the Electron Devices Society, 2018, Vol.6, p.219-226

2018

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Analysis on Temperature Dependence of Hot Carrier Degradation by Mechanism Separation

IEEE journal of the Electron Devices Society, 2020, Vol.8, p.321-325

2020

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Breakdown voltage walkout resulting from hot-carrier-induced interface states in n-type LDMOS transistors

Electronics letters, 2016-08, Vol.52 (17), p.1488-1490

2016

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A Novel Depletion-IMOS (DIMOS) Device With Improved Reliability and Reduced Operating Voltage

IEEE electron device letters, 2009-01, Vol.30 (1), p.64-67

2009

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Volltext

Hot-Carrier acceleration factors for low power management in DC-AC stressed 40nm NMOS node at high temperature

2009 IEEE International Reliability Physics Symposium, 2009, p.531-548

2009

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Volltext

A generalized, IB-independent, physical HCI lifetime projection methodology based on universality of hot-carrier degradation

2010 IEEE International Reliability Physics Symposium, 2010, p.1091-1094

2010

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Volltext

Hot carrier-induced degradation in bulk FinFETs

IEEE electron device letters, 2005-08, Vol.26 (8), p.566-568

2005

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Volltext

Investigation of Reliability Characteristics in NMOS and PMOS FinFETs

IEEE electron device letters, 2008-07, Vol.29 (7), p.788-790

2008

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Volltext

Voltage Ramp Stress for Hot-Carrier Screening of Scaled CMOS Devices

IEEE electron device letters, 2012-06, Vol.33 (6), p.749-751

2012

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Volltext

Temperature Dependence of the Threshold Voltage Shift Induced by Carrier Injection in Integrated STI-Based LDMOS Transistors

IEEE electron device letters, 2011-06, Vol.32 (6), p.791-793

2011

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Volltext

A Compact Analytical Threshold-Voltage Model for Surrounding-Gate MOSFETs With Interface Trapped Charges

IEEE electron device letters, 2010-08, Vol.31 (8), p.788-790

Chiang Te-Kuang

2010

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Volltext

Effect of Floating-Body and Stress Bias on NBTI and HCI on 65-nm SOI pMOSFETs

IEEE electron device letters, 2008-03, Vol.29 (3), p.262-264

2008

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Volltext

Parasitic S/D resistance effects on hot-carrier reliability in body-tied FinFETs

IEEE electron device letters, 2006-06, Vol.27 (6), p.514-516

2006

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Convergence of Hot-Carrier-Induced Saturation Region Drain Current and On-Resistance Degradation in Drain Extended MOS Transistors

IEEE transactions on electron devices, 2009-11, Vol.56 (11), p.2843-2847

2009

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Volltext

Hot Carrier-Induced Tautomerization within a Single Porphycene Molecule on Cu(111)

ACS nano, 2015-07, Vol.9 (7), p.7287-7295

2015

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On the Enhanced Impact Ionization in Uniaxial Strained p-MOSFETs

IEEE electron device letters, 2007-07, Vol.28 (7), p.649-651

2007

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Volltext

New Hot-Carrier Injection Mechanism at Source Side in Nanoscale Floating-Body MOSFETs

IEEE electron device letters, 2009-01, Vol.30 (1), p.54-56

2009

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Volltext

Design of Mixed-Voltage I/O Buffer by Using NMOS-Blocking Technique

IEEE journal of solid-state circuits, 2006-10, Vol.41 (10), p.2324-2333

2006

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Volltext

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Carrier heating and its effects on the current-voltage relations of conventional and hot-carrier solar cells: A physical model incorporating energy transfer between carriers, photons, and phonons

Gate Voltage Pulse Rising Edge Dependent Dynamic Hot Carrier Degradation in Poly-Si Thin-Film Transistors

Analog Circuit Design in Nanoscale CMOS Technologies

Understanding and Modeling the Temperature Behavior of Hot-Carrier Degradation in SiON nMOSFETs

On-Resistance Degradation Induced by Hot-Carrier Injection in LDMOS Transistors With STI in the Drift Region

Real time measurement system for high power microwave hot carrier detector

Impact of non-Conducting RF and DC Hot Carrier Stresses on FinFET Reliability for RF Power Amplifiers

Hot-Carrier Degradation in Power LDMOS: Selective LOCOS- Versus STI-Based Architecture

Analysis on Temperature Dependence of Hot Carrier Degradation by Mechanism Separation

Breakdown voltage walkout resulting from hot-carrier-induced interface states in n-type LDMOS transistors

A Novel Depletion-IMOS (DIMOS) Device With Improved Reliability and Reduced Operating Voltage

Hot-Carrier acceleration factors for low power management in DC-AC stressed 40nm NMOS node at high temperature

A generalized, IB-independent, physical HCI lifetime projection methodology based on universality of hot-carrier degradation

Hot carrier-induced degradation in bulk FinFETs

Investigation of Reliability Characteristics in NMOS and PMOS FinFETs

Voltage Ramp Stress for Hot-Carrier Screening of Scaled CMOS Devices

Temperature Dependence of the Threshold Voltage Shift Induced by Carrier Injection in Integrated STI-Based LDMOS Transistors

A Compact Analytical Threshold-Voltage Model for Surrounding-Gate MOSFETs With Interface Trapped Charges

Effect of Floating-Body and Stress Bias on NBTI and HCI on 65-nm SOI pMOSFETs

Parasitic S/D resistance effects on hot-carrier reliability in body-tied FinFETs

Convergence of Hot-Carrier-Induced Saturation Region Drain Current and On-Resistance Degradation in Drain Extended MOS Transistors

Hot Carrier-Induced Tautomerization within a Single Porphycene Molecule on Cu(111)

On the Enhanced Impact Ionization in Uniaxial Strained p-MOSFETs

New Hot-Carrier Injection Mechanism at Source Side in Nanoscale Floating-Body MOSFETs

Design of Mixed-Voltage I/O Buffer by Using NMOS-Blocking Technique

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