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Channel Hot Carrier Degradation Mechanism in Long/Short Channel n-FinFETs

IEEE transactions on electron devices, 2013-12, Vol.60 (12), p.4002-4007

2013

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Gate All Around MOSFET With Vacuum Gate Dielectric for Improved Hot Carrier Reliability and RF Performance

IEEE transactions on electron devices, 2013-06, Vol.60 (6), p.1820-1827

2013

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Volltext

Hot-Carrier Effect on Amorphous In-Ga-Zn-O Thin-Film Transistors With a Via-Contact Structure

IEEE electron device letters, 2013-05, Vol.34 (5), p.638-640

2013

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Electron dynamics in charged wet TiO2 anatase (001) surface functionalised by ruthenium ions

Molecular physics, 2014-02, Vol.112 (3-4), p.441-452

2014

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Suppress Dynamic Hot-Carrier Induced Degradation in Polycrystalline Si Thin-Film Transistors by Using a Substrate Terminal

IEEE electron device letters, 2014-05, Vol.35 (5), p.551-553

2014

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on-Resistance Degradation Induced by Hot-Carrier Injection in SOI SJ-LDMOS

IEEE transactions on electron devices, 2013-03, Vol.60 (3), p.1279-1281

2013

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Volltext

On the Origin of Anomalous Off-Current Under Hot Carrier Stress in p-Channel DDDMOS Transistors With STI Structure

IEEE electron device letters, 2014-06, Vol.35 (6), p.651-653

2014

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Volltext

Model of hot-carrier degradation for lateral IGBT device on SOI substrate

Electronics letters, 2013-03, Vol.49 (7), p.497-499

2013

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Hot-Carrier-Induced Forward and Reverse Saturation Current Degradations for the n-Type Symmetric EDMOS Transistor

IEEE electron device letters, 2014-07, Vol.35 (7), p.690-692

2014

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Volltext

Dimension Dependence of Unusual HCI-Induced Degradation on N-Channel High-Voltage DEMOSFET

IEEE transactions on electron devices, 2013-05, Vol.60 (5), p.1723-1729

2013

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Volltext

Characterization and Investigation of a Hot-Carrier Effect in Via-Contact Type a-InGaZnO Thin-Film Transistors

IEEE transactions on electron devices, 2013-05, Vol.60 (5), p.1681-1688

2013

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Volltext

The Hot-Carrier-Induced Degradation of SoI LIGBT Under AC Stress Conditions

IEEE electron device letters, 2013-12, Vol.34 (12), p.1548-1550

2013

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Volltext

Hot Carrier Injection Effects in the Ultrashallow Body SONOS Gate Power MOSFET

IEEE transactions on electron devices, 2013-06, Vol.60 (6), p.2008-2014

2013

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Volltext

A 60-GHz Dual-Mode Class AB Power Amplifier in 40-nm CMOS

IEEE journal of solid-state circuits, 2013-10, Vol.48 (10), p.2323-2337

2013

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Volltext

Hot carrier effects on Brillouin amplification in AIIIBV and AIIBVI semiconductors

Journal of modern optics, 2022-03, Vol.69 (6), p.298-308

2022

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Carrier Multiplication Mechanisms and Competing Processes in Colloidal Semiconductor Nanostructures

Materials, 2017-09, Vol.10 (9), p.1095

2017

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High performance of hot-carrier generation, transport and injection in TiN/TiO 2 junction

Frontiers of physics, 2022, Vol.17 (5), p.53509

2022

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Fundamental limits of hot carrier injection from metal in nanoplasmonics

Nanophotonics (Berlin, Germany), 2020-02, Vol.9 (2), p.453-471

Khurgin, Jacob B.

2020

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Substrate noise evaluation for lightly doped 45nm N-MOSFET using physical simulation models

International journal of electronics, 2024-02, Vol.111 (2), p.338-359

2024

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Hot-carriers in organic photovoltaics

Pure and applied chemistry, 2021-02, Vol.93 (2), p.223-230

Roy, Palas

2021

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Modeling negative and positive temperature dependence of the gate leakage current in GaN high‐electron mobility transistors

ETRI Journal, 2022, 44(3), , pp.504-511

Mao, Ling‐Feng

2022

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Graphene plasmonic devices for terahertz optoelectronics

Nanophotonics (Berlin, Germany), 2020-07, Vol.9 (7), p.1901-1920

2020

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A novel double gate MOSFET by symmetrical insulator packets with improved short channel effects

International journal of electronics, 2018-03, Vol.105 (3), p.361-374

2018

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Observation of Normally Distributed Energies for Interface Trap Recovery After Hot-Carrier Degradation

IEEE electron device letters, 2013-08, Vol.34 (8), p.939-941

2013

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Volltext

Plasmonic Near-Infrared Photoconductor Based on Hot Hole Collection in the Metal-Semiconductor-Metal Junction

Molecules (Basel, Switzerland), 2022-10, Vol.27 (20), p.6922

2022

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Channel Hot Carrier Degradation Mechanism in Long/Short Channel n-FinFETs

Gate All Around MOSFET With Vacuum Gate Dielectric for Improved Hot Carrier Reliability and RF Performance

Hot-Carrier Effect on Amorphous In-Ga-Zn-O Thin-Film Transistors With a Via-Contact Structure

Electron dynamics in charged wet TiO2 anatase (001) surface functionalised by ruthenium ions

Suppress Dynamic Hot-Carrier Induced Degradation in Polycrystalline Si Thin-Film Transistors by Using a Substrate Terminal

on-Resistance Degradation Induced by Hot-Carrier Injection in SOI SJ-LDMOS

On the Origin of Anomalous Off-Current Under Hot Carrier Stress in p-Channel DDDMOS Transistors With STI Structure

Model of hot-carrier degradation for lateral IGBT device on SOI substrate

Hot-Carrier-Induced Forward and Reverse Saturation Current Degradations for the n-Type Symmetric EDMOS Transistor

Dimension Dependence of Unusual HCI-Induced Degradation on N-Channel High-Voltage DEMOSFET

Characterization and Investigation of a Hot-Carrier Effect in Via-Contact Type a-InGaZnO Thin-Film Transistors

The Hot-Carrier-Induced Degradation of SoI LIGBT Under AC Stress Conditions

Hot Carrier Injection Effects in the Ultrashallow Body SONOS Gate Power MOSFET

A 60-GHz Dual-Mode Class AB Power Amplifier in 40-nm CMOS

Hot carrier effects on Brillouin amplification in AIIIBV and AIIBVI semiconductors

Carrier Multiplication Mechanisms and Competing Processes in Colloidal Semiconductor Nanostructures

High performance of hot-carrier generation, transport and injection in TiN/TiO 2 junction

Fundamental limits of hot carrier injection from metal in nanoplasmonics

Substrate noise evaluation for lightly doped 45nm N-MOSFET using physical simulation models

Hot-carriers in organic photovoltaics

Modeling negative and positive temperature dependence of the gate leakage current in GaN high‐electron mobility transistors

Graphene plasmonic devices for terahertz optoelectronics

A novel double gate MOSFET by symmetrical insulator packets with improved short channel effects

Observation of Normally Distributed Energies for Interface Trap Recovery After Hot-Carrier Degradation

Plasmonic Near-Infrared Photoconductor Based on Hot Hole Collection in the Metal-Semiconductor-Metal Junction

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