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Test Automation: Not Just for Test Execution

IEEE software, 2017-03, Vol.34 (2), p.90-96

2017

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Integrated Statistical Test of Signal Distributions and Access Point Contributions for Wi-Fi Indoor Localization

IEEE transactions on vehicular technology, 2021-05, Vol.70 (5), p.5057-5070

2021

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Self-Test Library Generation for In-field Test of Path Delay faults

IEEE transactions on computer-aided design of integrated circuits and systems, 2023-11, Vol.42 (11), p.1-1

2023

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A Hybrid Test Scheme for Automotive IC in Multisite Testing

IEEE transactions on computer-aided design of integrated circuits and systems, 2022-12, Vol.41 (12), p.5671-5680

2022

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Test Methodologies and Test-Time Compression for Emerging Non-Volatile Memory

IEEE transactions on reliability, 2020-12, Vol.69 (4), p.1387-1397

2020

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Storage-Based Logic Built-In Self-Test With Cyclic Tests

IEEE transactions on computer-aided design of integrated circuits and systems, 2023-09, Vol.42 (9), p.3118-3122

Pomeranz, Irith

2023

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Diagnostic Test Point Insertion and Test Compaction

IEEE transactions on very large scale integration (VLSI) systems, 2023-02, Vol.31 (2), p.1-10

Pomeranz, Irith

2023

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Storage-Based Built-In Self-Test for Gate-Exhaustive Faults

IEEE transactions on computer-aided design of integrated circuits and systems, 2021-10, Vol.40 (10), p.2189-2193

Pomeranz, Irith

2021

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Defect-Oriented Test: Effectiveness in High Volume Manufacturing

IEEE transactions on computer-aided design of integrated circuits and systems, 2021-03, Vol.40 (3), p.584-597

2021

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Transceiver Design and Signal Detection in Backscatter Communication Systems With Multiple-Antenna Tags

IEEE transactions on wireless communications, 2020-05, Vol.19 (5), p.3273-3288

2020

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Cell-Aware Test

IEEE transactions on computer-aided design of integrated circuits and systems, 2014-09, Vol.33 (9), p.1396-1409

2014

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Storage-Based Logic Built-in Self-Test With Multicycle Tests

IEEE transactions on computer-aided design of integrated circuits and systems, 2022-10, Vol.41 (10), p.3553-3557

Pomeranz, Irith

2022

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A Survey of Testing Techniques for Approximate Integrated Circuits

Proceedings of the IEEE, 2020-12, Vol.108 (12), p.2178-2194

2020

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Direct Computation of LFSR-Based Stored Tests for Broadside and Skewed-Load Tests

IEEE transactions on computer-aided design of integrated circuits and systems, 2020-12, Vol.39 (12), p.5238-5246

Pomeranz, Irith

2020

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Test Insertion for Dynamic Test Compaction

IEEE transactions on computer-aided design of integrated circuits and systems, 2024-04, Vol.43 (4), p.1-1

Pomeranz, Irith

2024

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X-masking for Deterministic In-System Tests

IEEE transactions on computer-aided design of integrated circuits and systems, 2023-11, Vol.42 (11), p.1-1

2023

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SPAR: A New Test-Point Insertion Using Shared Points for Area Overhead Reduction

IEEE transactions on computer-aided design of integrated circuits and systems, 2022-11, Vol.41 (11), p.4939-4951

2022

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Novel Built-In Test Equipment for Phase Measurement in Millimeter-Wave Phased Arrays Integrated Circuits With Absolute Phase Measurement Capabilities

IEEE transactions on microwave theory and techniques, 2022-11, Vol.70 (11), p.5234-5247

2022

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Development of Laboratory Test Method to Perform Artificial Pollution Test on Composite Insulators Intended for HVDC Applications by Solid Layer Method

IEEE transactions on dielectrics and electrical insulation, 2024-02, Vol.31 (1), p.1-1

2024

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Sharing of Compressed Tests Among Logic Blocks

IEEE transactions on very large scale integration (VLSI) systems, 2023-04, Vol.31 (4), p.1-10

Pomeranz, Irith

2023

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A Nonintrusive Machine Learning-Based Test Methodology for Millimeter-Wave Integrated Circuits

IEEE transactions on microwave theory and techniques, 2020-08, Vol.68 (8), p.3565-3579

2020

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Complex Parameter Rao, Wald, Gradient, and Durbin Tests for Multichannel Signal Detection

IEEE transactions on signal processing, 2022, Vol.70, p.117-131

2022

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SymBIST: Symmetry-Based Analog and Mixed-Signal Built-In Self-Test for Functional Safety

IEEE transactions on circuits and systems. I, Regular papers, 2021-06, Vol.68 (6), p.2580-2593

2021

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On-Chip Self-Test Methodology With All Deterministic Compressed Test Patterns Recorded in Scan Chains

IEEE transactions on computer-aided design of integrated circuits and systems, 2019-02, Vol.38 (2), p.309-321

2019

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A Flexible Framework for the Automatic Generation of SBST Programs

IEEE transactions on very large scale integration (VLSI) systems, 2016-10, Vol.24 (10), p.3055-3066

2016

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Test Automation: Not Just for Test Execution

Integrated Statistical Test of Signal Distributions and Access Point Contributions for Wi-Fi Indoor Localization

Self-Test Library Generation for In-field Test of Path Delay faults

A Hybrid Test Scheme for Automotive IC in Multisite Testing

Test Methodologies and Test-Time Compression for Emerging Non-Volatile Memory

Storage-Based Logic Built-In Self-Test With Cyclic Tests

Diagnostic Test Point Insertion and Test Compaction

Storage-Based Built-In Self-Test for Gate-Exhaustive Faults

Defect-Oriented Test: Effectiveness in High Volume Manufacturing

Transceiver Design and Signal Detection in Backscatter Communication Systems With Multiple-Antenna Tags

Cell-Aware Test

Storage-Based Logic Built-in Self-Test With Multicycle Tests

A Survey of Testing Techniques for Approximate Integrated Circuits

Direct Computation of LFSR-Based Stored Tests for Broadside and Skewed-Load Tests

Test Insertion for Dynamic Test Compaction

X-masking for Deterministic In-System Tests

SPAR: A New Test-Point Insertion Using Shared Points for Area Overhead Reduction

Novel Built-In Test Equipment for Phase Measurement in Millimeter-Wave Phased Arrays Integrated Circuits With Absolute Phase Measurement Capabilities

Development of Laboratory Test Method to Perform Artificial Pollution Test on Composite Insulators Intended for HVDC Applications by Solid Layer Method

Sharing of Compressed Tests Among Logic Blocks

A Nonintrusive Machine Learning-Based Test Methodology for Millimeter-Wave Integrated Circuits

Complex Parameter Rao, Wald, Gradient, and Durbin Tests for Multichannel Signal Detection

SymBIST: Symmetry-Based Analog and Mixed-Signal Built-In Self-Test for Functional Safety

On-Chip Self-Test Methodology With All Deterministic Compressed Test Patterns Recorded in Scan Chains

A Flexible Framework for the Automatic Generation of SBST Programs

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