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Development of a Very Low-Noise Cryogenic Preamplifier for Large-Area SiPM Devices
IEEE transactions on nuclear science, 2018-04, Vol.65 (4), p.1005-1011
2018
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A Low-Noise Int-Diff Small Direct Currents Measurement System With Two-Stage Amplifier and Digital Differentiator
IEEE transactions on nuclear science, 2023-06, Vol.70 (6), p.954-959
2023
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Kinetic Parameter Measurements in the CROCUS Reactor Using Current Mode Instrumentation
IEEE transactions on nuclear science, 2018-09, Vol.65 (9), p.2456-2460
2018
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Comparison of Pre-and Post-Irradiation Low-Frequency Noise Spectra of Midwave Infrared nBn Detectors With Superlattice Absorbers
IEEE transactions on nuclear science, 2017-04, Vol.64 (4), p.1042-1047
2017
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Pixel-Level Charge and Current Injection Circuit for High Accuracy Calibration of the DSSC Chip at the European XFEL
IEEE transactions on nuclear science, 2013-10, Vol.60 (5), p.3852-3861
2013
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Noise Characterization of Double-Sided Silicon Microstrip Detectors With Punch-Through Biasing
IEEE transactions on nuclear science, 2011-04, Vol.58 (2), p.569-576
2011
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Implementation of New Reactivity Measurement System and New Reactor Noise Analysis Equipment in a VVER-440 Nuclear Power Plant
IEEE transactions on nuclear science, 2010-10, Vol.57 (5), p.2689-2696
2010
Open Access
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New Techniques of Low Level Environmental Radiation Monitoring at JLab
IEEE transactions on nuclear science, 2010-10, Vol.57 (5), p.2719-2723
2010
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1/f noise in proton-irradiated SiGe HBTs
IEEE transactions on nuclear science, 2001-12, Vol.48 (6), p.2244-2249
2001
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Noise in CdZnTe detectors
IEEE transactions on nuclear science, 2001-06, Vol.48 (3), p.282-286
2001
Open Access
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Fast and slow border traps in MOS devices
IEEE transactions on nuclear science, 1996-06, Vol.43 (3), p.779-786
1996
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Noise analysis of NPN SOI bipolar transistors for the design of charge measuring systems
IEEE transactions on nuclear science, 2004-06, Vol.51 (3), p.980-986
2004
Open Access
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Time dependence of switching oxide traps
IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States), 1994-12, Vol.41 (6), p.1835-1843
1994
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Performance analysis of phoswich/APD detectors and low-noise CMOS preamplifiers for high-resolution PET systems
IEEE transactions on nuclear science, 2001-06, Vol.48 (3), p.650-655
2001
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The LHCb VELO: status and upgrade developments
IEEE transactions on nuclear science, 2006-06, Vol.53 (3), p.1689-1693
2006
Open Access
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Noise reduction in CdZnTe coplanar-grid detectors
IEEE transactions on nuclear science, 2002-08, Vol.49 (4), p.1950-1953
2002
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Performance of irradiated and nonirradiated 500-/spl mu/m-thick silicon microstrip detectors
IEEE transactions on nuclear science, 2001-08, Vol.48 (4), p.1016-1019
2001
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New insights into radiation-induced oxide-trap charge through thermally-stimulated-current measurement and analysis (MOS capacitors)
IEEE transactions on nuclear science, 1992-12, Vol.39 (6), p.2192-2203
1992
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Evaluation of LAAPD arrays for high-resolution scintillator matrices readout
IEEE transactions on nuclear science, 2002-08, Vol.49 (4), p.1693-1698
2002
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A fully integrated low-power CMOS particle detector front-end for space applications
IEEE transactions on nuclear science, 1998-08, Vol.45 (4), p.2272-2278
1998
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Single-chip dosimeters to accompany photometric systems flown in space
IEEE transactions on nuclear science, 2001-12, Vol.48 (6), p.2039-2042
2001
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Single event upset and charge collection measurements using high energy protons and neutrons
IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States), 1994-12, Vol.41 (6), p.2203-2209
1994
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Charge-collection mechanisms of heterostructure FETs
IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States), 1994-12, Vol.41 (6), p.2055-2062
1994
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Effect of radiation-induced interface traps on 1/f noise in MOSFET's
IEEE transactions on nuclear science, 1992-12, Vol.39 (6), p.2178-2185
1992
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Charge collection and noise analysis of heavily irradiated silicon detectors
IEEE transactions on nuclear science, 1998-04, Vol.45 (2), p.141-145
1998
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