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Equivalent Noise Charge Contribution of the √f Parallel Noise in Nuclear Spectroscopic Measurements Using Different Shaping Amplifiers
IEEE transactions on nuclear science, 2023-04, Vol.70 (4), p.1-1
2023
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Low-Frequency Noise and Deep Level Transient Spectroscopy in n-p-n Si Bipolar Junction Transistors Irradiated With Si Ions
IEEE transactions on nuclear science, 2024-04, Vol.71 (4), p.591-598
2024
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Investigation of organic scintillators for neutron-gamma noise measurements in a zero-power reactor
IEEE transactions on nuclear science, 2023-11, p.1-1
2023
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Total-Ionizing-Dose Effects on Read Noise of MLC 3-D NAND Memories T
IEEE transactions on nuclear science, 2022-01, Vol.69 (3)
2022
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32k Channel Readout IC for Single Photon Counting Pixel Detectors with \ \mu\hbox Pitch, Dead Time of 85 ns, \ ^ - }\ \hbox Offset Spread and 2% rms Gain Spread
IEEE transactions on nuclear science, 2016-04, Vol.63 (2), p.1155-1161
2016
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1/f noise in proton-irradiated SiGe HBTs
IEEE transactions on nuclear science, 2001-12, Vol.48 (6), p.2244-2249
2001
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Noise Performance of 0.13 mum CMOS Technologies for Detector Front-End Applications
IEEE transactions on nuclear science, 2006-08, Vol.53 (4), p.2456-2462
2006
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Noise analysis of NPN SOI bipolar transistors for the design of charge measuring systems
IEEE transactions on nuclear science, 2004-06, Vol.51 (3), p.980-986
2004
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Performance of irradiated and nonirradiated 500-/spl mu/m-thick silicon microstrip detectors
IEEE transactions on nuclear science, 2001-08, Vol.48 (4), p.1016-1019
2001
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Flicker noise behavior of MOSFETs fabricated in 0.5 /spl mu/m fully depleted (FD) silicon-on-sapphire (SOS) CMOS in weak, moderate, and strong inversion
IEEE transactions on nuclear science, 2003-08, Vol.50 (4), p.963-968
2003
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Spectroscopic technique for optimal P-Z setting in /spl gamma/-ray detection
IEEE transactions on nuclear science, 2001-08, Vol.48 (4), p.1234-1238
2001
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A Monte Carlo model of noise components in 3D PET
IEEE transactions on nuclear science, 2002-10, Vol.49 (5), p.2297-2303
2002
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Radiation studies of silicon-microstrip detectors for use in ATLAS and SCT
IEEE transactions on nuclear science, 2002-12, Vol.49 (6), p.2919-2922
2002
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Three-dimensional simulation of charge collection and multiple-bit upset in Si devices
IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States), 1994-12, Vol.41 (6), p.2005-2017
1994
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The effects of proton irradiation on the RF performance of SiGe HBTs
IEEE transactions on nuclear science, 1999-12, Vol.46 (6), p.1716-1721
1999
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Two CMOS memory cells suitable for the design of SEU-tolerant VLSI circuits
IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States), 1994-12, Vol.41 (6), p.2229-2234
1994
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1/f noise in n- and p-channel MOS devices through irradiation and annealing
IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States), 1991-12, Vol.38 (6), p.1297-1303
1991
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Low energy /spl gamma/-rays scintillation detection with large area avalanche photodiodes
IEEE transactions on nuclear science, 1999-08, Vol.46 (4), p.880-885
1999
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A data acquisition and processing system for 3D position sensitive CZT gamma-ray spectrometers
IEEE transactions on nuclear science, 1999-12, Vol.46 (6), p.1989-1994
1999
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Noise characterization of transistors in a 1.2 /spl mu/m CMOS-SOI technology up to a total-dose of 12 Mrad (Si)
IEEE transactions on nuclear science, 1994-12, Vol.41 (6), p.2310-2316
1994
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Precision of Shutdown Margin Measurements Using the Two-Frequency Reactor Noise Technique in an LMFBR
IEEE transactions on nuclear science, 1971, Vol.18 (1), p.430-434
1971
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Evidence for two types of radiation-induced trapped positive charge
IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States), 1994-12, Vol.41 (6), p.1828-1834
1994
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CRRES Microelectronics Test Package (MEP) : Space radiation effects program : combined release and radiation effects satellite experiments
IEEE transactions on nuclear science, 1993, Vol.40 (2), p.228-232
1993
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Performance of flash ADCs in the 100 MHz range. II. Results from 8 bit devices
IEEE transactions on nuclear science, 1992-08, Vol.39 (4), p.780-783
1992
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SOI 68T020 heavy ions evaluation
IEEE transactions on nuclear science, 1994-12, Vol.41 (6), p.2240-2243
1994
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