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GaN-on-Si Power Technology: Devices and Applications

IEEE transactions on electron devices, 2017-03, Vol.64 (3), p.779-795

2017

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Microwave and Millimeter-Wave GaN HEMTs: Impact of Epitaxial Structure on Short-Channel Effects, Electron Trapping, and Reliability

IEEE transactions on electron devices, 2023-10, Vol.71 (3), p.1-12

2023

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Compensation Dopant-Free GaN-on-Si HEMTs With a Polarization Engineered Buffer for RF Applications

IEEE transactions on electron devices, 2023-04, Vol.70 (4), p.1-6

2023

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Lateral and Vertical Transistors Using the AlGaN/GaN Heterostructure

IEEE transactions on electron devices, 2013-10, Vol.60 (10), p.3060-3066

2013

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Electrical Characterization and Modeling of GaN HEMTs at Cryogenic Temperatures

IEEE transactions on electron devices, 2022-11, Vol.69 (11), p.6016-6022

2022

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3.3 kV Multi-Channel AlGaN/GaN Schottky Barrier Diodes With P-GaN Termination

IEEE electron device letters, 2020-08, Vol.41 (8), p.1177-1180

2020

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Deadtime Effect on GaN-Based Synchronous Boost Converter and Analytical Model for Optimal Deadtime Selection

IEEE transactions on power electronics, 2016-01, Vol.31 (1), p.601-612

2016

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Characterization of Threshold Voltage Instability Under Off-State Drain Stress and Its Impact on p-GaN HEMT Performance

IEEE journal of emerging and selected topics in power electronics, 2021-08, Vol.9 (4), p.4026-4035

2021

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Inverse Piezoelectric and Trap Effects With Temperature Dependence in AlGaN/GaN HEMTs Under Narrowband Microwave Pulses

IEEE transactions on electromagnetic compatibility, 2023-06, Vol.65 (3), p.794-803

2023

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AlGaN/GaN HEMT Based Biosensor for Detection of the HER2 Antigen Spiked in Human Serum

IEEE transactions on electron devices, 2022-08, Vol.69 (8), p.4527-4533

2022

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Volltext

High Breakdown Voltage and Low-Current Dispersion in AlGaN/GaN HEMTs With High-Quality AlN Buffer Layer

IEEE transactions on electron devices, 2021-04, Vol.68 (4), p.1513-1517

2021

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Radiation Effects in AlGaN/GaN HEMTs

IEEE transactions on nuclear science, 2022-05, Vol.69 (5), p.1-1

2022

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ε-Ga₂O₃: A Promising Candidate for High-Electron-Mobility Transistors

IEEE electron device letters, 2020-07, Vol.41 (7), p.1052-1055

2020

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Hot-Electron Effects in AlGaN/GaN HEMTs Under Semi-ON DC Stress

IEEE transactions on electron devices, 2020-11, Vol.67 (11), p.4602-4605

2020

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GaN HEMTs on Si with Regrown Contacts and Cutoff/Maximum Oscillation Frequencies of 250/204 GHz

IEEE electron device letters, 2020-05, Vol.41 (5), p.1-1

2020

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Review of Commercial GaN Power Devices and GaN-Based Converter Design Challenges

IEEE journal of emerging and selected topics in power electronics, 2016-09, Vol.4 (3), p.707-719

2016

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A Review of GaN on SiC High Electron-Mobility Power Transistors and MMICs

IEEE transactions on microwave theory and techniques, 2012-06, Vol.60 (6), p.1764-1783

2012

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Volltext

300-GHz InAlN/GaN HEMTs With InGaN Back Barrier

IEEE electron device letters, 2011-11, Vol.32 (11), p.1525-1527

2011

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Design of GaN-Based MHz Totem-Pole PFC Rectifier

IEEE journal of emerging and selected topics in power electronics, 2016-09, Vol.4 (3), p.799-807

2016

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Charge Control in Schottky-Type p-GaN Gate HEMTs With Partially and Fully Depleted p-GaN Conditions

IEEE transactions on electron devices, 2022-05, Vol.69 (5), p.2262-2269

2022

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Effective Passivation of AlGaN/GaN HEMTs by ALD-Grown AlN Thin Film

IEEE electron device letters, 2012-04, Vol.33 (4), p.516-518

2012

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AlGaN/GaN high electron mobility transistors with InGaN back-barriers

IEEE electron device letters, 2006-01, Vol.27 (1), p.13-15

2006

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A GaN Complementary FET Inverter With Excellent Noise Margins Monolithically Integrated With Power Gate-Injection HEMTs

IEEE transactions on electron devices, 2022-01, Vol.69 (1), p.51-56

2022

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Multi-Channel Tri-Gate GaN Power Schottky Diodes With Low ON-Resistance

IEEE electron device letters, 2019-02, Vol.40 (2), p.275-278

2019

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Impact of AlInN Back-Barrier Over AlGaN/GaN MOS-HEMT With HfO₂ Dielectric Using Cubic Spline Interpolation Technique

IEEE transactions on electron devices, 2020-09, Vol.67 (9), p.3558-3563

2020

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GaN-on-Si Power Technology: Devices and Applications

Microwave and Millimeter-Wave GaN HEMTs: Impact of Epitaxial Structure on Short-Channel Effects, Electron Trapping, and Reliability

Compensation Dopant-Free GaN-on-Si HEMTs With a Polarization Engineered Buffer for RF Applications

Lateral and Vertical Transistors Using the AlGaN/GaN Heterostructure

Electrical Characterization and Modeling of GaN HEMTs at Cryogenic Temperatures

3.3 kV Multi-Channel AlGaN/GaN Schottky Barrier Diodes With P-GaN Termination

Deadtime Effect on GaN-Based Synchronous Boost Converter and Analytical Model for Optimal Deadtime Selection

Characterization of Threshold Voltage Instability Under Off-State Drain Stress and Its Impact on p-GaN HEMT Performance

Inverse Piezoelectric and Trap Effects With Temperature Dependence in AlGaN/GaN HEMTs Under Narrowband Microwave Pulses

AlGaN/GaN HEMT Based Biosensor for Detection of the HER2 Antigen Spiked in Human Serum

High Breakdown Voltage and Low-Current Dispersion in AlGaN/GaN HEMTs With High-Quality AlN Buffer Layer

Radiation Effects in AlGaN/GaN HEMTs

ε-Ga₂O₃: A Promising Candidate for High-Electron-Mobility Transistors

Hot-Electron Effects in AlGaN/GaN HEMTs Under Semi-ON DC Stress

GaN HEMTs on Si with Regrown Contacts and Cutoff/Maximum Oscillation Frequencies of 250/204 GHz

Review of Commercial GaN Power Devices and GaN-Based Converter Design Challenges

A Review of GaN on SiC High Electron-Mobility Power Transistors and MMICs

300-GHz InAlN/GaN HEMTs With InGaN Back Barrier

Design of GaN-Based MHz Totem-Pole PFC Rectifier

Charge Control in Schottky-Type p-GaN Gate HEMTs With Partially and Fully Depleted p-GaN Conditions

Effective Passivation of AlGaN/GaN HEMTs by ALD-Grown AlN Thin Film

AlGaN/GaN high electron mobility transistors with InGaN back-barriers

A GaN Complementary FET Inverter With Excellent Noise Margins Monolithically Integrated With Power Gate-Injection HEMTs

Multi-Channel Tri-Gate GaN Power Schottky Diodes With Low ON-Resistance

Impact of AlInN Back-Barrier Over AlGaN/GaN MOS-HEMT With HfO₂ Dielectric Using Cubic Spline Interpolation Technique

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