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Experimental Study of the Electrical Characteristics of Ethylene Glycol/Water Mixtures in the Microsecond Regime
IEEE electrical insulation magazine, 2007-11, Vol.23 (6), p.20-25
2007
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Optimization of dual field plate AlGaN/GaN HEMTs using artificial neural networks and particle swarm optimization algorithm
IEEE transactions on device and materials reliability, 2023-06, Vol.23 (2), p.1-1
2023
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Characterization, Analysis and Modeling of Long-Term RF Reliability and Degradation of SiGe HBTs for High Power Density Applications
IEEE transactions on device and materials reliability, 2024-03, Vol.24 (1), p.1-1
2024
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Outside the bandwidth - A comparison between fashion models and compact models
IEEE microwave magazine, 2006-08, Vol.7 (4), p.104-104
2006
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Impact of Structural and Process Variations on the Time-Dependent OFF-State Breakdown of p-GaN Power HEMTs
IEEE transactions on device and materials reliability, 2021-03, Vol.21 (1), p.57-63
2021
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Effect of Ambient on the Field Emission Induced-Damage in Dielectric-Less MEMS Capacitive Structures
IEEE transactions on device and materials reliability, 2022-06, Vol.22 (2), p.205-216
2022
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Assessing the Correlation Between Location and Size of Catastrophic Breakdown Events in High-K MIM Capacitors
IEEE transactions on device and materials reliability, 2019-06, Vol.19 (2), p.452-460
2019
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Reliability Issues of SiC MOSFETs: A Technology for High-Temperature Environments
IEEE transactions on device and materials reliability, 2010-12, Vol.10 (4), p.418-426
2010
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Time Dependent Shift in SOA Boundary and Early Breakdown of Epi-Stack in AlGaN/ GaN HEMTs Under Fast Cyclic Transient Stress
IEEE transactions on device and materials reliability, 2020-09, Vol.20 (3), p.562-569
2020
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A Novel Hot Spot Mitigation Circuit for Improved Reliability of PV Module
IEEE transactions on device and materials reliability, 2020-03, Vol.20 (1), p.191-198
2020
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The Role of Dielectric Heating and Effects of Ambient Humidity in the Electrical Breakdown of Polymer Dielectrics
IEEE transactions on device and materials reliability, 2015-09, Vol.15 (3), p.308-318
2015
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The Lucky Electron Model for TDDB in Low-k Dielectrics
IEEE transactions on device and materials reliability, 2016-12, Vol.16 (4), p.452-454
2016
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Geometric Variability of Nanoscale Interconnects and Its Impact on the Time-Dependent Breakdown of Cu/Low- k Dielectrics
IEEE transactions on device and materials reliability, 2010-09, Vol.10 (3), p.307-316
2010
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Polymer Nanocomposites in High-Voltage Insulation: The Dielectric Characteristics of Doped Polypropylene
IEEE nanotechnology magazine, 2018-06, Vol.12 (2), p.33-40
2018
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Space-Charge Modulated Electrical Breakdown in Polyethylene Nanodielectrics: Its Relation to Deep Traps in Interaction Zones
IEEE nanotechnology magazine, 2018-06, Vol.12 (2), p.15-22
2018
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Investigation of Linearity in the High Electric Field Region for SiGe HBTs Based on Volterra Series
IEEE transactions on device and materials reliability, 2014-12, Vol.14 (4), p.1049-1055
2014
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Design, Simulation, and Fabrication of 4H-SiC Power SBDs With SIPOS FP Structure
IEEE transactions on device and materials reliability, 2015-12, Vol.15 (4), p.543-551
2015
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Time-Dependent Dielectric Breakdown and Stress-Induced Leakage Current Characteristics of 0.7-nm-EOT \hbox pFETs
IEEE transactions on device and materials reliability, 2011-06, Vol.11 (2), p.290-294
2011
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Investigation on the Breakdown Failure in Stripe Trench-Gate Field-Stop Insulated Bipolar Transistor With Low-Saturation Voltage
IEEE transactions on device and materials reliability, 2016-09, Vol.16 (3), p.384-387
2016
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Dielectric Performance of Transformer Liquids-Summary of a CIGRE Study
IEEE electrical insulation magazine, 2023-09, Vol.39 (5), p.7-16
2023
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A review of dielectric polymer composites with high thermal conductivity
IEEE electrical insulation magazine, 2011-07, Vol.27 (4), p.8-16
2011
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Polymer nanocomposites for high-energy-density capacitor dielectrics: Fundamentals and recent progress
IEEE electrical insulation magazine, 2020-03, Vol.36 (2), p.7-28
2020
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Nanocomposites-a review of electrical treeing and breakdown
IEEE electrical insulation magazine, 2009-07, Vol.25 (4), p.19-25
2009
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Mechanism of Depletion-Mode TDDB for 4H-SiC MOS Structure
IEEE transactions on device and materials reliability, 2017-03, Vol.17 (1), p.163-169
2017
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Resource Allocation for IRS-Assisted Networks: A Deep Reinforcement Learning Approach
IEEE communications standards magazine, 2023-09, Vol.7 (3), p.48-55
2023
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