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IEEE access, 2021-01, Vol.9, p.108873-108888
2021
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IEEE journal of microwaves, 2023-10, Vol.3 (4), p.1134-1146
- Miller, Nicholas C.
- Arias-Purdue, Andrea
- Arkun, Erdem
- Brown, David
- Buckwalter, James F.
- Coffie, Robert L.
- Corrion, Andrea
- Denninghoff, Daniel J.
- Elliott, Michael
- Fanning, Dave
- Gilbert, Ryan
- Green, Daniel S.
- Herrault, Florian
- Heying, Ben
- King, Casey M.
- Lam, Eythan
- Moon, Jeong-Sun
- Rowell, Petra V.
- Siddiqi, Georges
- Smorchkova, Ioulia
- Tai, Joe
- Uyeda, Jansen
- Wojtowicz, Mike
2023
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IEEE transactions on magnetics, 2005-12, Vol.41 (12), p.4384-4389
2005
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2016 IEEE International Conference on Robotics and Automation (ICRA), 2016, p.3537-3542
2016
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IEEE journal of photovoltaics, 2013-07, Vol.3 (3), p.944-951
2013
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2019 IEEE International Solid- State Circuits Conference - (ISSCC), 2019, p.216-218
- Kang, Dongku
- Kim, Minsu
- Jeon, Su Chang
- Jung, Wontaeck
- Park, Jooyong
- Choo, Gyosoo
- Shim, Dong-kyo
- Kavala, Anil
- Kim, Seung-Bum
- Kang, Kyung-Min
- Lee, Jiyoung
- Ko, Kuihan
- Park, Hyun-Wook
- Min, Byung-Jun
- Yu, Changyeon
- Yun, Sewon
- Kim, Nahyun
- Jung, Yeonwook
- Seo, Sungwhan
- Kim, Sunghoon
- Lee, Moo Kyung
- Park, Joo-Yong
- Kim, James C.
- Cha, Young San
- Kim, Kwangwon
- Jo, Youngmin
- Kim, Hyunjin
- Choi, Youngdon
- Byun, Jindo
- Park, Ji-hyun
- Kim, Kiwon
- Kwon, Tae-Hong
- Min, Youngsun
- Yoon, Chiweon
- Kim, Youngcho
- Kwak, Dong-Hun
- Lee, Eungsuk
- Hahn, Wook-ghee
- Kim, Ki-sung
- Kim, Kyungmin
- Yoon, Euisang
- Kim, Won-Tae
- Lee, Inryoul
- Moon, Seung hyun
- Ihm, Jeongdon
- Byeon, Dae Seok
- Song, Ki-Whan
- Hwang, Sangjoon
- Kyung, Kye Hyun
2019
- Link zum Volltext
2022 IEEE International Conference on Big Data and Smart Computing (BigComp), 2022, p.35-42
2022
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2007 IEEE International Electron Devices Meeting, 2007, p.247-250
- Mistry, K.
- Chau, R.
- Choi, C.-H.
- Ding, G.
- Fischer, K.
- Ghani, T.
- Grover, R.
- Han, W.
- Hanken, D.
- Hattendorf, M.
- He, J.
- Allen, C.
- Hicks, J.
- Huessner, R.
- Ingerly, D.
- Jain, P.
- James, R.
- Jong, L.
- Joshi, S.
- Kenyon, C.
- Kuhn, K.
- Lee, K.
- Auth, C.
- Liu, H.
- Maiz, J.
- McIntyre, B.
- Moon, P.
- Neirynck, J.
- Pae, S.
- Parker, C.
- Parsons, D.
- Prasad, C.
- Pipes, L.
- Beattie, B.
- Prince, M.
- Ranade, P.
- Reynolds, T.
- Sandford, J.
- Shifren, L.
- Sebastian, J.
- Seiple, J.
- Simon, D.
- Sivakumar, S.
- Smith, P.
- Bergstrom, D.
- Thomas, C.
- Troeger, T.
- Vandervoorn, P.
- Williams, S.
- Zawadzki, K.
- Bost, M.
- Brazier, M.
- Buehler, M.
- Cappellani, A.
2007
- Link zum Volltext
2014 IEEE International Integrated Reliability Workshop Final Report (IIRW), 2014, p.10-15
2014
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IEEE transactions on plasma science, 2008-08, Vol.36 (4), p.1286-1287
2008
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IEEE transactions on plasma science, 2008-08, Vol.36 (4), p.1134-1135
2008
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IEEE transactions on plasma science, 2008, Vol.36 (4), p.1286-1287
2008
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IEEE transactions on plasma science, 2008, Vol.36 (4), p.1134-1135
2008
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2016 IEEE International Conference on Robotics and Automation (ICRA), 2016, p.4729-4736
2016
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IEEE transactions on electron devices, 1992-07, Vol.39 (7), p.1694-1703
1992
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IEEE transactions on electron devices, 1990-07, Vol.37 (7), p.1651-1657
1990
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IEEE transactions on applied superconductivity, 2003-06, Vol.13 (2), p.3590
2003
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The 30th International Conference on Plasma Science, 2003. ICOPS 2003. IEEE Conference Record - Abstracts, 2003, p.391
2003
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2009 International Conference on Microelectronics - ICM, 2009, p.42-45
2009
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2009 International Semiconductor Device Research Symposium, 2009, p.1-2
2009
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IEEE transactions on applied superconductivity, 2003, Vol.13 (2), p.3590-3593
2003
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18th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), 2011, p.1-4
2011
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