Sortiert nach
Interceram, 2005, p.20-23
2005
Link zum Volltext
IEEE transactions on device and materials reliability, 2005-06, Vol.5 (2), p.277-281
2005
- Link zum Volltext
Solid state technology, 2005-06, Vol.48 (6), p.54
2005
Link zum Volltext
IEEE transactions on device and materials reliability, 2014-03, Vol.14 (1), p.484-492
2014
- Link zum Volltext
Comparative Study on the Transients Induced by Single Event Effect and Space Electrostatic Discharge
2019
- Link zum Volltext
Electromigration Effect on Kinetics of Cu-Sn Intermetallic Compound Growth in Lead-Free Solder Joint
2017
- Link zum Volltext
IEEE transactions on device and materials reliability, 2008-03, Vol.8 (1), p.62-71
2008
- Link zum Volltext
IEEE transactions on device and materials reliability, 2016-12, Vol.16 (4), p.576-582
2016
- Link zum Volltext
IEEE transactions on device and materials reliability, 2021-03, Vol.21 (1), p.87-95
2021
- Link zum Volltext
IEEE transactions on device and materials reliability, 2020-06, Vol.20 (2), p.420-428
2020
- Link zum Volltext
IEEE transactions on device and materials reliability, 2020-06, Vol.20 (2), p.358-365
2020
- Link zum Volltext
Tribology & lubrication technology, 2012-02, Vol.68 (2), p.17-19
2012
Link zum Volltext
Solid state technology, 2005-10, Vol.48 (10), p.35
2005
Link zum Volltext
IEEE aerospace and electronic systems magazine, 2014-04, Vol.29 (4), p.4-13
- Alberti, G.
- Alvino, A.
- Ambrosi, G.
- Bardet, M.
- Battiston, R.
- Borsini, S.
- Cao, J. F.
- Chen, Y.
- van Es, J.
- Gargiulo, C.
- Guo, K. H.
- Guo, L.
- He, Z. H.
- Huang, Z. C.
- Koutsenko, V.
- Laudi, E.
- Lebedev, A.
- Lee, S. C.
- Li, T. X.
- Lin, Y. L.
- Lv, S. S.
- Menichelli, M.
- Miao, J. Y.
- Mo, D. C.
- Ni, J. Q.
- Pauw, A.
- Qi, X. M.
- Shue, G. M.
- Sun, D. J.
- Sun, X. H.
- Tang, C. P.
- Verlaat, B.
- Wang, Z. X.
- Weng, Z. L.
- Xiao, W. J.
- Xu, N. S.
- Yang, F. K.
- Yeh, C. C.
- Zhang, Z.
- Zwartbol, T.
2014
- Link zum Volltext
Solid state technology, 2010-01, Vol.53 (1), p.14-17
2010
Link zum Volltext
Aktive Filter
Suchergebnisse filtern
Filter anzeigenNur zeigen
Erscheinungsjahr
n.n
n.n
Thema
- Engineering
- Science & Technology
- Technology
- Engineering, Electrical & Electronic
- Physical Sciences
- Physics, Applied
- Temperature Measurement
- Physics, Condensed Matter
- Transistors
- Copper
- Degradation
- Exact Sciences And Technology
- Experiments
- Light Emitting Diodes
- Off-State
- On-State
- Programming
- Scanning Electron Microscopy
- Stress
Kollektion