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Highly Uniform Switching of Tantalum Embedded Amorphous Oxide Using Self-Compliance Bipolar Resistive Switching
IEEE electron device letters, 2011-03, Vol.32 (3), p.399-401
2011
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Stackable All-Oxide-Based Nonvolatile Memory With Al2O3 Antifuse and p-CuOx/n-InZnOx Diode
IEEE electron device letters, 2009-05, Vol.30 (5), p.550-552
2009
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Improved Resistive Switching Reliability in Graded NiO Multilayer for Resistive Nonvolatile Memory Devices
IEEE electron device letters, 2010-07, Vol.31 (7), p.725-727
2010
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Multilevel Programmable Oxide Diode for Cross-Point Memory by Electrical-Pulse-Induced Resistance Change
IEEE electron device letters, 2009-10, Vol.30 (10), p.1036-1038
2009
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Fractal Dimension of Conducting Paths in Nickel Oxide (NiO) Thin Films During Resistance Switching
IEEE transactions on nanotechnology, 2010-03, Vol.9 (2), p.131-133
2010
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Hybrid mapping parameter estimation using hierarchical structure in object-oriented coding
IEEE transactions on consumer electronics, 1997-11, Vol.43 (4), p.1213-1219
1997
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Stackable All-Oxide-Based Nonvolatile Memory With \hbox\hbox Antifuse and \hbox/ \hbox Diode
IEEE electron device letters, 2009-05, Vol.30 (5), p.550-552
2009
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Stackable All-Oxide-Based Nonvolatile Memory With [Formula Omitted] Antifuse and [Formula Omitted] Diode
IEEE electron device letters, 2009-05, Vol.30 (5), p.550
2009
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Stackable All-Oxide-Based Nonvolatile Memory With hbox Al 2 hbox O 3 Antifuse and hbox p a CuO x / hbox n a InZnO x Diode
IEEE electron device letters, 2009-01, Vol.30 (5)
2009
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Heterogeneously integrated ligtht sources on bulk-silicon platform
2018 IEEE International Electron Devices Meeting (IEDM), 2018, p.23.6.1-23.6.4
2018
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Electrically Reconfigurable Active Metasurface for 3D Distance Ranging
2020 IEEE International Electron Devices Meeting (IEDM), 2020, p.7.1.1-7.1.4
2020
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Two-layer object-oriented analysis-synthesis coding based on shape parameter decomposition
Proceedings of ICC'97 - International Conference on Communications, 1997, Vol.1, p.329-333 vol.1
1997
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Computation of effective bandwidth of aggregated VBR MPEG video traffic in ATM networks using the modified equivalent capacity
Proceedings of ICC/SUPERCOMM '96 - International Conference on Communications, 1996, Vol.2, p.627-631 vol.2
1996
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Connection admission control for video traffic using modified equivalent capacity
Proceedings of GLOBECOM '95, 1995, Vol.1, p.427-431 vol.1
1995
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Performance of Machine Learning Algorithms for Class-Imbalanced Process Fault Detection Problems
IEEE transactions on semiconductor manufacturing, 2016-11, Vol.29 (4), p.436-445
2016
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Graphene/Al2O3/AlGaN/GaN Schottky MISIM Diode for Sensing Double UV Bands
IEEE sensors journal, 2016-09, Vol.16 (18), p.6903-6907
2016
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A System-on-Chip Solution for Point-of-Care Ultrasound Imaging Systems: Architecture and ASIC Implementation
IEEE transactions on biomedical circuits and systems, 2016-04, Vol.10 (2), p.412-423
2016
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Drift-Compensated Low-Noise Frequency Synthesis Based on a cryoCSO for the KRISS-F1
IEEE transactions on instrumentation and measurement, 2017-06, Vol.66 (6), p.1343-1348
2017
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Marker Layout for Optimizing the Overlay Alignment in a Photolithography Process
IEEE transactions on semiconductor manufacturing, 2019-05, Vol.32 (2), p.212-219
2019
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Single-Electron-Based Flexible Multivalued Exclusive-or Logic Gate
IEEE transactions on electron devices, 2009-05, Vol.56 (5), p.1048-1055
2009
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Error Resilient 3-D Mesh Compression
IEEE transactions on multimedia, 2006-10, Vol.8 (5), p.885-895
2006
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An improved carrier-based SVPWM method using leg voltage redundancies in generalized cascaded multilevel inverter topology
IEEE transactions on power electronics, 2003-01, Vol.18 (1), p.180-187
2003
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SOI single-electron transistor with low RC delay for logic cells and SET/FET hybrid ICs
IEEE transactions on nanotechnology, 2005-03, Vol.4 (2), p.242-248
2005
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A Retention-Aware Multilevel Cell Phase Change Memory Program Evaluation Metric
IEEE electron device letters, 2016-11, Vol.37 (11), p.1422-1425
2016
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Hybrid Overlay Modeling for Field-by-Field Error Correction in the Photolithography Process
IEEE transactions on semiconductor manufacturing, 2020-02, Vol.33 (1), p.53-61
2020
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